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At least 91 records · Page 5

The scanning electron microscope as a tool in space biology

Normal erythrocytes are disc-shaped and are referred to here descriptively as discocytes. Several morphologically variant forms occur nomally but in rather small amounts, usually less than one percent of total. It has been shown though, that spiculed variant forms referred to as echinocytes are generated in significant amounts at zero g. Normal red cells have been stressed in vitro in an effort to duplicate the observed discocyte-echinocyte transformation at zero g. The significance of this transformation to extended stay in space and some of the plausible reasons for this transformation are discussed.

Barrett, R. A.↗

Computer control of a scanning electron microscope for digital image processing of thermal-wave images

Using a recently developed technology called thermal-wave microscopy, NASA Lewis Research Center has developed a computer controlled submicron thermal-wave microscope for the purpose of investigating III-V compound semiconductor devices and materials. This paper describes the system's design and configuration and discusses the hardware and software capabilities. Knowledge of the Concurrent 3200 series computers is needed for a complete understanding of the material presented. However, concepts and procedures are of general interest.

Gilbert, Percy↗

In-situ scanning electron microscope studies of crack growth in an aluminum metal-matrix composite

Edge-notched specimens of a cast and extruded Al alloy-based, alumina particulate-reinforced composite in the annealed condition were tested in situ in a SEM apparatus equipped with a deformation stage permitting the direct observation of crack growth phenomena. Fracture in this composite is seen to proceed by initiation of microcracks ahead of the macrocrack; as deformation proceeds, the microcracks lengthen, and crack propagation occurs when the region of intense plastic straining becomes comparable to the macrocrack-microcrack distance. The sequence is then repeated.

Manoharan, M.↗

Effects of Space Weathering on Lunar Rocks: Scanning Electron Microscope Petrography

Lunar rocks that have undergone direct exposure to the space weathering environment at the surface of the Moon commonly have patinas on their surfaces. Patinas are characterized by visible darkening and other changes in spectral properties of rocks. They form as a result of bombardment by micrometeorites, solar wind, and solar flares. Processes of space weathering and patina production have clearly been significant in the formation and history of the lunar regolith. It is very likely that other planetary bodies without atmospheres have undergone similar alteration processes; therefore, it is critical to determine the relationship between patinas and their host rocks in view of future robotic and remote-sensing missions to the Moon and other planetary bodies.

Wentworth, Susan J.↗

Construction of a Virtual Scanning Electron Microscope (VSEM)

The Imaging Technology Group (ITG) proposed to develop a Virtual SEM (VSEM) application and supporting materials as the first installed instrument in NASA s Virtual Laboratory Project. The instrument was to be a simulator modeled after an existing SEM, and was to mimic that real instrument as closely as possible. Virtual samples would be developed and provided along with the instrument, which would be written in Java.

Fried, Glenn↗

Integrated material-surface analyzer

These 10 surface-analysis tests can be run without breaking vacuum: secondary-ion mass spectroscopy, ion-scattering spectroscopy, electron-stimulated desorption, residual-gas analysis, auger electron spectroscopy, x-ray photoelectron spectroscopy, ultraviolet photoelectron spectroscopy, characteristic-electron energy-loss spectroscopy, scanning electron microscope, scanning low-energy electron probe. Quadruple mass spectrometer, used in first 4 tests, serves as electron transfer lens in last 6 tests.

Grunthaner, F. J.↗

Effect of nitriding on mechanical and microstructural properties of Direct Metal Laser Sintered 17-4PH stainless steel

In this work, the effect of the nitriding process on microstructure and mechanical properties of additively manufactured (AM) 17-4PH stainless steel is investigated. The nitriding was performed at 530 °C, 560 °C, and 580 °C for 2 h. The nitriding process improves the hardness and surface roughness of the AM 17-4PH steel. Detailed microstructural characterizations of both as-built and nitride samples are performed using an optical microscope, scanning electron microscope (SEM) equipped with energy-dispersive X-ray spectroscopy (EDS), and X-ray diffraction technique. It reveals that the nitride layer thickness increases with nitriding temperature. A distinct transition layer between the substrate and nitride layer is observed in the 560 °C and 580 °C nitride samples. The nitriding process develops almost equiaxed grain microstructure with new secondary phase precipitates, whereas in the as-built material, the grains are primarily columnar along the AM process build direction. Specifically, the nitriding process introduces γ-Fe4N, ε-Fe3N, CrN, and Ni3N precipitates. The increase in Ni- and Cu-rich precipitates with the nitriding temperature explains the observed improvement in the hardness and surface roughness. Furthermore, the nitriding process does not alter the substrate's initial weak crystallographic texture.

17-4PH steel↗

Mapping the Structure of Heterogeneous Materials

Image-processing microdensitometer/Fourier analyzer yields statistics of subcomponent distribution. Nondestructive method for studying structure heterogeneous materials uses energy-dispersive X-ray analysis in scanning electron microscope. Scanning microdensitometer/Fourier analyzer (SMFA) is applied to SEM images to obtain statistics about sample structure. Method originally developed for studying effect on combustion of fine structure of composite solid propellants.

