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The effect is reported of power/temperature step stress when applied to the transistor JANTX2N2369A manufactured by Raytheon and National Semiconductor. A total of 48 samples from each manufacturer was submitted to the process. In addition, two control sample units were maintained for verification of the electrical parametric testing. The power/thermal stress tests are described, and failure analyses are presented.
Neural networks have become state-of-the-art for computer vision problems because of their ability to efficiently model complex functions from large amounts of data. While neural networks can be shown to perform well empirically fora variety of tasks, their performance is difficult to guarantee.Neural network verification tools have been developed that can certify robustness with respect to a given input image; however,for neural network systems used in closed-loop controllers,robustness with respect to individual images does not address multi-step properties of the neural network controller and itsenvironment. Furthermore, neural network systems interacting in the physical world and using natural images are operating in a black-box environment, making formal verification in-tractable. This work combines the adaptive stress testing (AST)framework with neural network verification tools to search for the most likely sequence of image disturbances that cause the neural network controlled system to reach a failure. Anautonomous aircraft taxi application is presented, and results show that the AST method finds failures with more likely image disturbances than baseline methods. Further analysis of AST results revealed an explainable cause of the failure, giving insight into the problematic scenarios that should be addressed.
Fixture designed to hold and heat thin, rectangular-cross-section specimen of composite material during hot lengthwise-stress test. Suitable for testing same specimen in either tension or compression. Clamps lightly onto specimen, providing both heat via thermal conduction and lateral support needed to prevent buckling during compression test.
Stress corrosion tests on aluminum alloys with respect to statistical nature of distribution of failure times
The single-breath cardiac output measurement technique of Kim et al. (1966) has been modified for use in obtaining cardiac output measurements during exercise-stress tests on Apollo astronauts. The modifications involve the use of a respiratory mass spectrometer for data acquisition and a digital computer program for data analysis. The variation of the modified method for triplicate steady-state cardiac output measurements was plus or minus 1 liter/min. The combined physiological and methodological variation seen during a set of three exercise tests on a series of subjects was 1 to 2.5 liter/min. Comparison of the modified method with the direct Fick technique showed that although the single-breath values were consistently low, the scatter of data was small and the correlation between the two methods was high. Possible reasons for the low single-breath cardiac output values are discussed.
Attention is given to the construction, calibration, and performance of a repeatable measurement system for use in conjunction with the accelerated stress testing of a-Si:H cells. A filtered diode array is utilized to approximate the spectral response of any type of solar cell in discrete portions of the spectrum. It is noted that in order to achieve the necessary degree of overall repeatability, it is necessary to pay particular attention to methods of contacting and positioning the cells.
This paper describes an easy-to-use monitor developed to track the weightlessness deconditioning aboard the NASA Space Station, together with the results of testing of a prototype instrument. The monitor measures the O2 uptake and CO2 production, and calculates the maximum O2 uptake and anaerobic threshold during an exercise stress test. The system uses two flowmeters in series to achieve a completely automatic calibration, and uses breath-by-breath compensation for sample line-transport delay. The monitor was evaluated using two laboratory methods and was shown to be accurate. The system's block diagram and the bench test setup diagram are included.
The development of an accelerated test schedule for terrestrial solar cells is described. This schedule, based on anticipated failure modes deduced from a consideration of IC failure mechanisms, involves bias-temperature testing, humidity testing (including both 85-85 and pressure cooker stress), and thermal-cycle thermal-shock testing. Results are described for 12 different unencapsulated cell types. Both gradual electrical degradation and sudden catastrophic mechanical change were observed. These effects can be used to discriminate between cell types and technologies relative to their reliability attributes. Consideration is given to identifying laboratory failure modes which might lead to severe degradation in the field through second quadrant operation. Test results indicate that the ability of most cell types to withstand accelerated stress testing depends more on the manufacturer's design, processing, and worksmanship than on the particular metallization system. Preliminary tests comparing accelerated test results on encapsulated and unencapsulated cells are described.
High-temperature slow-crack-growth behaviour of hot-pressed silicon carbide was determined using both constant-stress-rate ("dynamic fatigue") and constant-stress ("static fatigue") testing in flexure at 1300 C in air. Slow crack growth was found to be a governing mechanism associated with failure of the material. Four estimation methods such as the individual data, the Weibull median, the arithmetic mean and the median deviation methods were used to determine the slow crack growth parameters. The four estimation methods were in good agreement for the constant-stress-rate testing with a small variation in the slow-crack-growth parameter, n, ranging from 28 to 36. By contrast, the variation in n between the four estimation methods was significant in the constant-stress testing with a somewhat wide range of n= 16 to 32.
