Results for “optical characterization” — Page 6

NASA NTRS2001

Real-Time Optical Monitoring of Flow Kinetics and Gas Phase Reactions Under High-Pressure OMCVD Conditions

This contribution addresses the real-time optical characterization of gas flow and gas phase reactions as they play a crucial role for chemical vapor phase depositions utilizing elevated and high pressure chemical vapor deposition (HPCVD) conditions. The objectives of these experiments are to validate on the basis of results on real-time optical diagnostics process models simulation codes, and provide input parameter sets needed for analysis and control of chemical vapor deposition at elevated pressures. Access to microgravity is required to retain high pressure conditions of laminar flow, which is essential for successful acquisition and interpretation of the optical data. In this contribution, we describe the design and construction of the HPCVD system, which include access ports for various optical methods of real-time process monitoring and to analyze the initial stages of heteroepitaxy and steady-state growth in the different pressure ranges. To analyze the onset of turbulence, provisions are made for implementation of experimental methods for in-situ characterization of the nature of flow. This knowledge will be the basis for the design definition of experiments under microgravity, where gas flow conditions, gas phase and surface chemistry, might be analyzed by remote controlled real-time diagnostics tools, developed in this research project.

Dietz, N.↗

NASA NTRS2016

Optical and Radar Measurements of the Meteor Speed Distribution

The observed meteor speed distribution provides information on the underlying orbital distribution of Earth-intersecting meteoroids. It also affects spacecraft risk assessments; faster meteors do greater damage to spacecraft surfaces. Although radar meteor networks have measured the meteor speed distribution numerous times, the shape of the de-biased speed distribution varies widely from study to study. Optical characterizations of the meteoroid speed distribution are fewer in number, and in some cases the original data is no longer available. Finally, the level of uncertainty in these speed distributions is rarely addressed. In this work, we present the optical meteor speed distribution extracted from the NASA and SOMN allsky networks [1, 2] and from the Canadian Automated Meteor Observatory (CAMO) [3]. We also revisit the radar meteor speed distribution observed by the Canadian Meteor Orbit Radar (CMOR) [4]. Together, these data span the range of meteoroid sizes that can pose a threat to spacecraft. In all cases, we present our bias corrections and incorporate the uncertainty in these corrections into uncertainties in our de-biased speed distribution. Finally, we compare the optical and radar meteor speed distributions and discuss the implications for meteoroid environment models.

Moorhead, A. V.↗

NASA NTRS2019

The Bidirectional Reflectance of Black Silicon Used in Space and Earth Remote Sensing Applications

Space-based astrophysical and remote sensing observations often require the detection and measurement of light originating from distant and relatively faint objects. These observations are highly susceptible to scattered light which may introduce imaging artifacts, obscure object details, and increase measurement noise. This paper describes the initial work of characterizing representative black materials used in coronagraph instruments and other spaceborne instruments. Measurements of “blackness” and the achieved reflectance of black silicon are provided in the spectral range from 400nm to 2500nm using 8o directional hemispherical measurements. The bidirectional reflectance of black silicon was also measured at discrete wavelengths, 633nm, and 1064nm, using the optical scatterometer located at NASA Goddard Space Flight Center’s Diffuser Calibration Laboratory (DCL). A 100mm diameter black silicon sample was fabricated and optically characterized. The BRDF of other well-known black materials such as Z306 and Fractal Black are also presented and discussed.

Georgiev, Georgi T.↗

NASA NTRS2019

The Bidirectional Reflectance of Black Silicon Used in Space and Earth Remote Sensing Applications

Space-based astrophysical and remote sensing observations often require the detection and measurement of light originating from distant and relatively faint objects. These observations are highly susceptible to scattered light which may introduce imaging artifacts, obscure object details, and increase measurement noise. This paper describes the initial work of characterizing representative black materials used in coronagraph instruments and other spaceborne instruments. Measurements of “blackness” and the achieved reflectance of black silicon are provided in the spectral range from 400nm to 2500nm using 8o directional hemispherical measurements. The bidirectional reflectance of black silicon was also measured at discrete wavelengths, 633nm, and 1064nm, using the optical scatterometer located at NASA Goddard Space Flight Center’s Diffuser Calibration Laboratory (DCL). A 100mm diameter black silicon sample was fabricated and optically characterized. The BRDF of other well-known black materials such as Z306 and Fractal Black are also presented and discussed.