Strand, L. D.↗

Improved silicon nitride for advanced heat engines

The results of a four year program to improve the strength and reliability of injection-molded silicon nitride are summarized. Statistically designed processing experiments were performed to identify and optimize critical processing parameters and compositions. Process improvements were monitored by strength testing at room and elevated temperatures, and microstructural characterization by optical, scanning electron microscopes, and scanning transmission electron microscope. Processing modifications resulted in a 20 percent strength and 72 percent Weibull slope improvement of the baseline material. Additional sintering aids screening and optimization experiments succeeded in developing a new composition (GN-10) capable of 581.2 MPa at 1399 C. A SiC whisker toughened composite using this material as a matrix achieved a room temperature toughness of 6.9 MPa m(exp .5) by the Chevron notched bar technique. Exploratory experiments were conducted on injection molding of turbocharger rotors.

Yeh, Harry C.↗

Analysis of a used pair of arcjet electrodes

The anode and cathode of a 30-kW class arcjet engine have been sectioned and analyzed. This arcjet was operated for a total time of 573 hours at power levels between 25 and 30 kW with ammonia at flow rates of 0.25 and 0.27 gm/s. The accumulated run time was sufficient to clearly establish erosion patterns and their causes. The type of electron emission from various parts of the cathode surface was made clear by Scanning Electron Microscope analysis. A Scanning Electron Microscope was used to study recrystallization on the hot anode surface. These electrodes were made of 2 percent thoriated tungsten and the surface thorium content and gradient perpendicular to the surfaces was determined by quantitative microprobe analysis. The results of this material analysis on the electrodes and recommendations for improving electrode operational life time are presented.

Pivirotto, Thomas J.↗

Electrode erosion in steady-state electric propulsion engines

The anode and cathode of a 30 kW class arcjet engine were sectioned and analyzed. This arcjet was operated for a total time of 573 hr at power levels between 25 and 30 kW with ammonia at flow rates of 0.25 and 0.27 gm/s. The accumulated run time was sufficient to clearly establish erosion patterns and their causes. The type of electron emission from various parts of the cathode surface was made clear by scanning electron microscope analysis. A scanning electron microscope was used to study recrystallization on the hot anode surface. These electrodes were made of 2 percent thoriated tungsten and the surface thorium content and gradient perpendicular to the surfaces was determined by quantitative microprobe analysis. The results of this material analysis on the electrodes and recommendations for improving electrode operational life time are presented.

Pivirotto, Thomas J.↗

Scanning Microscopes Using X Rays and Microchannels

Scanning microscopes that would be based on microchannel filters and advanced electronic image sensors and that utilize x-ray illumination have been proposed. Because the finest resolution attainable in a microscope is determined by the wavelength of the illumination, the xray illumination in the proposed microscopes would make it possible, in principle, to achieve resolutions of the order of nanometers about a thousand times as fine as the resolution of a visible-light microscope. Heretofore, it has been necessary to use scanning electron microscopes to obtain such fine resolution. In comparison with scanning electron microscopes, the proposed microscopes would likely be smaller, less massive, and less expensive. Moreover, unlike in scanning electron microscopes, it would not be necessary to place specimens under vacuum. The proposed microscopes are closely related to the ones described in several prior NASA Tech Briefs articles; namely, Miniature Microscope Without Lenses (NPO-20218), NASA Tech Briefs, Vol. 22, No. 8 (August 1998), page 43; and Reflective Variants of Miniature Microscope Without Lenses (NPO-20610), NASA Tech Briefs, Vol. 26, No. 9 (September 2002) page 6a. In all of these microscopes, the basic principle of design and operation is the same: The focusing optics of a conventional visible-light microscope are replaced by a combination of a microchannel filter and a charge-coupled-device (CCD) image detector. A microchannel plate containing parallel, microscopic-cross-section holes much longer than they are wide is placed between a specimen and an image sensor, which is typically the CCD. The microchannel plate must be made of a material that absorbs the illuminating radiation reflected or scattered from the specimen. The microchannels must be positioned and dimensioned so that each one is registered with a pixel on the image sensor. Because most of the radiation incident on the microchannel walls becomes absorbed, the radiation that reaches the image sensor consists predominantly of radiation that was launched along the longitudinal direction of the microchannels. Therefore, most of the radiation arriving at each pixel on the sensor must have traveled along a straight line from a corresponding location on the specimen. Thus, there is a one-to-one mapping from a point on a specimen to a pixel in the image sensor, so that the output of the image sensor contains image information equivalent to that from a microscope.

Wang, Yu↗

Flexible high-voltage supply for experimental electron microscope

Scanning microscope uses a field-emission tip for the electron source, an electron gun that simultaneously accelerates and focuses electrons from the source, and one auxiliary lens to produce a final probe size at the specimen on the order of angstroms.

Chapman, G. L.↗