Physics Flash February 2014
This is the February 2014 edition of the LANL, Physics Flash newsletter.
70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗
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Physics Flash March 2016
This is the March 2016, Physics Flash newsletter, which presents work performed by the LANL physics division.
99 GENERAL AND MISCELLANEOUS↗
Physics Flash May 2016
This is the May 2016 edition of the LANL Physics Flash newsletter.
99 GENERAL AND MISCELLANEOUS↗
Physics Flash August 2016
Physics Flash is the newsletter for the Physics Division at Los Alamos National Laboratory. This newsletter is for August 2016. The following topics are covered: "Accomplishments in the Trident Laser Facility", "David Meyerhofer elected as chair-elect APS Nominating Committee", "HAWC searches for gamma rays from dark matter", "Proton Radiography Facility commissions electromagnetic magnifier", and "Cosmic ray muon computed tomography of spent nuclear fuel in dry storage casks."
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
Physics Flash December 2016
This is the December 2016 issue of Physics Flash, the newsletter of the Physics Division of Los Alamos National Laboratory (LANL). In this issue, the following topics are covered: Novel liquid helium technique to aid highly sensitive search for a neutron electrical dipole moment; Silverleaf: Prototype Red Sage experiments performed at Q-site; John L. Kline named 2016 APS Fellow; Physics students in the news; First Entropy Engine quantum random number generator hits the market; and celebrating service.
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
Physics Flash July 2017
This is the July 2017 edition of the LANL Physics Flash newsletter.
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
Physics Flash (June 2019)
June 2019 issue of LANL Physics Flash newsletter.
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
DC Arc-Flash Safety for 1,500VDC: Methodology, Verification, and Codifying
This project aimed to address critical gaps in understanding arc flash phenomena in commercially operating photovoltaic (PV) plants. Motivated by the global growth of PV systems and the associated safety risks, the research sought to enhance knowledge, improve incident energy prediction models, and contribute to the overall safety and reliability of PV installations.
14 SOLAR ENERGY↗
Energy Consumption and CO 2 Emissions in Ironmaking and Development of a Novel Flash Technology
The issues of energy consumption and CO 2 emissions of major ironmaking processes, including several new technologies, are assessed. These two issues are interconnected in that the production and use of fuels to generate energy add to the total amount of CO 2 emissions and the efforts to sequester or convert CO 2 require energy. The amounts of emissions and energy consumption in alternate ironmaking processes are compared with those for the blast furnace, currently the dominant ironmaking process. Although more than 90% of iron production is currently through the blast furnace, intense efforts are devoted to developing alternative technologies. Recent developments in alternate ironmaking processes, which are largely driven by the needs to decrease CO 2 emissions and energy consumption, are discussed in this article. This discussion will include the description of the recently developed novel flash ironmaking technology. This technology bypasses the cokemaking and pelletization/sintering steps, which are pollution prone and energy intensive, by using iron ore concentrate. This transformational technology renders large energy saving and decreased CO 2 emissions compared with the blast furnace process. Economic analysis indicated that this new technology, when operated using natural gas, would be economically feasible. As a related topic, we will also discuss different methods for computing process energy and total energy requirements in ironmaking.
36 MATERIALS SCIENCE↗
ENHANCED ULTRAVIOLET OUTPUT FROM DOUBLE-PULSED FLASH LAMPS
Spectral output from xenon flash lamps
XENON LIGHT↗
The flashing behavior of thunderstorms
Lightning flash distribution in thunderstorms - statistical analysis
LIGHTNING↗
Inadvertently programmed bits in Samsung 128 Mbit flash devices: a flaky investigation
JPL's X2000 avionics design pioneers new territory by specifying a non-volatile memory (NVM) board based on flash memories. The Samsung 128Mb device chosen was found to demonstrate bit errors (mostly program disturbs) and block-erase failures that increase with cycling. Low temperature, certain pseudo- random patterns, and, probably, higher bias increase the observable bit errors. An experiment was conducted to determine the wearout dependence of the bit errors to 100k cycles at cold temperature using flight-lot devices (some pre-irradiated). The results show an exponential growth rate, a wide part-to-part variation, and some annealing behavior.
flash memory program disturb wearout erase fail re↗
Total Ionizing Dose Effects in Flash Memories
This paper presents the results of measurements performed on two different flash memory types, NOR and NAND technologies.
NOR NAND flash memory structures degradation charg↗
TID, SEE and radiation induced failures in advanced flash memories
We report on TID and SEE tests of multi-level and higher density flash memories. Stand-by currents and functionality tests were used to characterize the respons of radiation-induced failures.
SEE↗
The Mars Rover Spirit FLASH anomaly
The Mars Exploration Rover 'Spirit' suffered a debilitating anomaly that prevented communication with Earth for several anxious days. With the eyes of the world upon us, the anomaly team used each scrap of information, our knowledge of the system, and sheer determination to analyze and fix the problem, then return the vehicle to normal operation. This paper will discuss the Spirit FLASH anomaly, including the drama of the investigation, the root cause and the lessons learned from the experience.
Spirit Rover↗
Radiation Tests on 2Gb NAND Flash Memories
We report on SEE and TID tests of highly scaled Samsung 2Gbits flash memories. Both in-situ and biased interval irradiations were used to characterize the response of the total accumulated dose failures. The radiation-induced failures can be categorized as followings: single event upset (SEU) read errors in biased and unbiased modes, write errors, and single-event-functional-interrupt (SEFI) failures.
NAND circuits↗
Flash Lidar Performance Testing: Configuration and Results
Lidar-based hazard detection and avoidance will enable safe landing in scientifically interesting terrain with higher hazard abundance. ASC GoldenEye flash lidar was tested at JPL as part of EDL technology development for Mars 2018
Lidar noise parameters↗
Heavy Ion Irradiation Fluence Dependence for Single-Event Upsets of NAND Flash Memory
We investigated the single-event effect (SEE) susceptibility of the Micron 16 nm NAND flash, and found the single-event upset (SEU) cross section varied inversely with fluence. The SEU cross section decreased with increasing fluence. We attribute the effect to the variable upset sensitivities of the memory cells. The current test standards and procedures assume that SEU follow a Poisson process and do not take into account the variability in the error rate with fluence. Therefore, heavy ion irradiation of devices with variable upset sensitivity distribution using typical fluence levels may underestimate the cross section and on-orbit event rate.
Single Event Effects (SEE)↗