Engineering Papers⌕ Search

SEARCH · Engineering Papers

Results for “Radiation Testing”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 37 records · Page 2
All sourcesNASA NTRSDOE OSTI
NASA NTRS2017

Recent Radiation Test Results for Trench Power MOSFETs

Single-event effect (SEE) radiation test results are presented for various trench-gate power MOSFETs. The heavy-ion response of the first (and only) radiation-hardened trench-gate power MOSFET is evaluated: the manufacturer SEE response curve is verified and importantly, no localized dosing effects are measured, distinguishing it from other, non-hardened trench-gate power MOSFETs. Evaluations are made of n-type commercial and both n- and p-type automotive grade trench-gate device using ions comparable to of those on the low linear energy transfer (LET) side of the iron knee of the galactic cosmic ray spectrum, to explore suitability of these parts for missions with higher risk tolerance and shorter duration, such as CubeSats. Part-to-part variability of SEE threshold suggests testing with larger sample sizes and applying more aggressive derating to avoid on-orbit failures. The n-type devices yielded expected localized dosing effects including when irradiated in an unbiased (0-V) configuration, adding to the challenge of inserting these parts into space flight missions.

Schottky Diodes↗
NASA NTRS2020

Status of NEPP Radiation Testing 3D NAND Flash

This work provides a current update of radiation testing activities on 3D NAND flash memories in support of the NEPP program. Single-event effects data from heavy-ion and low-energy proton testing is highlighted on a state of the art memory device.

Flash↗
NASA NTRS2020

Status of NEPP Radiation Testing 3D NAND Flash

This work provides a current update of radiation testing activities on 3D NAND flash memories in support of the NEPP program. Single-event effects data from heavy-ion and low-energy proton testing is highlighted on a state of the art memory device.

Flash↗
NASA NTRS2008

Commercial Sensory Survey Radiation Testing Progress Report

The NASA Electronic Parts and Packaging (NEPP) Program Sensor Technology Commercial Sensor Survey task is geared toward benefiting future NASA space missions with low-cost, short-duty-cycle, visible imaging needs. Such applications could include imaging for educational outreach purposes or short surveys of spacecraft, planetary, or lunar surfaces. Under the task, inexpensive commercial grade CMOS sensors were surveyed in fiscal year 2007 (FY07) and three sensors were selected for total ionizing dose (TID) and displacement damage dose (DDD) tolerance testing. The selected sensors had to meet selection criteria chosen to support small, low-mass cameras that produce good resolution color images. These criteria are discussed in detail in [1]. This document discusses the progress of radiation testing on the Micron and OmniVision sensors selected in FY07 for radiation tolerance testing.

Micron↗
NASA NTRS2020

Comprehensive Radiation Testing of Uncooled, Free Space Coupled, InGaAs Quad Photoreceivers

We have comprehensively tested uncooled, free space coupled, InGaAs Quad Photoreceivers having 0.5mm, 1mm, and 2mm diameter integrated with a low noise transimpedance amplifier (TIA)using 30MeV Protons, 100MeV Protons, 662keV Gamma Rays, 1GeV/n Helium, and 1GeV/n Iron at room temperature of ~20°C.These devices find multiple applications in space for differential wave front sensing as part of a Gravitational Wave Observatory, as well as instrumentation and control for next generation space telescopes. The bandwidth of all receivers was 20MHz which was TIA limited. All 0.5mm and 1mm devices were found to be fully functional at normal operating conditions and at room temperature for Protons, Gamma Rays, 1GeV/n Helium, and 1GeV/n Iron. Only one quadrant of a 2mm In GaAs Quad had hard failure due to 1GeV/n Helium Ions; otherwise it too survived all other radiation tests. Detailed test results follow in the manuscript including recommendations for future space flights. These radiation test results, combined with the earlier successful mechanical shock and vibration testing mean these devices have passed preliminary testing for space qualification.

Abhay M Joshi↗
NASA NTRS1984

A guideline for heavy ion radiation testing for Single Event Upset (SEU)

A guideline for heavy ion radiation testing for single event upset was prepared to assist new experimenters in preparing and directing tests. How to estimate parts vulnerability and select an irradiation facility is described. A broad brush description of JPL equipment is given, certain necessary pre-test procedures are outlined and the roles and testing guidelines for on-site test personnel are indicated. Detailed descriptions of equipment needed to interface with JPL test crew and equipment are not provided, nor does it meet the more generalized and broader requirements of a MIL-STD document. A detailed equipment description is available upon request, and a MIL-STD document is in the early stages of preparation.

