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At least 37 records · Page 2

Automatic Determination of the Weak-Beam Condition in Dark Field X-ray Microscopy

Mechanical properties in crystals are strongly correlated to the arrangement of 1D line defects, termed dislocations. Recently, Dark field X-ray Microscopy (DFXM) has emerged as a new tool to image and interpret dislocations within crystals using multidimensional scans. However, the methods required to reconstruct meaningful dislocation information from high-dimensional DFXM scans are still nascent and require significant manual oversight (i.e. supervision). In this work, we present a new relatively unsupervised method that extracts dislocation-specific information (features) from a 3D dataset (x, y, Φ) using Gram-Schmidt orthogonalization to represent the large dataset as an array of 3-component feature vectors for each position, corresponding to the weak-beam conditions and the strong-beam condition. Finally, this method offers key opportunities to significantly reduce dataset size while preserving only the crystallographic information that is important for data reconstruction.

36 MATERIALS SCIENCE↗

Analyzing Microchips With Dark-Field Negative Photomicrography

Inverse development process yields fine details. Photomicrographic technique produces images of integrated-circuit chips. Technique based on dark-field illumination: (chip lit with bright central spot of light and photographed by light scattered or diffracted from spot. Reveals more about microstructure patterns related to photoresist masking than more conventional bright-field method.

Suszko, S. F.↗

Dark-field x-ray microscopy for 2D and 3D imaging of microstructural dynamics at the European x-ray free-electron laser

Dark field x-ray microscopy (DXFM) can visualize microstructural distortions in bulk crystals. Using the femtosecond x-ray pulses generated by x-ray free-electron lasers (XFELs), DFXM can achieve sub-μm spatial resolution and <100 fs time resolution simultaneously. In this paper, we demonstrate ultrafast DFXM measurements at the European XFEL to visualize an optically driven longitudinal strain wave propagating through a diamond single crystal. We also present two DFXM scanning modalities that are new to the XFEL sources: spatial 3D and 2D axial-strain scans with sub-μm spatial resolution. With this progress in XFEL-based DFXM, we discuss new opportunities to study multi-timescale spatiotemporal dynamics of microstructures.

47 OTHER INSTRUMENTATION↗

Radiation furnace for synchrotron dark-field x-ray microscopy experiments

We present a multi-purpose radiation furnace designed for x-ray experiments at synchrotrons. The furnace is optimized specifically for dark-field x-ray microscopy (DFXM) of crystalline materials at beamline ID06 of the European Synchrotron Radiation Facility. The furnace can reach temperatures above 1200 °C with a thermal stability better than 10 °C, with heating and cooling rates up to 30 K/s. The non-contact heating design enables samples to be heated either in air or in a controlled atmosphere contained within a capillary tube. The temperature was calibrated via the thermal expansion of an α-iron grain. Temperature profiles in the y and z axes were measured by scanning a thermocouple through the focal spot of the radiation furnace. In the current configuration of the beamline, this furnace can be used for DFXM, near-field x-ray topography, bright-field x-ray nanotomography, high-resolution reciprocal space mapping, and limited powder diffraction experiments. As a first application, we present a DFXM case study on isothermal heating of a commercially pure single crystal of aluminum.

Yildirim, C. (ORCID:0000000249690685)↗

Discovery of spontaneous mesoscopic strain waves in nematic domains using dark-field x-ray microscopy

Electronic nematic order arises when correlated electrons spontaneously break the rotational symmetry of a crystal lattice. When electronic nematic order couples bilinearly to symmetry-breaking lattice strain, both appear together at a single ferroelastic phase transition, producing structural twin domains with distinct orientations of the nematic director. While the effects of applied strain on these domains are well established, the intrinsic behavior of spontaneous subdomain strain fields has remained unexplored. Here, we report the discovery of spontaneous mesoscopic strain waves within individual nematic domains of an iron-based superconductor, observed using dark-field x-ray microscopy (DFXM). Using this advanced full-field imaging technique, we visualize subdomain strain modulations emerging concurrently with nematic order. Elastic compatibility relations governing inhomogeneous strains provide a natural mechanism for the strain waves. Our findings reveal a broadly relevant form of strain self-organization and position DFXM as a powerful probe of the local interplay between lattice strain and electronic order.

36 MATERIALS SCIENCE↗

Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers

Abstract The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, dark field X-ray microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the $$10^{12}$$ 10 12 photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics.

