DOE OSTI · 1780954
Electron Backscatter Diffraction based Strain Analysis in the Scanning Electron Microscope.
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Wright, Stuart, Kacher, Joshua, Ruggles, Timothy. 2021-01-01. Electron Backscatter Diffraction based Strain Analysis in the Scanning Electron Microscope.. https://www.osti.gov/biblio/1780954
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