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At least 91 records · Page 5

Profiling Sea Ice with a Multiple Altimeter Beam Experimental Lidar (MABEL)

The sole instrument on the upcoming ICESat-2 altimetry mission is a micropulse lidar that measures the time-of-flight of individual photons from laser pulses transmitted at 532 nm. Prior to launch, MABEL serves as an airborne implementation for testing and development. In this paper, we provide a first examination of MABEL data acquired on two flights over sea ice in April 2012: one north of the Arctic coast of Greenland, and the other in the East Greenland Sea.We investigate the phenomenology of photon distributions in the sea ice returns. An approach to locate the surface and estimate its elevation in the distributions is described, and its achievable precision assessed. Retrieved surface elevations over relatively flat leads in the ice cover suggest that precisions of several centimeters are attainable. Restricting the width of the elevation window used in the surface analysis can mitigate potential biases in the elevation estimates due to subsurface returns at 532 nm. Comparisons of nearly coincident elevation profiles from MABEL with those acquired by an analog lidar show good agreement.Discrimination of ice and open water, a crucial step in the determination of sea ice free board and the estimation of ice thickness, is facilitated by contrasts in the observed signal background photon statistics. Future flight lines will sample a broader range of seasonal ice conditions for further evaluation of the year-round profiling capabilities and limitations of the MABEL instrument.

Lidar↗

Identification of the Hard X-Ray Source Dominating the E > 25 keV Emission of the Nearby Galaxy M31

We report the identification of a bright hard X-ray source dominating the M31 bulge above 25 kiloelectronvolts from a simultaneous NuSTAR-Swift observation. We find that this source is the counterpart to Swift J0042.6+4112, which was previously detected in the Swift BAT All-Sky Hard X-Ray Survey. This Swift BAT source had been suggested to be the combined emission from a number of point sources; our new observations have identified a single X-ray source from 0.5 to 50 kiloelectronvolts as the counterpart for the first time. In the 0.5-10 kiloelectronvolt band, the source had been classified as an X-ray Binary candidate in various Chandra and XMM-Newton studies; however, since it was not clearly associated with Swift J0042.6+4112, the previous E is less than 10 kiloelectronvolts observations did not generate much attention. This source has a spectrum with a soft X-ray excess (kT approximately equal to 0.2 kiloelectronvolts) plus a hard spectrum with a power law of gamma approximately equal to 1 and a cutoff around 15-20 kiloelectronvolts, typical of the spectral characteristics of accreting pulsars. Unfortunately, any potential pulsation was undetected in the NuSTAR data, possibly due to insufficient photon statistics. The existing deep HST (Hubble Space Telescope) images exclude high-mass (greater than 3 times the radius of the moon) donors at the location of this source. The best interpretation for the nature of this source is an X-ray pulsar with an intermediate-mass (less than 3 times the radius of the moon M) companion or a symbiotic X-ray binary. We discuss other possibilities in more detail.

galaxies: bulges – galaxies: individual (M31)↗

Far-Ultraviolet Observations of Comet C 2012 S1 (ISON) From Fortis

We have used the unique far-UV imaging capability offered by a sounding-rocket-borne instrument to acquire observations of C/2012 S1 (ISON) when its angular separation with respect to the Sun was 26 deg.3 on 2013 November 20.49. At the time of observation, the comet's heliocentric distance and velocity relative to the Sun were r h = 0.43 au and r (sub h) = 62.7 km s)exp. -1). Images dominated by C Iota Lambda 1657 and H Iota Lambda 1216 were acquired over a 10(exp. 6) x 10(exp. 6) km(exp. 2) region. The water production rate implied by the Ly Alpha observations is constrained to be Q H2O is much greater than 8 x 10(exp. 29) s(exp. -1) while the neutral carbon production rate was Q(sub c) is much greater than 4 x 10(exp. 28) s(exp. -1). The radial profile of C I was consistent with it being a dissociation product of a parent molecule with a lifetime T is approx. 5 x 10(exp. 4) s, favoring a parent other than CO. We constrain the Q(sub co) production rate to 5(+1.5)(-7.5), 10(exp. 28) s(exp. -1) with 1 sigma errors derived from photon statistics. The upper limit on the Q (sub CO)/Q(sub H2O) is 6%.

