Algorithms for pattern classification.
Deterministic pattern classification algorithms, discussing abstraction problem, stochastic algorithms, minimum error scheme and modified least squares scheme
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Deterministic pattern classification algorithms, discussing abstraction problem, stochastic algorithms, minimum error scheme and modified least squares scheme
Pattern classification algorithms using potential functions to construct discriminant functions from sample points set
Cloud pattern classification and discrimination from Tiros satellite data
Pattern classification algorithms classified according to type of input information required
Pattern classification algorithms classified according to type of input information required
Mathematical programming methods of pattern classification
Sequential, distribution-free pattern classification procedures tested on Gaussian and EEG patterns
Recursive algorithms for pattern classification of misclassified samples
Recursive algorithms for pattern classification using misclassified samples
Some sequential, distribution-free pattern classification techniques are presented. The decision problem to which the proposed classification methods are applied is that of discriminating between two kinds of electroencephalogram responses recorded from a human subject: spontaneous EEG and EEG driven by a stroboscopic light stimulus at the alpha frequency. The classification procedures proposed make use of the theory of order statistics. Estimates of the probabilities of misclassification are given. The procedures were tested on Gaussian samples and the EEG responses.
A sequential nonparametric pattern classification procedure is presented. The method presented is an estimated version of the Wald sequential probability ratio test (SPRT). This method utilizes density function estimates, and the density estimate used is discussed, including a proof of convergence in probability of the estimate to the true density function. The classification procedure proposed makes use of the theory of order statistics, and estimates of the probabilities of misclassification are given. The procedure was tested on discriminating between two classes of Gaussian samples and on discriminating between two kinds of electroencephalogram (EEG) responses.
The potential uses of Charge Transfer Devices (CTDs) in pattern classification operations are explored. The needs for a hardware-based pattern classifier are established, and a matrix multiplication subsystem based upon a sum-of-products CTD is presented. Applications of the subsystem to the classification of multi-modal Gaussian distributions in general and to LANDSAT data processing in particular are discussed. Finally, the potential impact of this technology on satellite data processing methodologies is discussed.
The potential uses of Charge Transfer Devices (CTDs) in pattern classification operations are explored. The needs for a hardware-based pattern classifier are established, and a matrix multiplication subsystem based upon a sum of products CTD is presented. An evaluation process for sum of products devices (particularly analog-analog correlators) is developed, and the feasibility of employing a particular device in a pattern classifier is determined. Finally, the possible impact of future trends in technology is considered.
Pattern recognition employed to classify EEG
The sunspot classification scheme presented in this paper is considered as a 2-D classification problem on archived datasets, and is not a real-time system. As a first step, it mirrors the Zuerich/McIntosh historical classification system and reproduces classification of sunspot patterns based on preprocessing and neural net training datasets. Ultimately, the project intends to move from more rudimentary schemes, to develop spatial-temporal-spectral classes derived by correlating spatial and temporal variations in various wavelengths to the brightness fluctuation spectrum of the sun in those wavelengths. Once the approach is generalized, then the focus will naturally move from a 2-D to an n-D classification, where "n" includes time and frequency. Here, the 2-D perspective refers both to the actual SOH0 Michelson Doppler Imager (MDI) images that are processed, but also refers to the fact that a 2-D matrix is created from each image during preprocessing. The 2-D matrix is the result of running Principal Component Analysis (PCA) over the selected dataset images, and the resulting matrices and their eigenvalues are the objects that are stored in a database, classified, and compared. These matrices are indexed according to the standard McIntosh classification scheme.
On-line handwritten alphanumeric character recognition system and learning algorithm for multiclass pattern classification
With X-ray free-electron lasers (XFELs), it is possible to determine the three-dimensional structure of noncrystalline nanoscale particles using X-ray single-particle imaging (SPI) techniques at room temperature. Classifying SPI scattering patterns, or `speckles', to extract single-hits that are needed for real-time vetoing and three-dimensional reconstruction poses a challenge for high-data-rate facilities like the European XFEL and LCLS-II-HE. Here, we introduce SpeckleNN, a unified embedding model for real-time speckle pattern classification with limited labeled examples that can scale linearly with dataset size. Trained with twin neural networks, SpeckleNN maps speckle patterns to a unified embedding vector space, where similarity is measured by Euclidean distance. We highlight its few-shot classification capability on new never-seen samples and its robust performance despite having only tens of labels per classification category even in the presence of substantial missing detector areas. Without the need for excessive manual labeling or even a full detector image, our classification method offers a great solution for real-time high-throughput SPI experiments.
Pattern recognition algorithms, and mathematical techniques of estimation, decision making, and optimization theory