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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 91 records · Page 5

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NASA NTRS1984

The Single Event Upset (SEU) response to 590 MeV protons

The presence of high-energy protons in cosmic rays, solar flares, and trapped radiation belts around Jupiter poses a threat to the Galileo project. Results of a test of 10 device types (including 1K RAM, 4-bit microP sequencer, 4-bit slice, 9-bit data register, 4-bit shift register, octal flip-flop, and 4-bit counter) exposed to 590 MeV protons at the Swiss Institute of Nuclear Research are presented to clarify the picture of SEU response to the high-energy proton environment of Jupiter. It is concluded that the data obtained should remove the concern that nuclear reaction products generated by protons external to the device can cause significant alteration in the device SEU response. The data also show only modest increases in SEU cross section as proton energies are increased up to the upper limits of energy for both the terrestrial and Jovian trapped proton belts.

Nichols, D. K.↗

NASA NTRS1987

CMOS Clock Synchronizer

Circuit synchronizes clock and gate signals within one-quarter of clock cycle. Clock synchronizer with one-quarter-cycle skew constructed from three flip-flops, three NAND gates, and inverter. In addition gate signal to which clock synchronized, circuit requires square-wave input at twice desired clock frequency.

Kepp, R. B.↗

NASA NTRS1987

FM-to-Digital Converter

Circuit includes array of low-cost multivibrators. Inexpensive circuit converts frequency-modulated (FM) signal into digital signal. Consists of zero-crossing detector and series of monostable multivibrators and D-type flip-flops. Used to control filter.

Moniuszko, Michael↗

NASA NTRS1987

Response of a metal-oxide-semiconductor field-effect transistor to a cosmic-ray ion track

A cosmic-ray ion track passing perpendicularly through the oxide layer of an enhancement-mode metal-oxide-semiconductor field-effect transistor (MOSFET) forms a conducting path, the resistance of which is proportional to the stopping power of the cosmic ion and independent of the cross-sectional area of the ion track. The voltage across the oxide capacitance may drop below the threshold voltage if the gate bias is sufficiently low or if the external resistance in the gate-source circuit is sufficiently high. The first of a pair of MOSFETs forming a flip-flop circuit may thus be turned off, and the second transitor may turn on, providing it has a sufficiently short delay time, thereby completing a single-event upset.

Benumof, Reuben↗

NASA NTRS1988

Addressable Inverter Matrix Tests Integrated-Circuit Wafer

Addressing elements indirectly through shift register reduces number of test probes. With aid of new technique, complex test structure on silicon wafer tested with relatively small number of test probes. Conserves silicon area by reduction of area devoted to pads. Allows thorough evaluation of test structure characteristics and of manufacturing process parameters. Test structure consists of shift register and matrix of inverter/transmission-gate cells connected to two-by-ten array of probe pads. Entire pattern contained in square area having only 1.6-millimeter sides. Shift register is conventional static CMOS device using inverters and transmission gates in master/slave D flip-flop configuration.

Buehler, Martin G.↗

NASA NTRS1989

SEU In An Advanced Bipolar Integrated Circuit

Report summarizes investigation of single-event upsets (SEU) in bipolar integrated-circuit set of flip-flops (memory cells). Device tested made by advanced digital bipolar silicon process of Honeywell, Inc. Circuit chip contained 4 cells. Construction enabled study of effect of size on SEU behavior. Each cell externally biased so effect of bias current on SEU behavior. Results of study provides important information for optimal design of devices fabricated using buried-layer bipolar process operating in heavy-ion SEU environments. Designers use information to provide required levels of suppression of SEU in specific applications via combinations of size and/or cell-current scaling.

Zoutendyk, John A.↗

NASA NTRS1989

The role of shock induced trailing-edge separation in limit cycle oscillations

The potential role of shock induced trailing edge separation (SITES) in limit cycle oscillations (LCO) was established. It was shown that the flip-flop characteristics of transition to and from SITES as well as its hysteresis could couple with wing modes with torsional motion and low damping. This connection led to the formulation of a very simple nonlinear math model using the linear equations of motion with a nonlinear step forcing function with hysteresis. A finite difference solution with time was developed and calculations were made for the F-111 TACT were used to determine the step forcing function due to SITES transition. Since no data were available for the hysteresis, a parameter study was conducted allowing the hysteresis effect to vary. Very small hysteresis effects, which were within expected bounds, were required to obtain reasonable response levels that essentially agreed with flight test results. Also in agreement with wind tunnel tests, LCO calculations for the 1/6 scale F-111 model showed that the model should have not experienced LCO.

Cunningham, Atlee M., Jr.↗

NASA NTRS1989

Effects of space radiation on electronic microcircuits

The single event effects or phenomena (SEP), which so far have been observed as events falling on one or another of the SE classes: Single Event Upset (SEU), Single Event Latchup (SEL) and Single Event Burnout (SEB), are examined. Single event upset is defined as a lasting, reversible change in the state of a multistable (usually bistable) electronic circuit such as a flip-flop or latch. In a computer memory, SEUs manifest themselves as unexplained bit flips. Since latchup is in general caused by a single event of short duration, the single event part of the SEL term is superfluous. Nevertheless, it is used customarily to differentiate latchup due to a single heavy charged particle striking a sensitive cell from more ordinary kinds of latchup. Single event burnout (SEB) refers usually to total instantaneous failure of a power FET when struck by a single particle, with the device shorting out the power supply. An unforeseen failure of these kinds can be catastrophic to a space mission, and the possibilities are discussed.