sounding rocket↗

Identification of the Hard X-Ray Source Dominating the E>25 keV Emission of the Nearby Galaxy M31

We report the identification of a bright hard X-ray source dominating the M31 bulge above 25 keV from a simultaneous NuSTAR-Swift observation. We find that this source is the counterpart to Swift J0042.6+4112, which was previously detected in the Swift BAT All-sky Hard X-ray Survey. This Swift BAT source had been suggested to be the combined emission from a number of point sources; our new observations have identified a single X-ray source from 0.5 to 50 keV as the counterpart for the first time. In the 0.5-10 keV band, the source had been classified as an X-ray Binary candidate in various Chandra and XMM-Newton studies; however, since it was not clearly associated with Swift J0042.6+4112, the previous E<10 keV observations did not generate much attention. This source has a spectrum with a soft X-ray excess (kT ∼ 0.2 keV) plus a hard spectrum with a power law of G ~ 1 and a cutoff around 15-20 keV, typical of the spectral characteristics of accreting pulsars. Unfortunately, any potential pulsation was undetected in the NuSTAR data, possibly due to insufficient photon statistics. The existing deep HST images exclude high-mass (>3 solar mass) donors at the location of this source. The best interpretation for the nature of this source is an X-ray pulsar with an intermediate-mass (<3 solar mass) companion or a symbiotic X-ray binary. We discuss other possibilities in more detail.

Yukita, M.↗

NuSTAR Measurement of the Cosmic X-ray Background in the 3–20 keV Energy Band

We present measurements of the intensity of the cosmic X-ray background (CXB) with the Nuclear Spectroscopic Telescope Array (NuSTAR) telescope in the 3–20 keV energy range. Our method uses spatial modulation of the CXB signal on the NuSTAR detectors through the telescope’s side aperture. Based on the NuSTAR observations of selected extragalactic fields with a total exposure of 7 Ms, we have estimated the CXB 3–20 keV flux to be 2.8×10−11erg s−1cm−2deg−2, which is∼8 per cent higher than that measured withHEAO-1and consistent with the INTEGRAL measurement. The inferred CXB spectral shape in the3–20 keV energy band is consistent with the canonical model of Gruber et al. We demonstrate that the spatially modulated CXB signal measured by NuSTAR is not contaminated by systematic noise and is limited by photon statistics. The measured relative scatter of the CXB intensity between different sky directions is compatible with cosmic variance, which opens new possibilities for studying CXB anisotropy over the whole sky with NuSTAR.

Detectors↗

Effect of photon counting shot noise on total internal reflection microscopy

Total internal reflection microscopy (TIRM) measures changes in the distance between a colloidal particle and a transparent substrate by measuring the scattering intensity of the particle illuminated by an evanescent wave. From the distribution of the recorded separation distances, the height-dependent effective potential φ(z) between the colloidal particle and the substrate can be measured. In this work, we show that spatial resolution with which TIRM can measure φ(z) is limited by the photon counting statistics of the scattered laser light. Here, we develop a model to evaluate the effect of photon counting statistics on different potential profiles using Brownian dynamics simulations and experiments. Our results show that the effect of photon counting statistics depends on spatial gradients ∂φ/∂z of the potential, with the result that sharp features tend to be significantly blurred. We further establish the critical role of photon counting statistics and the intensity integration time τ in TIRM measurements, which is a trade-off between narrowing the width of the photon counting distribution and capturing the instantaneous position of the probe particle.

47 OTHER INSTRUMENTATION↗

Band-limited photodetection of temporal coherence

The quantum theory of optical coherence plays a ubiquitous role in identifying optical emitters. An unequivocal identification, however, presumes that the photon number statistics is resolved from timing uncertainties. We demonstrate from first principle that the observed nth-order temporal coherence is a n-fold convolution of the instrument responses and the expected coherence. The consequence is detrimental in which the photon number statistics is masked from the unresolved coherence signatures. The experimental investigations are thus far consistent with the theory developed. We envision the present theory will mitigate the false identification of optical emitters and enlarge the coherence deconvolution to an arbitrary order.

