NASA NTRS · 20060041426
Total Ionizing Dose Effects in Flash Memories
Abstract
This paper presents the results of measurements performed on two different flash memory types, NOR and NAND technologies.
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Nguyen, D., Lee, C., Johnston, A.. 1998-07-20. Total Ionizing Dose Effects in Flash Memories. https://ntrs.nasa.gov/citations/20060041426
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