Georgiev, Georgi T.↗

NASA NTRS2019

The Bidirectional Reflectance of Black Silicon Used in Space and Earth Remote Sensing Applications

Space-based astrophysical and remote sensing observations often require the detection and measurement of light originating from distant and relatively faint objects. These observations are highly susceptible to scattered light which may introduce imaging artifacts, obscure object details, and increase measurement noise. This paper describes the initial work of characterizing representative black materials used in coronagraph instruments and other spaceborne instruments. Measurements of “blackness” and the achieved reflectance of black silicon are provided in the spectral range from 400nm to 2500nm using 8o directional hemispherical measurements. The bidirectional reflectance of black silicon was also measured at discrete wavelengths, 633nm, and 1064nm, using the optical scatterometer located at NASA Goddard Space Flight Center’s Diffuser Calibration Laboratory (DCL). A 100mm diameter black silicon sample was fabricated and optically characterized. The BRDF of other well-known black materials such as Z306 and Fractal Black are also presented and discussed.

BRDF↗

NASA NTRS1989

A visibility characterization program for optical communications through the atmosphere

A program is described for characterizing the atmosphere as it affects optical communications from a spacecraft. Cloud cover patterns and optical transmission will be determined by setting up three automated observatories in the Southwestern United States. Methods of site selection and operation of hardware and software components are presented, as well as plans for term deployment.

Cowles, K.↗

NASA NTRS2006

Reducing Stray Light To Characterize Nirspec Subsystems: The Focal Plane Array And Micro-Shutter Array

The James Webb Space Telescope (JWST) is an infrared, space-based telescope scheduled for launch in 2013. JWST includes four scientific instruments, including the Near Infrared Spectrometer (NIRSpec), which operates in the wavelength range from 0.6 to 5 microns. NASA/Goddard Space Flight Center (GSFC) is responsible for two NIRSpec subsystems: the detector subsystem, with its focal plane array (FPA), and the micro-shutter subsystem, with its micro-shutter array (MSA). The FPA is comprised of two side-by-side Rockwell Scientific HgCdTe 2kx2k detectors, with detectors and readout electronics optimized for low noise. The MSA is a GSFC developed micro-electro-mechanical system (MEMS) that serves as a programmable slit mask, allowing NIRSpec to obtain simultaneous spectra of >100 objects in a single field of view. We present the optical characterization test plan of the FPA. The test plan is driven by many requirements: cryogenic operating temperature, a flight-like beam shape, and multi-wavelength photon flux from 1 to 60,000 per second, thus low stray light is critical. We use commercial optical modeling software to predict stray light effects at the FPA. We also present the optical contrast test plan of the MSA. Since each individual shutter element operates in on/off fashion, the most important optical metric is contrast. The MSA structure is designed to minimize stray and scattered light, and the test setup reduces stray light such that the optical contrast requirement is met.

Connelly, Joseph A.↗

NASA NTRS1997

An optical systems analysis approach to image resampling

All types of image registration require some type of resampling, either during the registration or as a final step in the registration process. Thus the image(s) must be regridded into a spatially uniform, or angularly uniform, coordinate system with some pre-defined resolution. Frequently the ending resolution is not the resolution at which the data was observed with. The registration algorithm designer and end product user are presented with a multitude of possible resampling methods each of which modify the spatial frequency content of the data in some way. The purpose of this paper is threefold: (1) to show how an imaging system modifies the scene from an end to end optical systems analysis approach, (2) to develop a generalized resampling model, and (3) empirically apply the model to simulated radiometric scene data and tabulate the results. A Hanning windowed sinc interpolator method will be developed based upon the optical characterization of the system. It will be discussed in terms of the effects and limitations of sampling, aliasing, spectral leakage, and computational complexity. Simulated radiometric scene data will be used to demonstrate each of the algorithms. A high resolution scene will be "grown" using a fractal growth algorithm based on mid-point recursion techniques. The result scene data will be convolved with a point spread function representing the optical response. The resultant scene will be convolved with the detection systems response and subsampled to the desired resolution. The resultant data product will be subsequently resampled to the correct grid using the Hanning windowed sinc interpolator and the results and errors tabulated and discussed.

