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Single Board Computer Radiation Test Results and Radiation Test Software

Single Board Computers (SBCs) are quickly evolving and gaining capability as their cost comes down. As their footprints, cost, and power requirements decrease, their processing power increases. This makes them very attractive for use on space missions and an enabling technology as spacecraft size decreases and computational demand increases. One of the major challenges electronics face in the space environment is radiation. In 2019, the NASA Johnson Space Center (JSC) tested a selection of SBCs to low Earth orbit (LEO) radiation levels and evaluated their susceptibility and survivability. For this test campaign, JSC developed a Python software suite to better characterize the SBCs performance and intends to share the software.

Pedrotty, Samuel M.↗

Update to the Microcontroller Benchmark for Radiation Testing

LANL developed a benchmark of software code for radiation testing of microprocessors several years ago, and it was published under an open-source license on GitHub. Publishing the software is necessary for other researchers to adopt and implement this benchmark for radiation testing of other microprocessors to standardize test practices so that test data can be compared across different microprocessors. The original codes have been used several times by other organizations to test a wide range of microcontrollers and microprocessors. After several years of research, LANL is ready to update the benchmark. Changes include: 1. Addition of new codes that allow common software codes to be tested, 2. Addition of new codes that instrument more microprocessor circuitry, 3. Addition of input patterns that allow for a more compressive understanding of how the memory layout affects the sensitivity to radiation-induced faults and better use of automated test pattern generation standards, and 4. Modification of current codes for faster and more resilient detection, reporting and correction of radiation-induced faults. These codes have been tested by LANL researchers over the last few years, which has been published in the open literature. As the code base for the new benchmarks are stable, it is time to release the update to the GitHub repository, where the original codes were released.

Quinn, Heather↗

A Technical and Cost Perspective on Radiation Testing Challenges

A viewgraph presentation detailing costs and technical perspectives on radiation testing is shown. The topics include: 1) Introduction - a Changing Microelectronics World; 2) Sample Technology Changes and Related Impacts on Radiation Testing; 3) Perspective on the "New" Cost or Doing Business; and 4) Considerations.

LaBel, Kenneth A.↗

Radiation tests of SEP solar cells

Solar cells specially designed for Solar Electric Propulsion (SEP) were tested with radiation fluences up to 10 to the 12th power protons having energies of 1.5, 1.0, and 0.5 MeV, and with fluences up to 10 to the 16th power electrons having 1.0 MeV energy. Spectrolab cells having a back-surface field were also irradiated with the same particles and fluences. Cell performances are described by curves in which normalized and absolute values of maximum power, maximum-power voltage, short-circuit current, and open-circuit voltage are plotted as a function of fluence.

Oman, H.↗

Radiation Testing for High-Resolution Radiation-Hardened Camera System (Final CRADA Report)

The nuclear energy industry needs higher-image quality and higher rad-hard vision systems for refueling and inspection operations that are required every 12-18 months for all operating commercial reactors. During refueling operations, the serial numbers of fuel assemblies need to be visually verified in a challenging high radiation environment with dose rates on the order of 1kGy/hr. at the top of the core (approximately 10 days after shutdown). Vega Wave Systems has developed and built a radiation hard vision system that: 1. has high radiation hardness, 2. demonstrated best in the industry image quality, 3. has small size and weight, and 4. does not suffer from radiation-induced noise. ANL-1060 (02/13/2023) The proprietary Enduray vision system from Vega Wave Systems, Inc. is designed to withstand more than 400x the radiation level of the Vidicon-based systems, currently the highest radiation tolerant system in use today. The Van De Graaff (VDG) electron accelerator at Argonne National Laboratory is ideally suited for testing of Enduray vision system. VDG provides a broad band (up to 3 MeV) x-ray source that reasonably approximates the energy and spectrum of the gamma radiation expected at the top of a nuclear core 10 days after shutdown (~1kGy/hr.), is easily controlled for variable tests, and will not activate the parts under radiation for ease of timely and close inspection and characterization of the system in case of operational issues.

