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At least 37 records · Page 2

KIPSE1: A Knowledge-based Interactive Problem Solving Environment for data estimation and pattern classification

A knowledge-based interactive problem solving environment called KIPSE1 is presented. The KIPSE1 is a system built on a commercial expert system shell, the KEE system. This environment gives user capability to carry out exploratory data analysis and pattern classification tasks. A good solution often consists of a sequence of steps with a set of methods used at each step. In KIPSE1, solution is represented in the form of a decision tree and each node of the solution tree represents a partial solution to the problem. Many methodologies are provided at each node to the user such that the user can interactively select the method and data sets to test and subsequently examine the results. Otherwise, users are allowed to make decisions at various stages of problem solving to subdivide the problem into smaller subproblems such that a large problem can be handled and a better solution can be found.

Han, Chia Yung↗

General method of pattern classification using the two-domain theory

Human beings judge patterns (such as images) by complex mental processes, some of which may not be known, while computing machines extract features. By representing the human judgements with simple measurements and reducing them and the machine extracted features to a common metric space and fitting them by regression, the judgements of human experts rendered on a sample of patterns may be imposed on a pattern population to provide automatic classification.

Rorvig, Mark E.↗

General method of pattern classification using the two-domain theory

Human beings judge patterns (such as images) by complex mental processes, some of which may not be known, while computing machines extract features. By representing the human judgements with simple measurements and reducing them and the machine extracted features to a common metric space and fitting them by regression, the judgements of human experts rendered on a sample of patterns may be imposed on a pattern population to provide automatic classification.

Rorvig, Mark E.↗

Linear and Order Statistics Combiners for Pattern Classification

Several researchers have experimentally shown that substantial improvements can be obtained in difficult pattern recognition problems by combining or integrating the outputs of multiple classifiers. This chapter provides an analytical framework to quantify the improvements in classification results due to combining. The results apply to both linear combiners and order statistics combiners. We first show that to a first order approximation, the error rate obtained over and above the Bayes error rate, is directly proportional to the variance of the actual decision boundaries around the Bayes optimum boundary. Combining classifiers in output space reduces this variance, and hence reduces the 'added' error. If N unbiased classifiers are combined by simple averaging. the added error rate can be reduced by a factor of N if the individual errors in approximating the decision boundaries are uncorrelated. Expressions are then derived for linear combiners which are biased or correlated, and the effect of output correlations on ensemble performance is quantified. For order statistics based non-linear combiners, we derive expressions that indicate how much the median, the maximum and in general the i-th order statistic can improve classifier performance. The analysis presented here facilitates the understanding of the relationships among error rates, classifier boundary distributions, and combining in output space. Experimental results on several public domain data sets are provided to illustrate the benefits of combining and to support the analytical results.

Tumer, Kagan↗

Pattern classification using charge transfer devices

The feasibility of using charge transfer devices in the classification of multispectral imagery was investigated by evaluating particular devices to determine their suitability in matrix multiplication subsystem of a pattern classifier and by designing a protype of such a system. Particular attention was given to analog-analog correlator devices which consist of two tapped delay lines, chip multipliers, and a summed output. The design for the classifier and a printed circuit layout for the analog boards were completed and the boards were fabricated. A test j:g for the board was built and checkout was begun.

Source record↗

Nearest Neighbor Algorithms for Pattern Classification

A solution of the discrimination problem is considered by means of the minimum distance classifier, commonly referred to as the nearest neighbor (NN) rule. The NN rule is nonparametric, or distribution free, in the sense that it does not depend on any assumptions about the underlying statistics for its application. The k-NN rule is a procedure that assigns an observation vector z to a category F if most of the k nearby observations x sub i are elements of F. The condensed nearest neighbor (CNN) rule may be used to reduce the size of the training set required categorize The Bayes risk serves merely as a reference-the limit of excellence beyond which it is not possible to go. The NN rule is bounded below by the Bayes risk and above by twice the Bayes risk.

Barrios, J. O.↗

Structured estimation - Sample size reduction for adaptive pattern classification

The Gaussian two-category classification problem with known category mean value vectors and identical but unknown category covariance matrices is considered. The weight vector depends on the unknown common covariance matrix, so the procedure is to estimate the covariance matrix in order to obtain an estimate of the optimum weight vector. The measure of performance for the adapted classifier is the output signal-to-interference noise ratio (SIR). A simple approximation for the expected SIR is gained by using the general sample covariance matrix estimator; this performance is both signal and true covariance matrix independent. An approximation is also found for the expected SIR obtained by using a Toeplitz form covariance matrix estimator; this performance is found to be dependent on both the signal and the true covariance matrix.

