NASA NTRS · 19930000479
Postirradiation Effects In Integrated Circuits
Abstract
Two reports discuss postirradiation effects in integrated circuits. Presents examples of postirradiation measurements of performances of integrated circuits of five different types: dual complementary metal oxide/semiconductor (CMOS) flip-flop; CMOS analog multiplier; two CMOS multiplying digital-to-analog converters; electrically erasable programmable read-only memory; and semiconductor/oxide/semiconductor octal buffer driver.
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Shaw, David C., Barnes, Charles E.. 1993-08-01. Postirradiation Effects In Integrated Circuits. https://ntrs.nasa.gov/citations/19930000479
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