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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 73 records · Page 4
All sourcesNASA NTRSDOE OSTI
NASA NTRS1998

High-Temperature Slow Crack Growth of Silicon Carbide Determined by Constant-Stress-Rate and Constant-Stress Testing

High-temperature slow-crack-growth behaviour of hot-pressed silicon carbide was determined using both constant-stress-rate ("dynamic fatigue") and constant-stress ("static fatigue") testing in flexure at 1300 C in air. Slow crack growth was found to be a governing mechanism associated with failure of the material. Four estimation methods such as the individual data, the Weibull median, the arithmetic mean and the median deviation methods were used to determine the slow crack growth parameters. The four estimation methods were in good agreement for the constant-stress-rate testing with a small variation in the slow-crack-growth parameter, n, ranging from 28 to 36. By contrast, the variation in n between the four estimation methods was significant in the constant-stress testing with a somewhat wide range of n= 16 to 32.

Choi, Sung H.↗
DOE OSTI2021

UV-Fluorescence Imaging of Silicon PV Modules After Outdoor Aging and Accelerated Stress Testing

Fast, non-destructive, outdoor-compatible methods for photovoltaic module characterization are essential for monitoring module quality without disrupting energy production. UV-fluorescence (UVF) imaging of the encapsulant layer can be used for crack detection in the field. We show that UVF patterns vary widely between modules and types of applied stress. We propose that combining accelerated stress testing (e.g. thermal cycling and damp heat) with field investigations can help build understanding of different types of UVF, which are formed and subsequently quenched at varying rates. Ultimately, such understanding could enable estimating when cracks were formed.

41 EE - Solar Energy Technologies Office (EE-4S)↗
DOE OSTI2024

Photovoltaic Cable Jackets: A Comparison of Representative Products Using Combined-Accelerated Stress Testing [Slides]

Photovoltaic (PV) cables facilitate the distribution of electricity collected from modules to the energy grid. Durable cabling enables continuous operation of PV installations, whereas cables with a lifetime less than the modules must be replaced - reducing electricity generation and adding to the operating expense. This study primarily focusses on the aging of the key cable types using the combined-accelerated stress testing (C-AST) protocol. Representative cables for utility, building, and control/auxiliary applications were examined. Cable jacket materials examined include: polyolefin, polyethylene, polyamide, poly(vinyl chloride), chlorinated polyethylene, thermoplastic elastomer, and ethylene propylene diene monomer rubber. Specimen characterizations applied include: optical microscopy, mechanical profilometry, instrumented indentation, scanning electron microscopy (SEM), energy-dispersive X-ray spectroscopy (EDS), Fourier-transform infrared spectroscopy (FTIR), thermogravimetric analysis (TGA), and differential scanning calorimetry (DSC). A variety of performance and durability characteristics were observed, depending on the base material, polymer formulation, and jacket color. The results from C-AST are analyzed and discussed relative to a recent industry survey on electronic balance of system components in addition to a recent study where similar cables were aged using steady state ultraviolet weathering (International Electrotechnical Commission Technical Specification 62788-7-2). Recommendations are made for the screening, industry qualification, and service life prediction of PV cable jackets.

24 POWER TRANSMISSION AND DISTRIBUTION↗
DOE OSTI2023

Accelerated Aging of PV Cables - The Development of Methods Towards Combined-Accelerated Stress Testing

PV cables allow the collection and distribution of electricity from modules to the energy grid. Durable cabling allows continuous operation of PV installations. Cables with a life less than that of the modules must be replaced - reducing electricity generation and adding to the system operating expense. We have examined the durability of a variety of representative cable samples using artificial UV weathering (IEC TS 62788-7-2) and combined accelerated stress testing (C-AST). Jackets in this study include PV-rated (polyolefin), building wire (PVC/PA), and multi-conductor (rubber, as in PV trackers), with some examples of black and red cables. Characterizations at read points include appearance (camera and optical microscope), surface roughness (linear profilometry), instrumented indentation, surface morphology (SEM), chemical composition (EDS), thermal decomposition (TGA), phase transition (DSC), crystalline structure (WAXS), and polymer chemical structure (FTIR). Complimentary examinations confirm damage to the external and interior layer(s) of less durable samples, including changes in morphology (e.g., cracking), chemistry (e.g., oxidation), structure, and mechanical performance (e.g., through-thickness modulus and hardness). The results may be generally compared to other examples from the field (PV installations) or after accelerated testing (IEC 61215). The methods in this study are presently being applied in a follow-on C-AST study, incorporating both dynamic and kinematic fixtures.

balance of systems↗
NASA NTRSDate not supplied

Adaptive Stress Testing of Collision Avoidance Systems for Small UASs with Deep Reinforcement Learning

