Criteria for and extrapolation in overstress models
Accelerated life test models, criteria for model selection, and extrapolation in overstress models
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Accelerated life test models, criteria for model selection, and extrapolation in overstress models
We present H- and K-band data from the inner arcsecond of the Seyfert 1.5 galaxy NGC 4151 obtained with the adaptive optics assisted near-infrared imaging field spectrograph OSIRIS at the Keck Observatory. The angular resolution is about a few parsecs on-site and thus competes easily with optical images taken previously with the Hubble Space Telescope. We present the morphology and dynamics of most species detected but focus on the morphology and dynamics of the narrow line region (as traced by emission of [FeII]λ1.644 μm), the interplay between plasma ejected from the nucleus (as traced by 21 cm continuum radio data) and hot H2 gas and characterize the detected nuclear HeIλ2.058 μm absorption feature as a narrow absorption line (NAL) phenomenon. Emission from the narrow line region (NLR) as traced by [FeII] reveals a biconical morphology and we compare the measured dynamics in the [FeII] emission line with models proposing acceleration of gas in the NLR and simple ejection of gas into the NLR. In the inner 2.5 arcseconds the acceleration model reveals a better fit to our data than the ejection model.We also see evidence that the jet very locally enhances emission in [FeII] at certain positions in our field-of-view such that we were able to distinct the kinematics of these clouds from clouds generally accelerated in the NLR. Further, the radio jet is aligned with the bicone surface rather than the bicone axis such that we assume that the jet is not the dominant mechanism responsible for driving the kinematics of clouds in the NLR. The hot H2 gas is thermal with a temperature of about 1700 K. We observe a remarkable correlation between individual H2 clouds at systemic velocity with the 21 cm continuum radio jet. We propose that the radio jet is at least partially embedded in the galactic disk of NGC 4151 such that deviations from a linear radio structure are invoked by interactions of jet plasma with H2 clouds that are moving into the path of the jet because of rotation of the galactic disk of NGC 4151. Additionally, we observe a correlation of the jet as traced by the radio data, with gas as traced in Brγ and H2, at velocities between systemic and +/- 200 km/s at several locations along the path of the jet. The HeIλ2.058 μm line in NGC 4151 appears in emission with a blueshifted absorption component from an outflow. The emission (absorption) component has a velocity offset of 10 km/s (-280 km/s) with a Gaussian (Lorentzian) full-width (half-width) at half maximum of 160 km/s (440 km/s). The absorption component remains spatially unresolved and its kinematic measures differ from that of UV resonance absorption lines. From the amount of absorption we derive a lower limit of the HeI 2S column density of 1 × 10(exp 14) cm−2 with a covering factor along the line-of-sight of C(sub los) approximately equal to 0.1.
A survey of 50 electron energy spectra from .1 to 100 MeV originating from solar flares was made by the combination of data from two spectrometers onboard the International Sun Earth Explorer-3 spacecraft. The observed spectral shapes of flare events can be divided into two classes through the criteria of fit to an acceleration model. This standard two step acceleration model, which fits the spectral shape of the first class of flares, involves an impulsive step that accelerates particles up to 100 keV and a second step that further accelerates these particles up to 100 MeV by a single shock. This fit fails for the second class of flares that can be characterized as having excessively hard spectra above 1 MeV relative to the predictions of the model. Correlations with soft X-ray and meter radio observations imply that the acceleration of the high energy particles in the second class of flares is dominated by the impulsive phase of the flares.
The desire to assess the reliability of emerging scaled microelectronics technologies through faster reliability trials and more accurate acceleration models is the precursor for further research and experimentation in this relevant field. The effect of semiconductor scaling on microelectronics product reliability is an important aspect to the high reliability application user. From the perspective of a customer or user, who in many cases must deal with very limited, if any, manufacturer's reliability data to assess the product for a highly-reliable application, product-level testing is critical in the characterization and reliability assessment of advanced nanometer semiconductor scaling effects on microelectronics reliability. A methodology on how to accomplish this and techniques for deriving the expected product-level reliability on commercial memory products are provided.Competing mechanism theory and the multiple failure mechanism model are applied to the experimental results of scaled SDRAM products. Accelerated stress testing at multiple conditions is applied at the product level of several scaled memory products to assess the performance degradation and product reliability. Acceleration models are derived for each case. For several scaled SDRAM products, retention time degradation is studied and two distinct soft error populations are observed with each technology generation: early breakdown, characterized by randomly distributed weak bits with Weibull slope (beta)=1, and a main population breakdown with an increasing failure rate. Retention time soft error rates are calculated and a multiple failure mechanism acceleration model with parameters is derived for each technology. Defect densities are calculated and reflect a decreasing trend in the percentage of random defective bits for each successive product generation. A normalized soft error failure rate of the memory data retention time in FIT/Gb and FIT/cm2 for several scaled SDRAM generations is presented revealing a power relationship. General models describing the soft error rates across scaled product generations are presented. The analysis methodology may be applied to other scaled microelectronic products and their key parameters.