42 ENGINEERING↗

Statistical fitting accuracy in photon correlation spectroscopy

Continuing our experimental investigation of the fitting accuracy associated with photon correlation spectroscopy, we collect 150 correlograms of light scattered at 90 deg from a thermostated sample of 91-nm-diameter, polystyrene latex spheres in water. The correlograms are taken with two correlators: one with linearly spaced channels and one with geometrically spaced channels. Decay rates are extracted from the single-exponential correlograms with both nonlinear least-squares fits and second-order cumulant fits. We make several statistical comparisons between the two fitting techniques and verify an earlier result that there is no sample-time dependence in the decay rate errors. We find, however, that the two fitting techniques give decay rates that differ by 1 percent.

Shaumeyer, J. N.↗

Sub-Shot Noise Power Source for Microelectronics

Low-current, high-impedance microelectronic devices can be affected by electric current shot noise more than they are affected by Nyquist noise, even at room temperature. An approach to implementing a sub-shot noise current source for powering such devices is based on direct conversion of amplitude-squeezed light to photocurrent. The phenomenon of optical squeezing allows for the optical measurements below the fundamental shot noise limit, which would be impossible in the domain of classical optics. This becomes possible by affecting the statistical properties of photons in an optical mode, which can be considered as a case of information encoding. Once encoded, the information describing the photon (or any other elementary excitations) statistics can be also transmitted. In fact, it is such information transduction from optics to an electronics circuit, via photoelectric effect, that has allowed the observation of the optical squeezing. It is very difficult, if not technically impossible, to directly measure the statistical distribution of optical photons except at extremely low light level. The photoelectric current, on the other hand, can be easily analyzed using RF spectrum analyzers. Once it was observed that the photocurrent noise generated by a tested light source in question is below the shot noise limit (e.g. produced by a coherent light beam), it was concluded that the light source in question possess the property of amplitude squeezing. The main novelty of this technology is to turn this well-known information transduction approach around. Instead of studying the statistical property of an optical mode by measuring the photoelectron statistics, an amplitude-squeezed light source and a high-efficiency linear photodiode are used to generate photocurrent with sub-Poissonian electron statistics. By powering microelectronic devices with this current source, their performance can be improved, especially their noise parameters. Therefore, a room-temperature sub-shot noise current source can be built that will be beneficial for a very broad range of low-power, low-noise electronic instruments and applications, both cryogenic and room-temperature. Taking advantage of recent demonstrations of the squeezed light sources based on optical micro-disks, this sub-shot noise current source can be made compatible with the size/power requirements specific of the electronic devices it will support.

Strekalov, Dmitry V.↗

Experience with the matched filtered weighted-shift-and-add method

It is presently demonstrated that while the matched filter formulated by Ribak (1986) for the extension of the weighted-shift-and-add (WSA) method successfully reduces photon statistics-dominated specklegrams, the iterative method originally proposed by Ribak does not converge in the case of photon-noisy specklegrams for objects having more than one maxima. Attention is accordingly given to methods for rendering the procedure more 'artificially intelligent'. An error matrix is defined that is useful in evaluating the validity of the results produced by the matched filter extension of the WSA method.

Hege, E. Keith↗

Solid-state Image Sensor with Focal-plane Digital Photon-counting Pixel Array

A solid-state focal-plane imaging system comprises an NxN array of high gain. low-noise unit cells. each unit cell being connected to a different one of photovoltaic detector diodes, one for each unit cell, interspersed in the array for ultra low level image detection and a plurality of digital counters coupled to the outputs of the unit cell by a multiplexer(either a separate counter for each unit cell or a row of N of counters time shared with N rows of digital counters). Each unit cell includes two self-biasing cascode amplifiers in cascade for a high charge-to-voltage conversion gain (greater than 1mV/e(-)) and an electronic switch to reset input capacitance to a reference potential in order to be able to discriminate detection of an incident photon by the photoelectron (e(-))generated in the detector diode at the input of the first cascode amplifier in order to count incident photons individually in a digital counter connected to the output of the second cascade amplifier. Reseting the input capacitance and initiating self-biasing of the amplifiers occurs every clock cycle of an integratng period to enable ultralow light level image detection by the may of photovoltaic detector diodes under such ultralow light level conditions that the photon flux will statistically provide only a single photon at a time incident on anyone detector diode during any clock cycle.