Lyon, Richard G.↗

NASA NTRS1990

In situ measurements of scattering from contaminated optics in the Vacuum Ultraviolet

NASA's In Situ Contamination Effects Facility has been used to measure the time dependence of the angular reflectance from molecularly contaminated optical surfaces in the vacuum ultraviolet. The light scattering measurements are accomplished in situ on optical surfaces in real time during deposition of molecular contaminants. The measurements are taken using noncoherent VUV sources with the predominant wavelengths being the krypton resonance lines at 1236 and 1600 angstroms. Detection of the scattered light is accomplished using a set of three solar blind VUV photomultipliers. An in-plane VUV BRDF (bidirectional reflectance distribution function) experiment is described and details of the on-going program to characterize optical materials exposed to the space environment is reported.

Herren, Kenneth A.↗

NASA NTRS1990

Contamination study

The time dependence of the angular reflectance from molecularly contaminated optical surfaces in the Vacuum Ultraviolet (VUV) is measured. The light scattering measurements are accomplished in situ on optical surfaces in real time during deposition of molecular contaminants. The measurements are taken using non-coherent VUV sources with the predominant wavelengths being the Krypton resonance lines at 1236 and 1600 A. Detection of the scattered light is accomplished using a set of three solar blind VUV photomultipliers. An in-plane VUV BRDF (Bidirectional Reflectance Distribution Functions) experiment is described and details of the ongoing program to characterize optical materials exposed to the space environment is reported.

Johnson, R. Barry↗

NASA NTRS2022

Arctic Biogeochemical and Optical Properties of Dissolved Organic Matter Across River to Sea Gradients

Arctic landscapes are warming and becoming wetter due to changes in precipitation and the timing of snowmelt which consequently alters seasonal runoff and river discharge patterns. These changes in hydrology lead to increased mobilization and transport of terrestrial dissolved organic matter (DOM) to Arctic coastal seas where significant impacts on biogeochemical cycling can occur. Here, we present measurements of dissolved organic carbon (DOC) and chromophoric DOM (CDOM) in the Yukon River-to-Bering Sea system and two river plumes on the Alaska North Slope which flow into the Beaufort Sea. Our sampling characterized optical and biogeochemical properties of DOM during high and low river discharge periods for the Yukon River-Bering Sea system. The average DOC concentration at the multiple Yukon River mouths ranged from a high of 10.36 mg C L-1 during the ascending limb of the 2019 freshet (late May), 6.4 mg C L-1 during the descending limb of the 2019 freshet (late June), and a low of 3.86 mg C L-1 during low river discharge in August 2018. CDOM absorption coefficient at 412 nm (aCDOM(412)) averaged 8.23 m-1, 5.07 m-1, and 1.9 m-1, respectively. Several approaches to model DOC concentration based on its relationship with CDOM properties demonstrated cross-system seasonal and spatial robustness for these Arctic coastal systems despite spanning an order of magnitude decrease in DOC concentration from the lower Yukon River to the Northern Bering Sea as well as the North Slope systems. “Snapshot” fluxes of DOC and CDOM across the Yukon River Delta to Norton Sound were calculated from our measurements and modeled water fluxes forced with upstream USGS river gauge data. Our findings suggest that during high river flow, DOM reaches the delta largely unaltered by inputs or physical and biogeochemical processing and that the transformations of Yukon River DOM largely occur in the plume. However, during low summer discharge, multiple processes including local precipitation events, microbial decomposition, photochemistry, and likely others can alter the DOM properties within the lower Yukon River and Delta prior to flowing into Norton Sound.