Nonrelativistic spectra of protons and ions accelerated in impulsive solar flares are derived using more realistic turbulence power spectra. The calculation is based on a particle transport equation extracted from a second step acceleration model containing stochastic acceleration. The turbulence model is generalized to waves with a small angle to the magnetic field vector and to turbulence power spectra with spectral indices s smaller than 2. Due to the occurrence of impulsive flares at low coronal heights, Coulomb losses at the dense coronal plasma and diffusive particle escape are taken into account. The ion spectra show deviations from long-duration spectra near the Coulomb barrier, where the losses become maximal. The Z-squared/A-dependence of the Coulomb losses leads to spectral variations for different ions. We present a method to estimate the turbulence parameters and injection conditions of the flare particles using ion ratios like Fe/O of impulsive flares.
The Joint Center for Satellite Data Assimilation (JCSDA) Community Radiative Transfer Model (CRTM) is a fast, 1-D radiative transfer model used in numerical weather prediction, calibration/validation, etc. across multiple federal agencies and universities. The key benefit of the CRTM is that it is a satellite simulator. It provides a highly accurate representation of satellite radiances by using the specific sensor response functions convolved with a line-by-line radiative transfer model (LBLRTM). CRTM covers the spectral ranges consistent with all present operational and most research satellites, from visible to microwave. The capability to simulate ultraviolet radiances and support space-based radar sensors is being added over the next two years in CRTM Version 3.0. In addition to simulated radiances, the CRTM also provides Jacobian outputs needed to interpret satellite observations for numerical weather prediction. The Jacobian estimates how changes in geophysical parameters affect simulated measurements from satellite sensors. Using the Jacobian in modeling and weather prediction improves the accuracy and efficiency of data analysis, leading to better weather predictions. The CRTM model's success and growth depend on community contributions and evaluation. To facilitate this, we have made the CRTM highly accessible through modular programming, clear documentation and tutorials, public domain licensing, unfettered public access via Github, and a clear path to operational implementation for innovative research. We encourage and welcome contributions from the community to help us continue to improve the CRTM.
Fisk et al. (1974) have suggested that neutral particles are ionized in the solar cavity, are subsequently picked up by the solar wind, obtaining energies of about 1 keV/nucleon, and may be further accelerated to about 10 MeV/nucleon in the interplanetary medium. The requirements for this acceleration are examined, and a possible acceleration model is outlined. The acceleration must be performed in a time less than the dwell time of the interstellar ions in the solar cavity and must compete successfully against adiabatic cooling. The energy required for the acceleration must be less than the energy available in variations in the solar wind flow. The accelerator must act inefficiently on solar wind electrons and protons, and perhaps upon the majority of interstellar ions. It is shown that these requirements can be satisfied by a model in which acceleration results from transit-time damping of long-wavelength magnetosonic turbulence.
The NASA Short-term Prediction Research and Transition (SPoRT) Center in Huntsville, Alabama was created to accelerate the infusion of NASA earth science observations, data assimilation and modeling research into NWS forecast operations and decision-making. The principal focus of experimental products is on the regional scale with an emphasis on forecast improvements on a time scale of 0-24 hours. The SPoRT Center research is aligned with the regional prediction objectives of the US Weather Research Program dealing with 0-1 day forecast issues ranging from convective initiation to 24-hr quantitative precipitation forecasting. The SPoRT Center, together with its other interagency partners, universities, and the NASA/NOAA Joint Center for Satellite Data Assimilation, provides a means and a process to effectively transition NASA Earth Science Enterprise observations and technology to National Weather Service operations and decision makers at both the global/national and regional scales. This paper describes the process for the transition of experimental products into forecast operations, current products undergoing assessment by forecasters, and plans for the future.