Fossum, Eric R.↗

Smart quantum statistical imaging beyond the Abbe-Rayleigh criterion

The wave nature of light imposes limits on the resolution of optical imaging systems. For over a century, the Abbe-Rayleigh criterion has been utilized to assess the spatial resolution limits of imaging instruments. Recently, there has been interest in using spatial projective measurements to enhance the resolution of imaging systems. Unfortunately, these schemes require a priori information regarding the coherence properties of “unknown” light beams and impose stringent alignment conditions. Here, we introduce a smart quantum camera for superresolving imaging that exploits the self-learning features of artificial intelligence to identify the statistical fluctuations of unknown mixtures of light sources at each pixel. This is achieved through a universal quantum model that enables the design of artificial neural networks for the identification of photon fluctuations. Our protocol overcomes limitations of existing superresolution schemes based on spatial mode projections, and consequently provides alternative methods for microscopy, remote sensing, and astronomy.

77 NANOSCIENCE AND NANOTECHNOLOGY↗

Non-Geiger-Mode Single-Photon Avalanche Detector with Low Excess Noise

This design constitutes a self-resetting (gain quenching), room-temperature operational semiconductor single-photon-sensitive detector that is sensitive to telecommunications optical wavelengths and is scalable to large areas (millimeter diameter) with high bandwidth and efficiencies. The device can detect single photons at a 1,550-nm wavelength at a gain of 1 x 10(exp 6). Unlike conventional single photon avalanche detectors (SPADs), where gain is an extremely sensitive function to the bias voltage, the multiplication gain of this device is stable at 1 x 10(exp 6) over a wide range of bias from 30.2 to 30.9 V. Here, the multiplication gain is defined as the total number of charge carriers contained in one output pulse that is triggered by the absorption of a single photon. The statistics of magnitude of output signals also shows that the device has a very narrow pulse height distribution, which demonstrates a greatly suppressed gain fluctuation. From the histograms of both pulse height and pulse charge, the equivalent gain variance (excess noise) is between 1.001 and 1.007 at a gain of 1 x 10(exp 6). With these advantages, the device holds promise to function as a PMT-like photon counter at a 1,550- nm wavelength. The epitaxial layer structure of the device allows photons to be absorbed in the InGaAs layer, generating electron/hole (e-h) pairs. Driven by an electrical field in InGaAs, electrons are collected at the anode while holes reach the multiplication region (InAlAs p-i-n structure) and trigger the avalanche process. As a result, a large number of e-h pairs are created, and the holes move toward the cathode. Holes created by the avalanche process gain large kinetic energy through the electric field, and are considered hot. These hot holes are cooled as they travel across a p -InAlAs low field region, and are eventually blocked by energy barriers formed by the InGaAsP/ InAlAs heterojunctions. The composition of the InGaAsP alloy was chosen to have an 80 meV valance band offset with InAlAs, which is high enough to hinder the transport of the already cooled holes. Being stopped by the energy barrier, holes are accumulated at the junctions to shield the electric field, resulting in a decrease of the electric field in the multiplication region. Because the impact ionization rate is extremely sensitive to the magnitude of the electric field, the field-screening effect drastically reduces the impact ionization rate and quenches the output signals. After the avalanche pulse signal is self-quenched, the accumulated holes at the InGaAsP/ InAlAs interface escape the energy barrier through thermal excitation and tunneling and finally leave the device. The device is thus reset and ready for subsequent photon detection. This recovery time is controlled by the height of the energy barrier and the hole-cooling rate.