11 NUCLEAR FUEL CYCLE AND FUEL MATERIALS↗

Ground radiation tests and flight atomic oxygen tests of ITO protective coatings for Galileo Spacecraft

Radiation simulation tests (protons and electrons) were performed along with atomic oxygen flight tests aboard the Shuttle to space qualify the surface protective coatings. The results, which contributed to the selection of indium-tin-oxide (ITO) coated polyester as the material for the thermal blankets of the Galileo Spacecraft, are given here. Two candidate materials, polyester and Fluorglas, were radiation-tested to determine changes at simulated Jovian radiation levels. The polyester exhibited a smaller weight loss (2.8) than the Fluorglas (8.8 percent). Other changes of polyester are given. During low-earth orbit, prior to transit to Jupiter, the thermal blankets would be exposed to atomic oxygen. Samples of uncoated and ITO-coated polyesters were flown on the Shuttle. Qualitative results are given which indicated that the ITO coating protected the underlying polyester.

Bouquet, Frank L.↗

A Compendium of Recent Optocoupler Radiation Test Data

We present a compendium of optocoupler radiation test data including neutron, proton and heavy ion Displacement Damage (DD), Single Event Transients (SET) and Total Ionizing Dose (TID). Proton data includes ionizing and non-ionizing damage mechanisms.

Label, K. A.↗

Guideline for ground radiation testing of microprocessors in the space radiation environment

The goal of this work is to develop a guideline that is applicable to processors that are potentially useful in space. Thus, the guideline does not consider very high performance processors that are intended for server or high-performance applications where very large amounts of power are tolerated to gain performance because it would be impractical to use such high-power devices in typical space applications. This guide is intended to support insertion of these microprocessors into spaceflight applications and to recommend ground test protocols. The first guideline principle that should be followed is a serious concurrent engineering approach for down selecting space-qualified microprocessors. This requires that the design engineer seek the support of a radiation effects expert who understands total ionizing dose (TID) and single-event effects (SEEs) issues for microprocessors as applied to the system in question.

Irom, Farokh↗

Radiation Testing, Characterization and Qualification Challenges for Modern Microelectronics and Photonics Devices and Technologies

At GOMAC 2007, we discussed a selection of the challenges for radiation testing of modern semiconductor devices focusing on state-of-the-art memory technologies. This included FLASH non-volatile memories (NVMs) and synchronous dynamic random access memories (SDRAMs). In this presentation, we extend this discussion in device packaging and complexity as well as single event upset (SEU) mechanisms using several technology areas as examples including: system-on-a-chip (SOC) devices and photonic or fiber optic systems. The underlying goal is intended to provoke thought for understanding the limitations and interpretation of radiation testing results.

LaBel, Kenneth A.↗

Radiation Testing, Characterization and Qualification Challenges for Modern Microelectronics and Photonics Devices and Technologies

At an earlier conference we discussed a selection of the challenges for radiation testing of modern semiconductor devices focusing on state-of-the-art CMOS technologies. In this presentation, we extend this discussion focusing on the following areas: (1) Device packaging, (2) Evolving physical single even upset mechanisms, (3) Device complexity, and (4) the goal of understanding the limitations and interpretation of radiation testing results.

LaBel, Kenneth A.↗

Radiation testing of GaAs on CRRES and LIPS experiment

The radiation damage of solar cells has become a prime concern to the U.S. Air Force due to longer satellite lifetime requirements. Flight experiments were undertaken on the Navy Living Plume Shield (LPS) satellite and the NASA/Air Force Combined Release and Radiation Effects Satellite (CRRES) to complement existing radiation testing. Each experiment, the rationale behind it, and its approach and status are presented. The effect of space radiation on gallium arsenide (GaAs) solar cells was the central parameter investigated. Specifications of the GaAs solar cells are given.

Trumble, T. M.↗

Standard Method For Radiation Tests Of Liquids

Simple procedure provides standard method for radiation tests of liquids. Assures identical handling and dosage so data from different test laboratories compared reliably. Pair of glass vials, joined by frangible neck and equipped with valves, used. Third vial also used. Filled with control specimen and not irradiated. Developed for measuring properties of liquids for use in radiation-resistant liquid-dielectric capacitors, procedure used for any of variety of liquids proposed for use in high-radiation environment - in x-ray and particle-accelerating machines and nuclear reactors, for example.

Bouquet, Frank L.↗