NASA NTRS · 19720042656
Selected-zone dark-field electron microscopy.
Abstract
Description of a new method which makes it possible to reduce drastically the resolution-limiting influence of chromatic aberration, and thus to obtain high-quality images, by selecting the image-forming electrons that have passed through a small annular zone of an objective lens. In addition, the manufacture of special objective-lens aperture diaphragms that are needed for this method is also described.
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Heinemann, K., Poppa, H.. 1972-02-01. Selected-zone dark-field electron microscopy.. https://ntrs.nasa.gov/citations/19720042656
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