The next-generation Airborne Collision Avoidance System for smaller UASs (ACAS sXu) is currently being developed and tested by the Federal Aviation Administration (FAA) to provide detect-and-avoid capability for small unmanned aircraft operating beyond line-of-sight. Due to the complexity and safety-critical nature of the system, safety validation is important not only for the certification of the final system, but also for informing changes during the iterative development process. In this paper, we analyze a prototype of ACAS sXu in simulated aircraft encounters to discover scenarios of small near mid-air collisions (sNMACs), an important safety event in which two aircraft come closer than 50 feet horizontally and 15 feet vertically. Due to the size and complexity of the system as well as rarity of sNMAC events, traditional methods such as Monte Carlo testing often require informed setup and targeting to elicit failures. However, such a dependence on domain knowledge can be incompatible with the independent verification and validation (IV&V) process, the aim of which is to discover unforeseen issues. To address these challenges, we apply an accelerated validation method called adaptive stress testing (AST) to find the most likely sNMAC scenarios without reliance on system introspection. AST uses reinforcement learning to adapt the search towards the most promising areas of the search space as it progresses. We use a state-of-the-art deep reinforcement learning algorithm, proximate policy optimization, to more efficiently search the large and continuous state space. We find that this approach significantly improves the performance of AST compared to a prior approach based on Monte Carlo tree search. We perform experiments using AST to find sNMAC events under various encounter configurations, varying parameters pertaining to dynamics and coordination. Our experiments show AST to be very effective at finding sNMAC scenarios. We summarize our findings, presenting high-level categories of discovered sNMACs and specific examples of encounters in each category.

aircraft collision avoidance↗
DOE OSTI2022

Evaluating the Durability of Balance of Systems Components Using Combined-Accelerated Stress Testing

The degradation of photovoltaic (PV) balance of systems (BoS) components is not well-studied, but the consequences include: offline-modules, -strings, -inverters; system shutdown; arc-faults; and fires. A utility provider experienced a ~30% failure rate in their power transfer chain, attributed to branch connectors. Field-failed specimen assemblies were therefore examined, consisting of cable connector, branch connector and discrete fuse components. Unused field-vintage specimens are presently being examined using combined-accelerated stress testing (C-AST) to clarify the most influential environmental stressors as well as the effect of external mechanical perturbation. A benchtop prototype fixture was used to develop the perturbation capability for C-AST. The benchtop experiments were also used to develop the in-situ data acquisition of specimen: current, voltage, and temperature. A significant increase in operating temperature, ~100 deg C from ~40 deg C, and a different failure mode was observed immediately once periodic mechanical perturbation was applied. The current at failure was decreased from 35 A (with failure occurring in the fuses) to 15 A (failure at the male/female metal pin connection). After initial examination using X-ray computed tomography, the external plastic was machined away from failed specimens to allow failure analysis, including the extraction of the internal convolute springs for morphological examination (optical- and electron-microscopy). Chemical composition analysis included: energy-dispersive X-ray spectroscopy, differential scanning calorimetry, and Fourier transform infrared spectroscopy.

balance of systems↗
DOE OSTI2022

Evaluating the Durability of Balance of Systems Components Using Combined-Accelerated Stress Testing

The degradation of photovoltaic (PV) balance of systems (BoS) components is not well-studied, but the consequences include offline modules, strings, and inverters; system shutdown; arc faults; and fires. A utility provider experienced a ~30% failure rate in their power transfer chain, originally attributed to branch connectors. Field-failed specimen assemblies were therefore examined, consisting of cable connector, branch connector, and discrete fuse components. In this study, unused field-vintage specimens are examined using combined-accelerated stress testing (C-AST) to clarify the most influential environmental stressors as well as the effect of external mechanical perturbation. A benchtop prototype fixture was used to develop the perturbation capability for the C-AST chamber. The benchtop experiments were also used to develop the in-situ data acquisition of specimen current, voltage, and temperature. A significant increase in operating temperature (~100 degrees C from ~40 degrees C) and a different failure mode were observed promptly once periodic mechanical perturbation was applied. The current at failure was decreased from 35 A (with failure in the fuses) to 15 A (failure at the male/female metal pin connection). After initial examination using X-ray computed tomography, the external plastic was machined away from failed specimens to allow for failure analysis, including the extraction of the internal convolute springs for morphological examination (optical and electron microscopy).

balance of systems↗
DOE OSTI2022

Evaluating the Durability of Balance of Systems Components Using Combined-Accelerated Stress Testing: Preprint

The degradation of photovoltaic (PV) balance of systems (BoS) components is not well-studied, but the consequences include: offline-modules, -strings, -inverters; system shutdown; arc-faults; and fires. A utility provider experienced a ~30% failure rate in their power transfer chain, originally attributed to branch connectors. Field-failed specimen assemblies were therefore examined, consisting of cable connector, branch connector, and discrete fuse components. Unused field-vintage specimens are presently being examined using combined-accelerated stress testing (C-AST) to clarify the most influential environmental stressors as well as the effect of external mechanical perturbation. A benchtop prototype fixture was used to develop the perturbation capability for the C-AST chamber. The benchtop experiments were also used to develop the in-situ data acquisition of specimen: current, voltage, and temperature. A significant increase in operating temperature, ~100 deg C from ~40 deg C, and a different failure mode was observed promptly once periodic mechanical perturbation was applied. The current at failure was decreased from 35 A (with failure in the fuses) to 15 A (failure at the male/female metal pin connection). After initial examination using X-ray computed tomography, the external plastic was machined away from failed specimens to allow failure analysis, including the extraction of the internal convolute springs for morphological examination (optical- and electron-microscopy).