Arctic↗

NASA NTRS2022

Optimized Umkehr Profile Algorithm for Ozone Trend Analyses

The long-term record of Umkehr measurements from four NOAA Dobson spectrophotometers was reprocessed after updates to the instrument calibration procedures. In addition, a new data quality-control tool was developed for the Dobson automation software (WinDobson). This paper presents a comparison of Dobson Umkehr ozone profiles from NOAA ozone network stations (Boulder, OHP, MLO, Lauder) against several satellite records, including Aura Microwave Limb Sounder (MLS; ver. 4.2), and combined SBUV and OMPS records (NASA AGG and NOAA COH). A subset of satellite data is selected to match Dobson Umkehr observations at each station spatially (distance less than 200 km) and temporally (within 24 hours). Umkehr Averaging Kernels (AKs) are applied to vertically smooth all overpass satellite profiles prior to comparisons. The station Umkehr record consists of several instrumental records, which have different optical characterizations, and thus instrument-specific stray light contributes to the data processing errors and creates step changes in the record. This work evaluates the overall quality of Umkehr long-term measurements at NOAA ground-based stations and assesses the impact of the instrumental changes on the stability of the Umkehr ozone profile record. This paper describes a method designed to correct biases and discontinuities in the retrieved Umkehr profile that originate from the Dobson calibration process, repair, or optical realignment of the instrument. The M2GMI and GMI CTM ozone profile model output matched to station location and date of observation is used to evaluate instrumental step changes in the Umkehr record. Homogenization of the Umkehr record and discussion of the apparent stray light error in retrieved ozone profiles are the focus of this paper. Homogenization of ground-based records is of great importance for studies of long-term ozone trends and climate change.

Umkehr↗

NASA NTRS1979

Optical fiber dispersion characterization study

The theory, design, and results of optical fiber pulse dispersion measurements are considered. Both the hardware and software required to perform this type of measurement are described. Hardware includes a thermoelectrically cooled injection laser diode source, an 800 GHz gain bandwidth produce avalanche photodiode and an input mode scrambler. Software for a HP 9825 computer includes fast Fourier transform, inverse Fourier transform, and optimal compensation deconvolution. Test set construction details are also included. Test results include data collected on a 1 Km fiber, a 4 Km fiber, a fused spliced, eight 600 meter length fibers concatenated to form 4.8 Km, and up to nine optical connectors.

Geeslin, A.↗

NASA NTRS2020

Two-Year Cosmology Large Angular Scale Surveyor (CLASS) Observations: 40GHz Telescope Pointing, Beam Profile, Window Function, and Polarization Performance

The Cosmology Large Angular Scale Surveyor (CLASS) is a telescope array that observes the cosmic microwave background (CMB) over 75% of the sky from the Atacama Desert, Chile, at frequency bands centered near 40, 90, 150, and 220 GHz. CLASS measures the large angular scale (1°~< θ >=90°) CMB polarization to constrain the tensor-to-scalar ratio at the r ∼ 0.01 level and the optical depth to last scattering to the sample variance limit. This paper presents the optical characterization of the 40 GHz telescope during its ﬁrst observation era, from 2016 September to 2018 February. High signal-to-noise observations of the Moon establish the pointing and beam calibration. The telescope boresight pointing variation is <0°. 023 (<1.6% of the beam’s full width at half maximum (FWHM)). We estimate beam parameters per detector and in aggregate, as in the CMB survey maps. The aggregate beam has an FWHM of 1°.579 ± 0°.001 and a solid angle of 838 ± 6 μsr, consistent with physical optics simulations. The corresponding beam window function has a sub-percent error per multipole at ℓ < 200. An extended 90° beam map reveals no signiﬁcant far sidelobes. The observed Moon polarization shows that the instrument polarization angles are consistent with the optical model and that the temperature-to-polarization leakage fraction is <10(exp −4) (95% C.L.). We ﬁnd that the Moon-based results are consistent with measurements of M42, RCW 38, and Tau A from CLASS’s CMB survey data. In particular, Tau A measurements establish degree- level precision for instrument polarization angles.

