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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 1,009 records · Page 56

Optical Pathlength Control Experiment on JPL Phase B Testbed

An experimental implementation of a nanometer level optical pathlength control for large baseline space interferometry is presented. The pathlength compensation system is installed on a large flexible experimental truss, thus structural motions play a dominant role in the control system design. The associated control structure interaction problem is addressed to maintain the optical pathlength within the prescribed variation of 10-15 nanometer rms. By a successful blend of a structural control for damping augmentation and a direct pathlength control for the pathlength compensation, the optical pathlength variation has been maintained within 6 nonometer rms under the laboratory ambient disturbance and within 9 nonmeter rms under a severe forced resonant disturbance.

interferometry↗

Integrated Modeling Methodology Validation Using the Micro-Precision Interferometer Testbed

This paper validates the integrated modeling methodology used for design and performance evaluation of complex opto-mechanical systems, particularly spaceborne interferometers. The methodology integrates structural modeling, optical modeling, and control system design into a common environment, the Integrated Modeling of Optical Systems (IMOS) software package.

opto-mechanical↗

Metrology system for Space Interferometry Mission system testbed 3

In a 3-baseline interferometer fourteen metrology gauges are used to monitor changes in the two baselines and calculate the length of the third. Simulation for estimating the third baseline indicates measurement capability of better than 1 nm error.

interferometry↗

Metrology for the Micro-Arcsecond Metrology Testbed

The Space Interferometry Mission (SIM) relies on the combination of interferometry with a metrology system capable of measureing picometer relative length changes and micrometer absolute lengths.

interferometer↗