Morgera, S.↗

Programmable charge-coupled device /CCD/ correlator for pattern classification

The potential use of charge coupled device (CCD) programmable digital/analog correlators for multispectral data classification is discussed. CCD digital/analog correlator technology and the experimental evaluation of a 32-stage 4-bit test device are presented. The design of an IC for use in a multispectral classification system for 16 sensors and 8 bit accuracy is reviewed.

Mayer, D. J.↗

On a production system using default reasoning for pattern classification

This paper addresses an unconventional application of a production system to a problem involving belief specialization. The production system reduces a large quantity of low-level descriptions into just a few higher-level descriptions that encompass the problem space in a more tractable fashion. This classification process utilizes a set of descriptions generated by combining the component hierarchy of a physical system with the semantics of the terminology employed in its operation. The paper describes an application of this process in a program, constructed in C and CLIPS, that classifies signatures of electromechanical system configurations. The program compares two independent classifications, describing the actual and expected system configurations, in order to generate a set of contradictions between the two.

Barry, Matthew R.↗

Pattern recognition principles

The present work gives an account of basic principles and available techniques for the analysis and design of pattern processing and recognition systems. Areas covered include decision functions, pattern classification by distance functions, pattern classification by likelihood functions, the perceptron and the potential function approaches to trainable pattern classifiers, statistical approach to trainable classifiers, pattern preprocessing and feature selection, and syntactic pattern recognition.

Tou, J. T.↗

Resilience Design Patterns: A Structured Approach to Resilience at Extreme Scale (V.2.0)

Reliability is a serious concern for future extreme-scale high-performance computing (HPC) systems. Projections based on the current generation of HPC systems and technology roadmaps suggest the prevalence of very high fault rates in future systems. The errors resulting from these faults will propagate and generate various kinds of failures, which may result in outcomes ranging from result corruptions to catastrophic application crashes. Therefore, the resilience challenge for extreme-scale HPC systems requires coordination between various hardware and software technologies that are capable of handling a broad set of fault models at accelerated fault rates. Also, due to practical limits on power consumption in future HPC systems, they are likely to embrace innovative architectures, increasing the levels of hardware and software complexities. Therefore, the techniques that seek to improve resilience must navigate the complex trade-off space between resilience and the overheads to power consumption and performance. While the HPC community has developed various resilience solutions, application-level techniques as well as system-based solutions, the solution space of HPC resilience techniques remains fragmented. There are no formal methods to integrate the various HPC resilience techniques into composite solutions, nor are there methods to holistically evaluate the adequacy and efficacy of such solutions in terms of their protection coverage, and their performance & power efficiency characteristics. Additionally, few implementations of current resilience solutions are portable to newer architectures and software environments that will be deployed on future systems. We developed a new structured approach to the management of HPC resilience using the concept of resilience-based design patterns. In general, a design pattern is a repeatable solution to a commonly occurring problem. We identified the well-known solutions that are commonly used to deal with faults, errors and failures in HPC systems. In the initial design patterns specification (version 1.0), we described the various solutions, which address specific problems in the design of resilient HPC environments, in the form of patterns. Each pattern describes a problem caused by a fault, error or failure event in an HPC environment, and then describes the core of the solution of the problem in such a way that this solution may be adapted to different systems and implemented at different layers of the system stack. The catalog of these resilience design patterns provides designers with a collection of design elements. To construct complete resilience solutions using combinations of various patterns, we defined a framework that enhances HPC designers' understanding of the important constraints and the opportunities for the design patterns to be implemented and deployed at various layers of the system stack. The design framework is also useful for establishing interfaces and mechanisms to coordinate flexible fault management across hardware and software components, as well as to consider the trade-off between performance, resilience, and power consumption when constructing a solution. The resilience design patterns specification version 1.1 included more detailed explanations of the pattern solutions, the context in which the patterns are applicable, and the implications for hardware or software design. It also provided several additional examples and detailed case studies to demonstrate the use of patterns to build realistic solutions. In version 1.2 of the specification document, we have improved the pattern descriptions, including graphical representations of the pattern components. These improvements are largely based on critical comments, feedback and suggestions received from pattern experts and readers of the previous versions of the specification. The pattern classification has been modified to further clarify the relationships between pattern categories. This version of the specification also introduces a pattern language for resilience design patterns. The pattern language presents the patterns in the catalog as a network, revealing the relations among the resilience patterns. The language provides designers with the means to explore alternative techniques for handling a specific fault model that may have different efficiency and complexity characteristics. Using the pattern language also enables the design and implementation of comprehensive resilience solutions as a set of interconnected resilience patterns that can be instantiated across layers of the system stack. The overall goal of this work is to provide hardware and software designers, as well as the users and operators of HPC systems, a systematic methodology for the design and evaluation of resilience technologies in HPC systems that keep scientific applications running to a correct solution in a timely and cost-efficient manner despite frequent faults, errors, and failures of various types. Version 2.0 expands the resilience design pattern classification and catalog to include self-stabilization patterns and reliability, availability and performance models for each structural pattern.