Xu, Zhilei↗

NASA NTRSDate not supplied

Enhanced Far Ultra-Violet Optical Properties of Physical Vapor Deposited Aluminum Mirrors Through Fluorination

Astronomical instrumentation for measurements in the Far Ultra-Violet (FUV, 90-200 nm) typically use aluminum (Al) thin films due to their high reflectance over this wavelength range. However, the native aluminum oxide layer that forms on Al upon exposure to the atmosphere is strongly absorbing in this wavelength range, requiring that the films be protected with a dielectric that inhibits oxidation. Typically, magnesium fluoride (MgF 2 ) or lithium fluoride (LiF) coatings are used as protective layers, but each has shortcomings. For example, MgF 2 has an absorption cutoff at 115 nm reducing performance in a critical part of the FUV spectrum of observational interest. A viable option to access these lower wavelengths could be the use of the LiF overcoat as it has a lower absorption cutoff at 102.5 nm, but it is hygroscopic and thus susceptible to degradation in humid conditions. An approach to reduce the hygroscopic nature of LiF would be to implement a passivation process during the deposition of both Al+LiF coatings. Our team at GSFC has developed a new reactive Physical Vapor Deposition (rPVD) process that consists of a fluorination process with XeF 2 gas combined with our traditional PVD process. We have found that this new rPVD coating process offers a protected version of Al+LiF with a more environmentally stable and more transparent LiF layer, along with unprecedent reflectivity. The process starts with a bare optically smooth substrate that is coated with Al in an ultra-high vacuum (UHV) chamber by the conventional PVD process. Then, the bare Al mirror is immediately exposed to a reactive XeF 2 gas before and after the application of the flash PVD evaporated LiF layer. We have also been investigating the use of this rPVD coating process for potential efficiency enhancements of Si-based gratings. Since it is known that the XeF 2 vapor is a strong Si etchant, we are investigating if the native SiO 2 layer on Si is sufficient to protect the groove profile of e-beam-ruled Si gratings from degradation. We will report on the characterization of various Al+LiF witness mirror coatings (both on borosilicate and Si) performed under various deposition conditions using the XeF 2 passivation process. These tests include XPS to determine film stoichiometry and AFM/SEM to measure surface roughness and any etching on the Si substrate. We will also report on FUV reflectance and spectroscopic ellipsometry to characterize optical constants of these passivated films in the UV/Visible/NIR spectral ranges.

Engineering (General)↗

NASA NTRSDate not supplied

Enhanced Far Ultra-Violet Optical Properties of Physical Vapor Deposited Aluminum Mirrors Through Fluorination

Astronomical instrumentation for measurements in the Far Ultra-Violet (FUV, 90-200 nm) typically use aluminum (Al) thin films due to their high reflectance over this wavelength range. However, the native aluminum oxide layer that forms on Al upon exposure to the atmosphere is strongly absorbing in this wavelength range, requiring that the films be protected with a dielectric that inhibits oxidation. Typically, magnesium fluoride (MgF 2 ) or lithium fluoride (LiF) coatings are used as protective layers, but each has shortcomings. For example, MgF 2 has an absorption cutoff at 115 nm reducing performance in a critical part of the FUV spectrum of observational interest. A viable option to access these lower wavelengths could be the use of the LiF overcoat as it has a lower absorption cutoff at 102.5 nm, but it is hygroscopic and thus susceptible to degradation in humid conditions. An approach to reduce the hygroscopic nature of LiF would be to implement a passivation process during the deposition of both Al+LiF coatings. Our team at GSFC has developed a new reactive Physical Vapor Deposition (rPVD) process that consists of a fluorination process with XeF 2 gas combined with our traditional PVD process. We have found that this new rPVD coating process offers a protected version of Al+LiF with a more environmentally stable and more transparent LiF layer, along with unprecedent reflectivity. The process starts with a bare optically smooth substrate that is coated with Al in an ultra-high vacuum (UHV) chamber by the conventional PVD process. Then, the bare Al mirror is immediately exposed to a reactive XeF 2 gas before and after the application of the flash PVD evaporated LiF layer. We have also been investigating the use of this rPVD coating process for potential efficiency enhancements of Si-based gratings. Since it is known that the XeF 2 vapor is a strong Si etchant, we are investigating if the native SiO 2 layer on Si is sufficient to protect the groove profile of e-beam-ruled Si gratings from degradation. We will report on the characterization of various Al+LiF witness mirror coatings (both on borosilicate and Si) performed under various deposition conditions using the XeF 2 passivation process. These tests include XPS to determine film stoichiometry and AFM/SEM to measure surface roughness and any etching on the Si substrate. We will also report on FUV reflectance and spectroscopic ellipsometry to characterize optical constants of these passivated films in the UV/Visible/NIR spectral ranges.