Nichols, D. K.↗
DOE OSTI2021

A New Era of Nuclear Criticality Experiments: The First 10 Years of Radiation Test Object Operations at NCERC

The work presented in this paper focuses on the first 10 years (2011–2020) of radiation test object (RTO) operations at the National Criticality Experiments Research Center. RTOs are subcritical configurations of special nuclear material that are built by hand. These configurations are utilized for benchmark experiments, detector testing/characterization, and training. An overview of the types of measurements used in RTO operations is given as well as a history of RTO operations at Los Alamos National Laboratory from 1944–2011.

73 NUCLEAR PHYSICS AND RADIATION PHYSICS↗
DOE OSTI2021

UPF and Y-12 Criticality Accident Alarm System (CAAS) Radiation Testing Report

This report documents the experimental conditions and results for the testing of the Mirion Technologies CAAS-3S Criticality Accident Alarm System (CAAS) for the Y-12 National Security Complex (Y-12) and Uranium Processing Facility (UPF). The testing was conducted at the Godiva IV Burst Reactor at the National Criticality Experiments Research Center (NCERC) at the Nevada National Security Site (NNSS) during the week of January 11, 2021. The testing was conducted in accordance with 25774-QL-POA-JR00-00002-VDE-27.0, CAAS-3S Radiation Testing of Cabinet Components Test Plan. The tests subjected the CAAS-3S system to intense and short duration mixed neutron and gamma radiation fields and to high integrated radiation doses. The purpose of the test was to environmentally qualify various CAAS-3S components in a radiation environment. Successful completion of the tests was predicated on the collaborative efforts of several organizations. Sandia National Laboratory (SNL) and Lawrence Livermore National Laboratory (LLNL) provided dosimetry to estimate photon and neutron dose. Los Alamos National Laboratory (LANL) manages the NCERC facility, operated the Godiva IV reactor, and provided field support for CAAS-3S placement and communications interface for data acquisition systems supplied by Mirion Technologies. Throughout the test campaign, Y-12 and UPF personnel provided technical support in determining changes to the test schedule, as needed, interpretation of the results, and comparison between the measured dosimetry data and predicted results. Throughout the test campaign, Mirion personnel provided technical support in the operation of the CAAS-3S system itself.

21 SPECIFIC NUCLEAR REACTORS AND ASSOCIATED PLANTS↗
NASA NTRS2009

Commercial Sensor Survey Fiscal Year 2009 master compendium radiation test report

The NASA Electronic Parts and Packaging (NEPP) Program Sensor Technology Commercial Sensor Survey task is geared toward benefiting future NASA space missions with low-cost, short-duty-cycle, visible-wavelength imaging needs. Such applications could include imaging for educational outreach purposes or short surveys of spacecraft, planetary, or lunar surfaces. Under the task, inexpensive, low-power, commercial grade CMOS sensors were surveyed in fiscal year 2007 (FY07), and three sensors were selected and tested for total ionizing dose (TID) and displacement damage dose (DDD) tolerance in fiscal year 2008 (FY08). The selected sensors had to meet selection criteria chosen to support small, low-mass cameras that produce good resolution color images. The commercial CMOS sensors tested under the task in FY08 showed very promising response to typical outreach and survey camera TID and DDD levels. In fiscal year 2009 (FY09), the survey was broadened to include two additional, similar sensor products. This compendium provides results for all radiation testing performed on the Micron and OmniVision sensors that were selected for radiation tolerance testing in FY08 and FY09.

Thorbourn, Dennis O.↗
NASA NTRS2007

Radiation Test Challenges for Scaled Commerical Memories

As sub-100nm CMOS technologies gather interest, the radiation effects performance of these technologies provide a significant challenge. In this talk, we shall discuss the radiation testing challenges as related to commercial memory devices. The focus will be on complex test and failure modes emerging in state-of-the-art Flash non-volatile memories (NVMs) and synchronous dynamic random access memories (SDRAMs), which are volatile. Due to their very high bit density, these device types are highly desirable for use in the natural space environment. In this presentation, we shall discuss these devices with emphasis on considerations for test and qualification methods required.

LaBel, Kenneth A.↗
NASA NTRS2016

Resources for Radiation Test Data

The performance of electronic devices in a space radiation environment is often limited by susceptibility to single-event effects (SEE), total ionizing dose (TID), and displacement damage (DD). Interpreting the results of SEE, TID, and DD testing of complex devices is quite difficult given the rapidly changing nature of both technology and the related radiation issues. Radiation testing is performed to establish the sensitivities of candidate spacecraft electronics to single-event upset (SEU), single-event latchup (SEL), single-event gate rupture (SEGR), single-event burnout (SEB), single-event transients (SETs), TID, and DD effects. Knowing where to search for these test results is a valuable resource for the aerospace engineer or spacecraft design engineer. This poster is intended to be a resource tool for finding radiation test data.