Kolasinski, W. A.↗

NASA NTRS1992

Integrated-Circuit Pseudorandom-Number Generator

Integrated circuit produces 8-bit pseudorandom numbers from specified probability distribution, at rate of 10 MHz. Use of Boolean logic, circuit implements pseudorandom-number-generating algorithm. Circuit includes eight 12-bit pseudorandom-number generators, outputs are uniformly distributed. 8-bit pseudorandom numbers satisfying specified nonuniform probability distribution are generated by processing uniformly distributed outputs of eight 12-bit pseudorandom-number generators through "pipeline" of D flip-flops, comparators, and memories implementing conditional probabilities on zeros and ones.

Steelman, James E.↗

NASA NTRS1992

The flip flop nozzle extended to supersonic flows

An experiment studying a fluidically oscillated rectangular jet flow was conducted. The Mach number was varied over a range from low subsonic to supersonic. Unsteady velocity and pressure measurements were made using hot wires and piezoresistive pressure transducers. In addition smoke flow visualization using high speed photography was used to document the oscillation of the jet. For the subsonic flip-flop jet it was found that the apparent time-mean widening of the jet was not accompanied by an increase in mass flux. It was found that it is possible to extend the operation of these devices to supersonic flows. Most of the measurements were made for a fixed nozzle geometry for which the oscillations ceased at a fully expanded Mach number of 1.58. By varying the nozzle geometry this limitation was overcome and operation was extended to Mach 1.8. The streamwise velocity perturbation levels produced by this device were much higher than the perturbation levels that could be produced using conventional excitation sources such as acoustic drivers. In view of this ability to produce high amplitudes, the potential for using small scale fluidically oscillated jet as an unsteady excitation source for the control of shear flows in full scale practical applications seems promising.

Raman, Ganesh↗

NASA NTRS1993

Postirradiation Effects In Integrated Circuits

Two reports discuss postirradiation effects in integrated circuits. Presents examples of postirradiation measurements of performances of integrated circuits of five different types: dual complementary metal oxide/semiconductor (CMOS) flip-flop; CMOS analog multiplier; two CMOS multiplying digital-to-analog converters; electrically erasable programmable read-only memory; and semiconductor/oxide/semiconductor octal buffer driver.

Shaw, David C.↗

NASA NTRS1992

BETA: Behavioral testability analyzer and its application to high-level test generation and synthesis for testability

In this thesis, a behavioral-level testability analysis approach is presented. This approach is based on analyzing the circuit behavioral description (similar to a C program) to estimate its testability by identifying controllable and observable circuit nodes. This information can be used by a test generator to gain better access to internal circuit nodes and to reduce its search space. The results of the testability analyzer can also be used to select test points or partial scan flip-flops in the early design phase. Based on selection criteria, a novel Synthesis for Testability approach call Test Statement Insertion (TSI) is proposed, which modifies the circuit behavioral description directly. Test Statement Insertion can also be used to modify circuit structural description to improve its testability. As a result, Synthesis for Testability methodology can be combined with an existing behavioral synthesis tool to produce more testable circuits.

Chen, Chung-Hsing↗

NASA NTRS1992

Low power SEU immune CMOS memory circuits

The authors report a design improvement for CMOS static memory circuits hardened against single event upset (SEU) using a recently proposed logic/circuit design technique. This improvement drastically reduces static power consumption, reduces the number of transistors required in a D flip-flop design, and eliminates the possibility of capturing an upset state in the slave section during a clock transition.

Liu, M. N.↗

NASA NTRS1994

Three-dimensional hydrodynamic Bondi-Hoyle accretion. 2: Homogeneous medium at Mach 3 with gamma = 5/3

We investigate the hydrodynamics of three-dimensional classical Bondi-Hoyle accretion. Totally absorbing spheres of varying sizes (from 10 down to 0.01 accretion radii) move at Mach 3 relative to a homogeneous and slightly perturbed medium, which is taken to be an ideal gas (gamma = 5/3). To accommodate the long-range gravitational forces, the extent of the computational volume is 32(exp 3) accretion radii. We examine the influence of numerical procedure on physical behavior. The hydrodynamics is modeled by the 'piecewise parabolic method.' No energy sources (nuclear burning) or sinks (radiation, conduction) are included. The resolution in the vicinity of the accretor is increased by multiply nesting several (5-10) grids around the sphere, each finer grid being a factor of 2 smaller in zone dimension that the next coarser grid. The largest dynamic range (ratio of size of the largest grid to size of the finest zone) is 16,384. This allows us to include a coarse model for the surface of the accretor (vacuum sphere) on the finest grid, while at the same time evolving the gas on the coarser grids. Initially (at time t = 0-10), a shock front is set up, a Mach cone develops, and the accretion column is observable. Eventually the flow becomes unstable, destroying axisymmetry. This happens approximately when the mass accretion rate reaches the values (+/- 10%) predicted by the Bondi-Hoyle accretion formula (factor of 2 included). However, our three-dimensional models do not show the highly dynamic flip-flop flow so prominent in two-dimensional calculations performed by other authors. The flow, and thus the accretion rate of all quantities, shows quasi-periodic (P approximately equals 5) cycles between quiescent and active states. The interpolation formula proposed in an accompanying paper is found to follow the collected numerical data to within approximately 30%. The specific angular momentum accreted is of the same order of magnitude as the values previously found for two-dimensional flows.