Zhao, Kai↗

SAD phasing of XFEL data depends critically on the error model

A nonlinear least-squares method for refining a parametric expression describing the estimated errors of reflection intensities in serial crystallographic (SX) data is presented. This approach, which is similar to that used in the rotation method of crystallographic data collection at synchrotrons, propagates error estimates from photon-counting statistics to the merged data. Here, it is demonstrated that the application of this approach to SX data provides better SAD phasing ability, enabling the autobuilding of a protein structure that had previously failed to be built. Estimating the error in the merged reflection intensities requires the understanding and propagation of all of the sources of error arising from the measurements. One type of error, which is well understood, is the counting error introduced when the detector counts X-ray photons. Thus, if other types of random errors (such as readout noise) as well as uncertainties in systematic corrections (such as from X-ray attenuation) are completely understood, they can be propagated along with the counting error, as appropriate. In practice, most software packages propagate as much error as they know how to model and then include error-adjustment terms that scale the error estimates until they explain the variance among the measurements. If this is performed carefully, then during SAD phasing likelihood-based approaches can make optimal use of these error estimates, increasing the chance of a successful structure solution. In serial crystallography, SAD phasing has remained challenging, with the few examples of de novo protein structure solution each requiring many thousands of diffraction patterns. Here, the effects of different methods of treating the error estimates are estimated and it is shown that using a parametric approach that includes terms proportional to the known experimental uncertainty, the reflection intensity and the squared reflection intensity to improve the error estimates can allow SAD phasing even from weak zinc anomalous signal.

59 BASIC BIOLOGICAL SCIENCES↗

In Situ Ion Counting for Improved Implanted Ion Error Rate and Silicon Vacancy Yield Uncertainty

An in situ counted ion implantation experiment improving the error on the number of ions required to form a single optically active silicon vacancy (SiV) defect in diamond 7-fold compared to timed implantation is presented. Here, traditional timed implantation relies on a beam current measurement followed by implantation with a preset pulse duration. It is dominated by Poisson statistics, resulting in large errors for low ion numbers. Instead, our in situ detection, measuring the ion number arriving at the substrate, results in a 2-fold improvement of the error on the ion number required to generate a single SiV compared to timed implantation. Through postimplantation analysis, the error is improved 7-fold compared to timed implantation. SiVs are detected by photoluminescence spectroscopy, and the yield of 2.98% is calculated through the photoluminescence count rate. Hanbury–Brown–Twiss interferometry is performed on locations potentially hosting single-photon emitters, confirming that 82% of the locations exhibit single photon emission statistics.

77 NANOSCIENCE AND NANOTECHNOLOGY↗

High–Yield Deterministic Focused Ion Beam Implantation of Quantum Defects Enabled by In Situ Photoluminescence Feedback

Focused ion beam implantation is ideally suited for placing defect centers in wide bandgap semiconductors with nanometer spatial resolution. However, the fact that only a few percent of implanted defects can be activated to become efficient single photon emitters prevents this powerful capability to reach its full potential in photonic/electronic integration of quantum defects. Here an industry adaptive scalable technique is demonstrated to deterministically create single defects in commercial grade silicon carbide by performing repeated low ion number implantation and in situ photoluminescence evaluation after each round of implantation. An array of 9 single defects in 13 targeted locations is successfully created—a ≈70% yield which is more than an order of magnitude higher than achieved in a typical single pass ion implantation. The remaining emitters exhibit non-classical photon emission statistics corresponding to the existence of at most two emitters. This approach can be further integrated with other advanced techniques such as in situ annealing and cryogenic operations to extend to other material platforms for various quantum information technologies.

36 MATERIALS SCIENCE↗

Sensitivity of resonance properties of all-dielectric multilayers driven by statistical fluctuations

In photonics and emerging fields of quantum and topological materials, increasing demands are placed upon the state and control of electromagnetic fields. Dielectric multilayer materials may be designed and optimized to possess extremely sharp spectral and angular photonic resonances allowing for the creation of fields orders of magnitude larger than the exciting field. With enhancements of 10 4 and higher, the extreme nature of these resonances places high constraints on the statistical properties of the physical and optical characteristics of the materials. To what extent the spectral and angular shifts occur as a result of fluctuations in the refractive indices and morphologies of the involved low-loss subdomains have not been considered previously. Here, we present how parameter variations such as those caused by fluctuations in deposition rate, yielding bias, random and compensated errors, may affect the resonance properties of low-loss all-dielectric stacks.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