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NASA NTRS ยท 19800018182

Rapid data comparison technique development for N-ray/X-ray analysis

Abstract

An operational N-ray/X-ray computer analysis system for nondestructive testing problems was realized by developing: (1) more efficient data transfer routines for use in existing image processing systems; (2) the capability to store and analyze multiple N-ray/X-ray images; (3) an efficient 2-D Fast Fourier Transform; and (4) transfer functions compensation capability to correct for distortions and nonlinearities of N-rays/X-rays. Applications of the technique are summarized for the following: thermal protection system tile with hydraulic fluid; thermal protection system tile with corrosion; thermal protection system tile debonding; stainless steel tubing corrosion; defective electrical devices; fast film restoration and deblur; corrosion tracking over time; reduction of source vignetting, and identification of materials (0 rings, Teflon parts, soft goods) via table look up.

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BibTeXRIS

Butterfield, R. L.. 1979-10-01. Rapid data comparison technique development for N-ray/X-ray analysis. https://ntrs.nasa.gov/citations/19800018182

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