Single Event Effects (SEE)↗
NASA NTRS2009

Radiation Testing on State-of-the-Art CMOS: Challenges, Plans, and Preliminary Results

At GOMAC 2007 and 2008, we discussed a variety of challenges for radiation testing of modern semiconductor devices and technologies [1, 2]. In this presentation, we provide more specific details in this on-going investigation focusing on out-of-the-box lessons observed for providing radiation effects assurances as well as preliminary test results.

LaBel, Kenneth A.↗
NASA NTRS2011

Six-Tube Freezable Radiator Testing and Model Correlation

Freezable radiators offer an attractive solution to the issue of thermal control system scalability. As thermal environments change, a freezable radiator will effectively scale the total heat rejection it is capable of as a function of the thermal environment and flow rate through the radiator. Scalable thermal control systems are a critical technology for spacecraft that will endure missions with widely varying thermal requirements. These changing requirements are a result of the spacecraft s surroundings and because of different thermal loads rejected during different mission phases. However, freezing and thawing (recovering) a freezable radiator is a process that has historically proven very difficult to predict through modeling, resulting in highly inaccurate predictions of recovery time. These predictions are a critical step in gaining the capability to quickly design and produce optimized freezable radiators for a range of mission requirements. This paper builds upon previous efforts made to correlate a Thermal Desktop(TradeMark) model with empirical testing data from two test articles, with additional model modifications and empirical data from a sub-component radiator for a full scale design. Two working fluids were tested, namely MultiTherm WB-58 and a 50-50 mixture of DI water and Amsoil ANT.

Lillibridge, Sean↗
NASA NTRS2012

Six-Tube Freezable Radiator Testing and Model Correlation

Freezable Radiators offer an attractive solution to the issue of thermal control system scalability. As thermal environments change, a freezable radiator will effectively scale the total heat rejection it is capable of as a function of the thermal environment and flow rate through the radiator. Scalable thermal control systems are a critical technology for spacecraft that will endure missions with widely varying thermal requirements. These changing requirements are a result of the spacecraft?s surroundings and because of different thermal loads rejected during different mission phases. However, freezing and thawing (recov ering) a freezable radiator is a process that has historically proven very difficult to predict through modeling, resulting in highly inaccurate predictions of recovery time. These predictions are a critical step in gaining the capability to quickly design and produce optimized freezable radiators for a range of mission requirements. This paper builds upon previous efforts made to correlate a Thermal Desktop(TM) model with empirical testing data from two test articles, with additional model modifications and empirical data from a sub-component radiator for a full scale design. Two working fluids were tested: MultiTherm WB-58 and a 50-50 mixture of DI water and Amsoil ANT.

Lilibridge, Sean T.↗
NASA NTRS2002

REE radiation fault model: a tool for organizing and communication radiation test data and construction COTS based spacebourne computing systems

The growth in data rates of instruments on future NASA spacecraft continues to outstrip the improvement in communications bandwidth and processing capabilities of radiation-hardened computers. Sophisticated autonomous operations strategies will further increase the processing workload. Given the reductions in spacecraft size and available power, standard radiation hardened computing systems alone will not be able to address the requirements of future missions. The REE project was intended to overcome this obstacle by developing a COTS- based supercomputer suitable for use as a science and autonomy data processor in most space environments. This development required a detailed knowledge of system behavior in the presence of Single Event Effect (SEE) induced faults so that mitigation strategies could be designed to recover system level reliability while maintaining the COTS throughput advantage. The REE project has developed a suite of tools and a methodology for predicting SEU induced transient fault rates in a range of natural space environments from ground-based radiation testing of component parts. In this paper we provide an overview of this methodology and tool set with a concentration on the radiation fault model and its use in the REE system development methodology. Using test data reported elsewhere in this and other conferences, we predict upset rates for a particular COTS single board computer configuration in several space environments.

Radiation Effects Modeling COTS computers REE SEU ↗
NASA NTRS2019

Room Temperature Radiation Testing of a 500 °C Durable 4H-SiC JFET Integrated Circuit Technology

Total ionizing dose (TID) and single-event effect (SEE) room-temperature radiation test results are presented for developmental prototype 4H-SiC junction field effect transistor (JFET) semiconductor integrated circuits (ICs) that have demonstrated prolonged operation in extremely high-temperature (500 °C) environments. The devices tested demonstrated over 7 Mrad(Si) TID tolerance and no destructive SEE susceptibility.

Lauenstein, Jean-Marie↗