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NASA NTRS · 20210005041

Metrology system for Space Interferometry Mission system testbed 3

Gursel, Y.·Goullioud, R.·Alvarez-Salazar, O.·Azizi, A.
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Abstract

In a 3-baseline interferometer fourteen metrology gauges are used to monitor changes in the two baselines and calculate the length of the third. Simulation for estimating the third baseline indicates measurement capability of better than 1 nm error.

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Gursel, Y., Goullioud, R., Alvarez-Salazar, O., Azizi, A.. 2004-05-16. Metrology system for Space Interferometry Mission system testbed 3. https://ntrs.nasa.gov/citations/20210005041

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