balance of systems↗
NASA NTRS2015

Adaptive Stress Testing of Airborne Collision Avoidance Systems

This paper presents a scalable method to efficiently search for the most likely state trajectory leading to an event given only a simulator of a system. Our approach uses a reinforcement learning formulation and solves it using Monte Carlo Tree Search (MCTS). The approach places very few requirements on the underlying system, requiring only that the simulator provide some basic controls, the ability to evaluate certain conditions, and a mechanism to control the stochasticity in the system. Access to the system state is not required, allowing the method to support systems with hidden state. The method is applied to stress test a prototype aircraft collision avoidance system to identify trajectories that are likely to lead to near mid-air collisions. We present results for both single and multi-threat encounters and discuss their relevance. Compared with direct Monte Carlo search, this MCTS method performs significantly better both in finding events and in maximizing their likelihood.

Verification and Validation↗
NASA NTRS1979

Transister step stress testing program for JANTX2N3811

The effect was studied of power/temperature step stress when applied to the dual transistor JANTX2N3811 manufactured by Motorola and National Semiconductor. A total of 48 samples from Motorola and 47 from National Semiconductor was submitted to the processes. In addition, two control sample units were maintained for verification of the electrical parametric testing. The tests for determining power/temperature stresses are described, and test results are discussed. Failure analyses for power stress, and temperature stress are presented.

Source record↗
NASA NTRS1979

Transistor step stress testing program for JANTX2N2905A

The effect of power/temperature step stress when applied to the transistor JANTX2N2905A manufactured by Texas Instruments and Motorola is reported. A total of 48 samples from each manufacturer was submitted to the process outlined. In addition, two control sample units were maintained for verification of the electrical parametric testing. All test samples were subjected to the electrical tests outlined in Table 2 after completing the prior power/temperature step stress point.

Source record↗
NASA NTRS1979

Diode step stress testing program for JANTX1N759A

The effect of power/temperature step stress when applied to a variety of voltage regulating diodes manufactured by Texas Instruments and Siemens was investigated. Test requirements are described and results are tabulated. Failure modes are discussed.

Source record↗
DOE OSTI2020

Behavior of Na and RbF-Treated CdS/Cu(In,Ga)Se 2 Solar Cells with Stress Testing under Heat, Light, and Junction Bias

In this work, the effects of Na and RbF alkali treatment on the metastability behavior of CdS/Cu(In,Ga)Se 2 solar cells are investigated with stress factors of heat, junction bias, and illumination. Four device types with and without Na or RbF treatments are subjected to heat- and light-soaking under open- and short-circuit (OC, SC) junction bias. Low-Na devices show a higher bandgap due to increased minimum Ga content, higher recombination current, and lower open-circuit voltage (V OC ). Devices with RbF post-deposition treatment (PDT) show an improvement in net doping density ≈10 16 cm –3 , V OC , and efficiency. Heat- and light-soaking under OC junction bias provokes an increase in net carrier concentration and V OC irrespective of the alkali treatments. After SC stress, a decrease in V OC and net carrier concentration is observed, which can be stabilized by RbF-PDT. An increase in Na and oxygen concentration in CIGS is observed for baseline and low-Na devices, respectively, after OC stress. The oxygen concentration in CdS decreases after heat- and light-soaking for devices without RbF-PDT, whereas it remains unchanged for devices with RbF-PDT. The atomic concentration profiles in CIGS significantly stabilize as a function of stress with the addition of RbF-PDT.

14 SOLAR ENERGY↗
NASA NTRS1979

Diode step stress testing program for JANTX1N3031B

The effect of power/temperature step stress when applied to the zener diode JANTX1N3031B manufactured by Siemens and Motorola is reported. A total of 48 samples from each manufacturer was submitted to the process. In addition, two control sample units were maintained for verification of the electrical parametric testing.

Source record↗
NASA NTRS1979

Transistor step stress testing program for JANTX2N4856

The effect of power/temperature step stress when applied to a field effect transistor JANTX2N4856 manufactured by Texas Instruments and Teledyne was evaluated. A total of 48 samples from each manufacturer was submitted to the process. In addition, two control units were maintained for verification of the electrical parametric testing.

Source record↗
NASA NTRS1979

Diode step stress testing program for JANTX1N2989B

The effect of power/temperature step stress when applied to the zener diode JANTX2N2989 manufactured by Siemens and General Semiconductor is reported. A total of 48 samples from each manufacturer was submitted to the process. In addition, two control sample units were maintained for verification of the electrical parameteric testing.

Source record↗
NASA NTRS1979

Diode step stress testing program for JANTX1N5618

The effect of power/temperature step stress when applied to the switching diode JANTX1N5618 manufactured by Semtech and Micro Semiconductor is reported. A total of 48 samples from each manufacturer was submitted to the process. In addition, two control sample units were maintained for verification of the electrical parametric testing.

Source record↗