Factors that affect reliability of nondestructive detection of flaws in structural ceramics
The factors that affect reliability of nondestructive detection of flaws in structural ceramics by microfocus radiography and scanning laser acoustic microscopy (SLAM) were investigated. Reliability of void detection in silicon nitride and silicon carbide by microfocus X-rays was affected by photon energy level, material chemistry in the immediate vicinity of the void, and the presence of loose powder aggregates inside the void cavity. The sensitivity of SLAM to voids was affected by material microstructure, the level of porosity, and the condition of the specimen surfaces. Statistical results are presented in the form of probability of detection as a function of void diameter for green compacts and sintered materials.