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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 91 records · Page 5

All sources NASA NTRS DOE OSTI

NASA NTRS1968

Microelectronic device data handbook. Volume 2 - Manufacturer and specific device information

Microelectronic device data handbook /manufacturer and specific device information/

Source record↗

NASA NTRS1968

High-speed micropower microelectronic logic circuits Final technical documentary report, 18 May 1967 - 18 Jun. 1968

High speed micropower microelectronic transistor logic circuits in integrated form

Stehlin, R.↗

NASA NTRS1967

Microelectronics in space

Reliability control problems of high temperature microelectronics

Dunlap, W. C.↗

NASA NTRS1968

Microelectronic Data and Control Transmission System for Dynamic Wind-tunnel Testing

Microelectronic data and remote control system for dynamic transonic wind tunnel testing

Nichols, C. D.↗

NASA NTRS1967

An independent management critique of the NASA microelectronic reliability program

Probable effectiveness of NASA microelectronic reliability program and data bank services

Source record↗

NASA NTRS1968

Microelectronics on the Applications Technology Satellite.

Reliability, handling and packaging of microelectronic submodules used in integrated circuits on Applications Technology Satellite

Van Allen, R. L.↗

NASA NTRS1969

Microelectronic oscillator uses a bipolar transistor to circumvent the problem of developing suitable inductors for lower frequencies. The oscillator is fabricated by hybrid thin film techniques or by monolithic construction. Discrete microminiature components may also be employed.

Kleinberg, L. L.↗

NASA NTRS1969

Microelectronic oscillator

Bipolar transistor operated in a grounded base configuration is used as the inductor in a microelectronic oscillator. This configuration is employed using thin-film hybrid technology and is also applicable to monolithic technology.

Kleinberg, L. L.↗

NASA NTRS1968

Establishment of quality and reliability standards and development of screening techniques for MOS microelectronic devices Final report

Quality and reliability standard development and screening test results for MOS microelectronic devices

Drum, D.↗

NASA NTRS1968

Study of failure and reliability of microelectronics devices Quarterly report, 1 Jul. - 30 Sep. 1968

Environmental tests on microelectronic devices having surface defects

Source record↗

NASA NTRS1968

Development of a microelectronic module Final report

Feasibility of operating gallium arsenide devices in high temperature microelectronic circuits

Doerbeck, F.↗

NASA NTRS1968

Microwave microelectronic techniques applied to phase shifters and other control devices Final report, 29 May - 29 Nov. 1968

Microwave microelectronic techniques applied to phase shifters and other control devices

Robinson, G. H.↗

NASA NTRS1969

Study of failure and reliability of microelectronic devices Quarterly report, 1 Oct. - 31 Dec. 1968

Environmental test of microelectronic devices for surface defects

Source record↗

NASA NTRS1968

Reliability assessment of microcircuits and microelectronic systems.

Microcircuit components and microelectronic systems reliability assessment including short term testing, noting digital systems, packaging, production controls, etc

Hall, E. C.↗

NASA NTRS1968