Engineering (General)↗

NASA NTRSDate not supplied

Enhanced Far Ultra-Violet Optical Properties of Physical Vapor Deposited Aluminum Mirrors Through Fluorination

Astronomical instrumentation for measurements in the Far Ultra-Violet (FUV, 90-200 nm) typically use aluminum (Al) thin films due to their high reflectance over this wavelength range. However, the native aluminum oxide layer that forms on Al upon exposure to the atmosphere is strongly absorbing in this wavelength range, requiring that the films be protected with a dielectric that inhibits oxidation. Typically, magnesium fluoride (MgF 2 ) or lithium fluoride (LiF) coatings are used as protective layers, but each has shortcomings. For example, MgF 2 has an absorption cutoff at 115 nm reducing performance in a critical part of the FUV spectrum of observational interest. A viable option to access these lower wavelengths could be the use of the LiF overcoat as it has a lower absorption cutoff at 102.5 nm, but it is hygroscopic and thus susceptible to degradation in humid conditions. An approach to reduce the hygroscopic nature of LiF would be to implement a passivation process during the deposition of both Al+LiF coatings. Our team at GSFC has developed a new reactive Physical Vapor Deposition (rPVD) process that consists of a fluorination process with XeF 2 gas combined with our traditional PVD process. We have found that this new rPVD coating process offers a protected version of Al+LiF with a more environmentally stable and more transparent LiF layer, along with unprecedent reflectivity. The process starts with a bare optically smooth substrate that is coated with Al in an ultra-high vacuum (UHV) chamber by the conventional PVD process. Then, the bare Al mirror is immediately exposed to a reactive XeF 2 gas before and after the application of the flash PVD evaporated LiF layer. We have also been investigating the use of this rPVD coating process for potential efficiency enhancements of Si-based gratings. Since it is known that the XeF 2 vapor is a strong Si etchant, we are investigating if the native SiO 2 layer on Si is sufficient to protect the groove profile of e-beam-ruled Si gratings from degradation. We will report on the characterization of various Al+LiF witness mirror coatings (both on borosilicate and Si) performed under various deposition conditions using the XeF 2 passivation process. These tests include XPS to determine film stoichiometry and AFM/SEM to measure surface roughness and any etching on the Si substrate. We will also report on FUV reflectance and spectroscopic ellipsometry to characterize optical constants of these passivated films in the UV/Visible/NIR spectral ranges.

Engineering (General)↗

NASA NTRS1976

Development of an improved coating for polybenzimidazole foam

An improved coating system was developed for Polybenzimidazole (PBI) foam to provide coating stability, ruggedness, moisture resistance, and to satisfy optical property requirements (alpha sub (s/epsilon) or = 0.4 and epsilon 0.8) for the space shuttle. The effort was performed in five tasks: Task 1 to establish material and process specifications for the PBI foam, and material specifications for the coatings; Task 2 to identify and evaluate promising coatings; Task 3 to establish mechanical and thermophysical properties of the tile components; Task 4 to determine by systems analysis the potential weight trade-offs associated with a coated PBI TPS; and Task 5 to establish a preliminary quality assurance program. The coated PBI tile was, through screening tests, determined to satisfy the design objectives with a reduced system weight over the baseline shuttle silica LRSI TPS. The developed tile provides a thermally stable, extremely rugged, low thermal conductivity insulator with a well characterized optical coating.

Neuner, G. J.↗