97 MATHEMATICS AND COMPUTING↗

Computer-implemented land use classification with pattern recognition software and ERTS digital data

Significant progress has been made in the classification of surface conditions (land uses) with computer-implemented techniques based on the use of ERTS digital data and pattern recognition software. The supervised technique presently used at the NASA Earth Resources Laboratory is based on maximum likelihood ratioing with a digital table look-up approach to classification. After classification, colors are assigned to the various surface conditions (land uses) classified, and the color-coded classification is film recorded on either positive or negative 9 1/2 in. film at the scale desired. Prints of the film strips are then mosaicked and photographed to produce a land use map in the format desired. Computer extraction of statistical information is performed to show the extent of each surface condition (land use) within any given land unit that can be identified in the image. Evaluations of the product indicate that classification accuracy is well within the limits for use by land resource managers and administrators. Classifications performed with digital data acquired during different seasons indicate that the combination of two or more classifications offer even better accuracy.

Joyce, A. T.↗

Development of gas chromatographic pattern recognition and classification tools for compliance and forensic analyses of fuels: A review

Gas chromatography (GC) is undoubtedly the analytical technique of choice for analyzing the composition of petroleum-based fuels. Over the past twenty years, as comprehensive two-dimensional gas chromatography (GC×GC) has evolved, fuel analysis has often been highlighted in scientific reports, as their complexity allows for illustration of the impressive peak capacity gains afforded by GC×GC. Indeed, several research groups in recent years have applied GC×GC and chemometrics to demonstrate the potential of these analytical tools to address important compliance (tax evasion, tax credits, physical quality standards) and forensic (arson investigations, oil spills) applications involving fuels. None the less, routine use of GC×GC in forensic laboratories has been limited largely by (1) legal and regulatory guidelines, (2) lack of chemometrics training, and (3) concerns about the reproducibility of GC×GC. The goal of this review is to highlight recent advances in one-dimensional GC (1D-GC) and GC×GC analyses of fuels for compliance and forensic applications, in an effort to assist scientists in overcoming the aforementioned hindrances. An introduction to 1D-GC principles, GC×GC technology (column stationary phases and modulators) and several chemometric techniques will be provided. More specifically, chemometric techniques will be broken down into (1) signal pre-processing, (2) peak decomposition, identification and quantification, and (3) classification and pattern recognition. Examples of compliance and forensic applications will be discussed, with particular emphasis on the demonstrated success of the employed chemometric techniques. Overall, this review will hopefully make 1D-GC and GC×GC coupled with chemometric data analysis tools more accessible to the larger scientific community, and aid in eventual widespread standardization.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

Design of partially supervised classifiers for multispectral image data

A partially supervised classification problem is addressed, especially when the class definition and corresponding training samples are provided a priori only for just one particular class. In practical applications of pattern classification techniques, a frequently observed characteristic is the heavy, often nearly impossible requirements on representative prior statistical class characteristics of all classes in a given data set. Considering the effort in both time and man-power required to have a well-defined, exhaustive list of classes with a corresponding representative set of training samples, this 'partially' supervised capability would be very desirable, assuming adequate classifier performance can be obtained. Two different classification algorithms are developed to achieve simplicity in classifier design by reducing the requirement of prior statistical information without sacrificing significant classifying capability. The first one is based on optimal significance testing, where the optimal acceptance probability is estimated directly from the data set. In the second approach, the partially supervised classification is considered as a problem of unsupervised clustering with initially one known cluster or class. A weighted unsupervised clustering procedure is developed to automatically define other classes and estimate their class statistics. The operational simplicity thus realized should make these partially supervised classification schemes very viable tools in pattern classification.

Jeon, Byeungwoo↗