47 OTHER INSTRUMENTATION↗

Forecasting the Decay of Hybrid Perovskite Performance Using Optical Transmittance or Reflected Dark-Field Imaging

The practicality and economic viability of hybrid perovskite solar cells hinge on their operational lifetime, and methods for forecasting the performance of perovskites under different operational stresses are urgently needed. Here, we explore the evolution of material-level optoelectronic properties as MAPbI 3 degrades and discover universal behaviors where the carrier diffusion length (L D ) decays before quasi-Fermi-level splitting (ΔE F ), regardless of the specific stress protocol (oxygen, humidity, thermal stress, or a combination). We employ a machine learning greedy feature selection model that uses initially measured properties to predict the time it takes L D to decrease to 85% of its initial value with a prediction accuracy of 12.8%. This model reveals a strong correlation between the initial rate of transmittance change and the time until loss of transport. We translate this material-level finding to photovoltaic device-level forecasting by demonstrating that the rate of change of transmittance is equivalent to the rate of change of the spatial standard deviation of dark-field image intensity (i.e., scattered light intensity) collected in reflection mode (and thus applicable to devices with opaque contacts). Furthermore, this work demonstrates that transmittance and scattering methods are highly effective for accelerated material (and device) stability evaluation and forecasting.

14 SOLAR ENERGY↗

NNSS Plumbs the Bright Side of Dark-Field X-ray Microscopy

Article to be included in the second quarter, FY 2021, issue of the LDRD Quarterly Highlights. website: https://www.lanl.gov/projects/ldrd-tri-lab/quarterly-highlights.php. The article may also be used internally on the MSTS Science and Technology website and on the NNSS.gov SDRD news highlights page.

36 MATERIALS SCIENCE↗

Neutron Imaging Using Grating Interferometry: Exploiting phase contrast and dark-field imaging for <1μm feature detection in bulk materials (Summary Report)

Radiography is an important non-destructive characterization tool for many LANL missions. Contrast in conventional radiography results from attenuation of the incoming x-ray or neutron beam by the object. Neutrons have a great benefit in detecting light elements (e.g. hydrogen) in the presence of heavier elements and penetrate deeper than X-rays into many materials, but neutron radiography resolution is typically limited to ~50 μm. Cracks, voids, pores and a variety of other features smaller than this resolution are therefore undetectable in attenuation based neutron imaging. However, novel neutron imaging modalities leveraging off of interferometric methods, so-called neutron grating interferometry (NGI), are able to spatially map sub-micron features and interfacial features while also exploiting the neutron’s sensitivity to light elements and isotope specific contrast to enable material characterization otherwise impossible.

36 MATERIALS SCIENCE↗

Dark Field Proton Radiography (Los Alamos LDRD Report)

Proton radiography at LANL (pRad) takes advantage of the high flux, high proton energy, and flexible timing structure of LANSCE's 800-MeV proton beam to visualize dense, dynamic systems under extreme strain. With recent needs identified for the development of the W93, the pRad team has been actively searching for ways to increase the facility's radiographic capabilities. Recently, we discovered that utilizing two magnetic lenses (one upstream and one downstream of the object), and specific combinations of collimator choices within the two lenses, that the signal-to-noise ratio was improved by more than a factor of two. However, we did not fully understand the mechanism, and found that results did not match forward modeling predictions. This work specifically sought to implement an engineering solution to solve this problem, through the development of an actuated collimator that reduced the time required to swap collimator settings from a typical 4-8 hours, to less than 30 seconds. This allowed, in combination with a unique multi-material, multi-resolution stepwedge, to acquire an unprecedently enormous dataset, with in total 24 collimation combinations, and multiple diffuser settings and pulse patterns, equivalent to almost a full run cycle's worth of data in a few days. This massive dataset is currently being harnessed to make a fully-predictive, ultra-fast Python-based model of the system, to dial in specific settings for any future experiments that fully optimize that radiographic sensitivity to the material of interest.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

Selected-zone dark-field electron microscopy.

Description of a new method which makes it possible to reduce drastically the resolution-limiting influence of chromatic aberration, and thus to obtain high-quality images, by selecting the image-forming electrons that have passed through a small annular zone of an objective lens. In addition, the manufacture of special objective-lens aperture diaphragms that are needed for this method is also described.

Heinemann, K.↗