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NASA NTRS ยท 20140008964

Statistical Modeling for Radiation Hardness Assurance

Abstract

We cover the models and statistics associated with single event effects (and total ionizing dose), why we need them, and how to use them: What models are used, what errors exist in real test data, and what the model allows us to say about the DUT will be discussed. In addition, how to use other sources of data such as historical, heritage, and similar part and how to apply experience, physics, and expert opinion to the analysis will be covered. Also included will be concepts of Bayesian statistics, data fitting, and bounding rates.

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BibTeXRIS

Ladbury, Raymond L.. 2014-05-09. Statistical Modeling for Radiation Hardness Assurance. https://ntrs.nasa.gov/citations/20140008964

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