The next-generation Airborne Collision Avoidance System for smaller UASs (ACAS sXu) is currently being developed and tested by the Federal Aviation Administration (FAA) to provide detect-and-avoid capability for small unmanned aircraft operating beyond line-of-sight. Due to the complexity and safety-critical nature of the system, safety validation is important not only for the certification of the final system, but also for informing changes during the iterative development process. In this paper, we analyze a prototype of ACAS sXu in simulated aircraft encounters to discover scenarios of small near mid-air collisions (sNMACs), an important safety event in which two aircraft come closer than 50 feet horizontally and 15 feet vertically. Due to the size and complexity of the system as well as rarity of sNMAC events, traditional methods such as Monte Carlo testing often require informed setup and targeting to elicit failures. However, such a dependence on domain knowledge can be incompatible with the independent verification and validation (IV&V) process, the aim of which is to discover unforeseen issues. To address these challenges, we apply an accelerated validation method called adaptive stress testing (AST) to find the most likely sNMAC scenarios without reliance on system introspection. AST uses reinforcement learning to adapt the search towards the most promising areas of the search space as it progresses. We use a state-of-the-art deep reinforcement learning algorithm, proximate policy optimization, to more efficiently search the large and continuous state space. We find that this approach significantly improves the performance of AST compared to a prior approach based on Monte Carlo tree search. We perform experiments using AST to find sNMAC events under various encounter configurations, varying parameters pertaining to dynamics and coordination. Our experiments show AST to be very effective at finding sNMAC scenarios. We summarize our findings, presenting high-level categories of discovered sNMACs and specific examples of encounters in each category.
This paper presents a scalable method to efficiently search for the most likely state trajectory leading to an event given only a simulator of a system. Our approach uses a reinforcement learning formulation and solves it using Monte Carlo Tree Search (MCTS). The approach places very few requirements on the underlying system, requiring only that the simulator provide some basic controls, the ability to evaluate certain conditions, and a mechanism to control the stochasticity in the system. Access to the system state is not required, allowing the method to support systems with hidden state. The method is applied to stress test a prototype aircraft collision avoidance system to identify trajectories that are likely to lead to near mid-air collisions. We present results for both single and multi-threat encounters and discuss their relevance. Compared with direct Monte Carlo search, this MCTS method performs significantly better both in finding events and in maximizing their likelihood.
The effect was studied of power/temperature step stress when applied to the dual transistor JANTX2N3811 manufactured by Motorola and National Semiconductor. A total of 48 samples from Motorola and 47 from National Semiconductor was submitted to the processes. In addition, two control sample units were maintained for verification of the electrical parametric testing. The tests for determining power/temperature stresses are described, and test results are discussed. Failure analyses for power stress, and temperature stress are presented.
Study was initiated to determine methods or test specimens for evaluating stress corrosion cracking characteristics of common structural materials. It was found that the methods of externally loading and corrosion testing were reliable in yielding reproducible results for stress corrosion evaluation.
The effect of power/temperature step stress when applied to the transistor JANTX2N2905A manufactured by Texas Instruments and Motorola is reported. A total of 48 samples from each manufacturer was submitted to the process outlined. In addition, two control sample units were maintained for verification of the electrical parametric testing. All test samples were subjected to the electrical tests outlined in Table 2 after completing the prior power/temperature step stress point.
The effect of power/temperature step stress when applied to a variety of voltage regulating diodes manufactured by Texas Instruments and Siemens was investigated. Test requirements are described and results are tabulated. Failure modes are discussed.
The effect of power/temperature step stress when applied to the zener diode JANTX1N3031B manufactured by Siemens and Motorola is reported. A total of 48 samples from each manufacturer was submitted to the process. In addition, two control sample units were maintained for verification of the electrical parametric testing.
The effect of power/temperature step stress when applied to a field effect transistor JANTX2N4856 manufactured by Texas Instruments and Teledyne was evaluated. A total of 48 samples from each manufacturer was submitted to the process. In addition, two control units were maintained for verification of the electrical parametric testing.
The effect of power/temperature step stress when applied to the zener diode JANTX2N2989 manufactured by Siemens and General Semiconductor is reported. A total of 48 samples from each manufacturer was submitted to the process. In addition, two control sample units were maintained for verification of the electrical parameteric testing.