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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 37 records · Page 2

On protection of Freedom's solar dynamic radiator from the orbital debris environment. II - Further testing and analyses

Presented here are results of a test program undertaken to further define the response of the solar dynamic radiator to hypervelocity impact (HVI). Tests were conducted on representative radiator panels (under ambient, nonoperating conditions) over a range of velocity. Target parameters are also varied. Data indicate that analytical penetration predictions are conservative (i.e., pessimistic) for the specific configuration of the solar dynamic radiator. Test results are used to define the solar dynamic radiator reliability with respect to HVI more rigorously than previous studies. Test data, reliability, and survivability results are presented.

Rhatigan, Jennifer L.↗

Programmable Logic Application Notes

This column will be provided each quarter as a source for reliability, radiation results, NASA capabilities, and other information on programmable logic devices and related applications. This quarter's column will include some announcements and some recent radiation test results and evaluations of interest. Specifically, the following topics will be covered: the Military and Aerospace Applications of Programmable Devices and Technologies Conference to be held at GSFC in September, 1998, proton test results, heavy ion test results, and some total dose results.

Katz, Richard↗

Programmable Logic Application Notes

This column will be provided each quarter as a source for reliability, radiation results, NASA capabilities, and other information on programmable logic devices and related applications. This quarter the focus is on some experimental data on low voltage drop out regulators to support mixed 5 and 3.3 volt systems. A discussion of the Small Explorer WIRE spacecraft will also be given. Lastly, we show take a first look at robust state machines in Hardware Description Languages (VHDL) and their use in critical systems. If you have information that you would like to submit or an area you would like discussed or researched, please give me a call or e-mail.

Katz, Richard↗

Programmable Logic Application Notes

This column will be provided each quarter as a source for reliability, radiation results, NASA capabilities, and other information on programmable logic devices and related applications. This quarter's column will include some announcements and some recent radiation test results and evaluations of interest. Specifically, the following topics will be covered: the Military and Aerospace Applications of Programmable Devices and Technologies Conference to be held at GSFC in September, 1998, proton test results, and some total dose results.

Katz, Richard↗

Programmable Logic Application Notes

This column will be provided each quarter as a source for reliability, radiation results, NASA capabilities, and other information on programmable logic devices and related applications. This quarter will start a series of notes concentrating on analysis techniques with this issues section discussing worst-case analysis requirements.

Katz, Richard↗

Programmable Logic Application Notes

This report will be provided each quarter as a source for reliability, radiation results, NASA capabilities, and other information on programmable logic devices and related applications. This quarter will continue a series of notes concentrating on analysis techniques with this issue's section discussing the use of Root-Sum-Square calculations for digital delays.

Katz, Richard↗

Programmable Logic Application Notes

This column will be provided each quarter as a source for reliability, radiation results, NASA capabilities, and other information on programmable logic devices and related applications. This quarter will continue a series of notes concentrating on analysis techniques with this issue's section discussing: Digital Timing Analysis Tools and Techniques. Articles in this issue include: SX and SX-A Series Devices Power Sequencing; JTAG and SXISX-AISX-S Series Devices; Analysis Techniques (i.e., notes on digital timing analysis tools and techniques); Status of the Radiation Hard reconfigurable Field Programmable Gate Array Program, Input Transition Times; Apollo Guidance Computer Logic Study; RT54SX32S Prototype Data Sets; A54SX32A - 0.22 micron/UMC Test Results; Ramtron FM1608 FRAM; and Analysis of VHDL Code and Synthesizer Output.

Katz, Richard↗

Statistical Modeling for Radiation Hardness Assurance

We cover the models and statistics associated with single event effects (and total ionizing dose), why we need them, and how to use them: What models are used, what errors exist in real test data, and what the model allows us to say about the DUT will be discussed. In addition, how to use other sources of data such as historical, heritage, and similar part and how to apply experience, physics, and expert opinion to the analysis will be covered. Also included will be concepts of Bayesian statistics, data fitting, and bounding rates.