Ruffert, Maximilian↗

NASA NTRS1997

On the Dramatic Spin-up/Spin-Down Torque Reversals in Accreting Pulsars

Dramatic torque reversals between spin-up and spin-down have been observed in half of the persistent X-ray pulsars monitored by the Burst and Transient Space Experiment (BATSE) all-sky monitor on the Compton Gamma Ray Observatory. Theoretical models developed to explain early pulsar timing data can explain spin-down torques via a disk-magnetosphere interaction if the star nearly corotates with the inner accretion disk. To produce the observed BATSE torque reversals, however, these equilibrium models require the disk to alternate between two mass accretion rates, with M+/- producing accretion torques of similar magnitude but always of opposite sign. Moreover, in at least one pulsar (GX 1+4) undergoing secular spin-down, the neutron star spins down faster during brief (approximately 20 day) hard X-ray flares-this is opposite the correlation expected from standard theory, assuming that BATSE pulsed flux increases with mass accretion rate. The 10 day to 10 yr intervals between torque reversals in these systems are much longer than any characteristic magnetic or viscous timescale near the inner disk boundary and are more suggestive of a global disk phenomenon. We discuss possible explanations of the observed torque behavior. Despite the preferred sense of rotation defined by the binary orbit, the BATSE observations are surprisingly consistent with an earlier suggestion for GX 1+4: the disks in these systems somehow alternate between episodes of prograde and retrograde rotation. We are unaware of any mechanism that could produce a stable retrograde disk in a binary undergoing Roche lobe overflow, but such flip-flop behavior does occur in numerical simulations of wind-fed systems. One possibility is that the disks in some of these binaries are fed by an X-ray-excited wind.

Nelson, Robert W.↗

NASA NTRS1998

Summary of Proton Test on the Quick Logic QL3025 at Indiana University

This issue of the Programmable Logic Application Notes is a compilation of topics: (1) Proton irradiation tests were performed on the Quick Logic QL3025 at the Indian University Cyclotron facility. The devices, tests, and results are discussed; (2) The functional failure of EEPROM's in heavy ion environment is presented; (3) the Act 1 architecture is summarized; (4) Antifuse hardness and hardness testing is updated; the single even upset (SEU) response of hardwired flip-flops is also presented; (4) Total dose results of the ACT 2 and ACT 3 circuits is presented in a chart; (5) Recent sub-micron devices testing of total dose is presented in a chart along with brief discussion; and (6) a reference to the WWW site for more articles of interest.

Katz, Richard↗

NASA NTRS1998

Summary of Proton Test on the Actel A1280A at Indiana University

A summary of tests performed at the Indiana University Cycl,oltron Facility, on the Actel A1280A circuit device is described. The intent of the study was to investigate the proton response of the hard-wired S-Module flip-flops with a large sample size. This device is sensitive to protons for S-Modules. The device's performance in the test is shown in graphs, and was typical for devices of this class.

Katz, Richard↗

DOE OSTI2026

Surrogate Neural Architecture Codesign Package (SNAC-Pack)

Neural architecture search (NAS) is a powerful approach for automating model design, but existing methods often optimize for accuracy alone or rely on proxy metrics such as bit operations (BOPs) that correlate poorly with hardware cost. This gap is particularly large for FPGA deployment, where cost is dominated by a multi-dimensional budget of lookup tables, DSPs, flip-flops, BRAM, and latency. We present the Surrogate Neural Architecture Codesign Package (SNAC-Pack), an open-source AutoML framework for hardware-aware neural architecture codesign and end-to-end FPGA deployment. SNAC-Pack runs a multi-objective global search with Optuna and NSGA-II, loading trials to a shared SQLite store that enables parallel workers across compute nodes. A hardware surrogate model outputs per-trial resource and latency estimates, avoiding the synthesis cost that would otherwise dominate the search loop. A local search stage then applies quantization-aware training (QAT) together with iterative magnitude pruning in a combined compression loop, after which the final model is synthesized to FPGA firmware via the hls4ml Python library. A YAML configuration and an optional agentic frontend let users run the pipeline on new datasets without modifying the framework. We demonstrate SNAC-Pack on jet classification at the Large Hadron Collider and superconducting qubit readout, discovering compact architectures that match or exceed strong baselines on the task metric while reducing FPGA resource utilization and, in the qubit readout case, reducing the design space exploration process from months of manual fine-tuning to hours of automated search.

Weitz, Jason [UC, San Diego]↗