Verification testing is an important aspect of the design process for mechanical mechanisms, and full-scale, full-length life testing is typically used to qualify any new component for use in space. However, as the required life specification is increased, full-length life tests become more costly and lengthen the development time. At the NASA Lewis Research Center, we theorized that neural network systems may be able to model the operation of a mechanical device. If so, the resulting neural network models could simulate long-term mechanical testing with data from a short-term test. This combination of computer modeling and short-term mechanical testing could then be used to verify the reliability of mechanical systems, thereby eliminating the costs associated with long-term testing. Neural network models could also enable designers to predict the performance of mechanisms at the conceptual design stage by entering the critical parameters as input and running the model to predict performance. The purpose of this study was to assess the potential of using neural networks to predict the performance and life of mechanical systems. To do this, we generated a neural network system to model wear obtained from three accelerated testing devices: 1) A pin-on-disk tribometer; 2) A line-contact rub-shoe tribometer; 3) A four-ball tribometer.
Overview Reviewed data Caution must be taken when accelerating test conditions Data not useful to establish an acceleration model Introduction of new failure mechanism skewing results Evidence of Anti-Wear-Out De-doping of polymer Decreased capacitance Increased ESR Not dielectric breakdown Needs further investigation Further investigation into tantalum polymer capacitor technology Promising acceleration model for Manufacturer A Possibility for use in high-reliability space applications with suitable voltage derating.
Attendant to the direct side force maneuver of a Vectored Force Fighter is the transverse acceleration imposed on the pilot. This lateral acceleration (Gy), when combind with a positive Gz stress, is a potential source of pilot tracking performance impairment. A research effort to investigate these performance decrements includes experimental as well as anaytical pilot performance modeling using the Optimal Control Model.
The reported e(sup +/-) annihilation line from the Crab pulsar has three remarkable properties. It is very strong (approximately 10(exp 40)e(sup +/-) annhilations/sec.), red shifted (by about 70 KeV relative to mc(exp 2) = 511 KeV), and very narrow (width approximately equals 10 KeV). The e(sup +/-) annihilation did not occur near the star in polar cap accelerator models so that the redshift, suggestive in its magnitude of a gravitational redshift from annihilation near the stellar surface, did not have an explanation. Therefore, concentration was placed on e(sup +/-) production from outer-magnetosphere accelerator models.
As microelectronics are scaled in to the deep sub-micron regime, users of advanced technology CMOS, particularly in high-reliability applications, should reassess how scaling effects impact long-term reliability. An experimental based reliability study of industrial grade SRAMs, consisting of three different technology nodes, is proposed to substantiate current acceleration models for temperature and voltage life-stress relationships. This reliability study utilizes step-stress techniques to evaluate memory technologies (0.25mum, 0.15mum, and 0.13mum) embedded in many of today's high-reliability space/aerospace applications. Two acceleration modeling approaches are presented to relate experimental FIT calculations to Mfr's qualification data.
Empirical equation derived from cycles-to-failure, temperature cells, and prediction of normal packs are presented.
The first order Fermi shock acceleration model is compared with specific observations where electron, proton, and alpha particle spectra are available. In all events, it is found that a single shock with a compression ratio as inferred from the low energy proton spectra can reasonably produce the full proton, electron, and alpha particle spectra. The model predicts that the acceleration time to a given energy will be approximately equal for electrons and protons and, for reasonable solar parameters, can be less than 1 sec to 100 MeV.
The first-order Fermi shock acceleration model is compared with specific observations where electron, proton, and alpha particle spectra are available. In all events, it is found that a single shock with a compression ratio as inferred from the low-energy proton spectra can reasonably produce the full proton, electron, and alpha particle spectra. The model predicts that the acceleration time to a given energy will be approximately equal for electrons and protons and, for reasonable solar parameters, can be less than 1 sec to 100 MeV.
This is a continuation of the report “Effects of Hand Soldering MIL-PRF-55365 Tantalum Capacitors,” which discusses the parametric effects of convection reflow soldering, JPL standard hand soldering, and optimized hand soldering on solid tantalum capacitors. The current focus is determining the long-term reliability effects of the various soldering techniques. Unfortunately, the 100-piece sample size chosen for the highly accelerated life tests was too small to reliably determine the effects of the different soldering techniques on the lifespan of the parts. In hindsight, this likely could have been predicted based on the large alphas and small betas of the Weibull failure distributions discovered during the scouting trials. Now that the effects of inadequate sample size are better understood, an opportunity exists to not only discover whether there are real differences in the reliability associated with the various soldering techniques, but also the potential to discover the voltage acceleration model and the temperature acceleration effect for these capacitors. It is recommended that the testing be repeated with a more appropriate sample size to capture this useful information.