Contamination study

Abstract

The time dependence of the angular reflectance from molecularly contaminated optical surfaces in the Vacuum Ultraviolet (VUV) is measured. The light scattering measurements are accomplished in situ on optical surfaces in real time during deposition of molecular contaminants. The measurements are taken using non-coherent VUV sources with the predominant wavelengths being the Krypton resonance lines at 1236 and 1600 A. Detection of the scattered light is accomplished using a set of three solar blind VUV photomultipliers. An in-plane VUV BRDF (Bidirectional Reflectance Distribution Functions) experiment is described and details of the ongoing program to characterize optical materials exposed to the space environment is reported.