Hardness Assurance↗

Space Radiation Effects and Reliability Consideration for the Proposed Jupiter Europa Orbiter

The proposed Jupiter Europa Orbiter (JEO) mission to explore the Jovian moon Europa poses a number of challenges. The spacecraft must operate for about seven years during the transit time to the vicinity of Jupiter, and then endure unusually high radiation levels during exploration and orbiting phases. The ability to withstand usually high total dose levels is critical for the mission, along with meeting the high reliability standards for flagship NASA missions. Reliability of new microelectronic components must be sufficiently understood to meet overall mission requirements.The proposed Jupiter Europa Orbiter (JEO) mission to explore the Jovian moon Europa poses a number of challenges. The spacecraft must operate for about seven years during the transit time to the vicinity of Jupiter, and then endure unusually high radiation levels during exploration and orbiting phases. The ability to withstand usually high total dose levels is critical for the mission, along with meeting the high reliability standards for flagship NASA missions. Reliability of new microelectronic components must be sufficiently understood to meet overall mission requirements.

semiconductor devices↗

Space Radiation Effects on SiC Power Device Reliability

Heavy-ion radiation can result in silicon carbide power device degradation and/or catastrophic failure. Test procedures and data interpretation must consider the impact that heavy-ion induced off-state leakage current increases will have on subsequent single-event effect susceptibility and testability. On orbit, reliable performance in the presence of increased off-state leakage currents due to cumulative ion-induced non-catastrophic single-event effects must be assured over the mission lifetime. This work presents a large body of heavy-ion test data for different diode, power MOSFET, and JFET devices. Susceptibility to single-event effects is compared between SiC and Si power devices. Initial recommendations on heavy-ion radiation test methods for silicon carbide power devices are made and radiation hardness assurance is discussed with the goal of moving one step closer to reliably getting this technology off the ground into a broad array of spacecraft and instruments that will benefit from its unique capabilities.

diode↗

Reliability Characterization of TaOx-Based Commercial ReRAM in Combination with Radiation

We present reliability data combined with total dose gamma radiation for one of the first commercially available resistive memory devices. These Tantalum Oxide (TaOX)-based resistive memory chips demonstrate operation in dynamic program and erase testing up to ~130 Krad(Si) of 60Co gamma dose. In static and unbiased conditions, the stored data in the memory cells were able to withstand up to 50Mrad(Si) of exposure. The access circuitry, though, seemed less robust to gamma radiation and was able to operate only up to a total dose of 3Mrad(Si). Post exposure reliability as indicated by endurance, cycling error rate, and data retention tests showed no detectable impact from the combination with prior gamma irradiation. Overall, the total dose radiation tolerance of the commercial TaOx-based resistive memory chip appears to be higher than flash memory chips and in agreement with prior tests conducted with single cell resistive memories.

total ionizing dose↗

Structure and Early Soot Oxidation Properties of Laminar Diffusion Flames

Soot is an important unsolved problem of combustion science because it is present in most hydrocarbon-fueled flames and current understanding of the reactive and physical properties of soot in flame environments is limited. This lack of understanding affects progress toward developing reliable predictions of flame radiation properties, reliable predictions of flame pollutant emission properties and reliable methods of computational combustion, among others. Motivated by these observations, the present investigation extended past studies of soot formation in this laboratory, to consider soot oxidation in laminar diffusion flames using similar methods. Early work showed that O2 was responsible for soot oxidation in high temperature O2-rich environments. Subsequent work in high temperature flame environments having small O2 concentrations, however, showed that soot oxidation rates substantially exceeded estimates based on the classical O2 oxidation rates of Nagle and Strickland-Constable and suggests that radicals such as O and OH might be strong contributors to soot oxidation for such conditions. Neoh et al. subsequently made observations in premixed flames, supported by later work, that showed that OH was responsible for soot oxidation at these conditions with a very reasonable collision efficiency of 0.13. Subsequent studies in diffusion flames, however, were not in agreement with the premixed flame studies: they agreed that OH played a dominant role in soot oxidation in flames, but found collision efficiencies that varied with flame conditions and were not in good agreement with each other or with Neoh et al. One explanation for these discrepancies is that optical scattering and extinction properties were used to infer soot structure properties for the studies that have not been very successful for representing the optical properties of soot. Whatever the source of the problem, however, these differences among observations of soot oxidation in premixed and diffusion flames clearly must be resolved. Motivated by these findings, the present study undertook measurements of soot and flame properties within the soot oxidation region of some typical laminar diffusion flames and exploited the new measurements to identify soot oxidation mechanisms for these conditions. Present considerations were limited to the early stages of soot oxidation (carbon consumption less than 70%) where reactions at the surface of primary soot particles dominate the process, rather than the later stages when particle porosity and internal particle oxidation become important as discussed by Neoh et al.

El-Leathy, A. M.↗