Microwave holography of large reflector antennas - Simulation algorithms
The performance of large reflector antennas can be improved by identifying the location and amount of their surface distortions and correcting them. To determine the accuracy of the constructed surface profiles, simulation studies are used to incorporate both the effects of systematic and random distortions, particularly the effects of the displaced surface panels. In this paper, different simulation models are investigated, emphasizing a model based on the vector diffraction analysis of a curved reflector with displaced panels. The simulated far-field patterns are then used to reconstruct the location and amount of displacement of the surface panels by employing a fast Fourier transform/iterative procedure. The sensitivity of the microwave holography technique based on the number of far-field sampled points, level of distortions, polarizations, illumination tapers, etc., is also examined.