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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 343 records · Page 19
All sourcesNASA NTRSDOE OSTI
DOE OSTI2024

Assessing the Reliability Benefits of Energy Storage as a Transmission Asset

Utilizing energy storage solutions to reduce the need for traditional transmission investments has been recognized by system planners and supported by federal policies in recent years. This work demonstrates the need for detailed reliability assessment for quantitative comparison of the reliability benefits of energy storage and traditional transmission investments. First, a mixed-integer linear programming expansion planning model considering candidate transmission lines and storage technologies is solved to find the least-cost investment decisions. Next, operations under the resulting system configuration are simulated in a probabilistic reliability assessment which accounts for weather-dependent forced outages. The outcome of this work, when applied to TPPs, is to further equalize the consideration of energy storage compared to traditional transmission assets by capturing the value of storage for system reliability.

co-optimization↗
DOE OSTI2024

Inferring Reliability Model Parameters from Expert Opinion

Here, we propose a method for constructing bathtub models of reliability from opinion. The method is intended for reliability studies early in the design and prototyping of a new system, before data concerning reliability has become available. A stylized bathtub curve is presented for soliciting best engineering judgement from technical experts. By pooling these stylized curves, we produce data that can be used to infer parameters for a piece-wise Weibull model of reliability. A numerical example demonstrates the practicality of the method while also highlighting potential pitfalls when working with subjective data.

42 ENGINEERING↗
DOE OSTI2021

Charting a Path for Research and Development of Reliability and Resilience in South Asia's Power Sector

The power sector in South Asia faces several trends with the potential to impact its reliability and resilience. Rapidly increasing demand, coupled with an increasing reliance on variable renewable resources and the circular linkages with climate change points to an increasing need to understand the extent of climate impacts on both the electricity load and the electricity generation. These larger shifts are also coupled with opportunities near the grid edge that could have a large impact on system planning and operations, such as electrification of the transport sector, increased reliance on buildings to serve a broader set of loads and be flexible resources for utilities, more efficient use of industrial and agricultural loads, and growth in distributed energy resources such as rooftop solar and batteries. It is critical that as this transformation takes place that expectations for reliability and resilience of the grid continue to increase in the region. The South Asia Group for Energy (SAGE), composed of USAID, the US Department of Energy, and three national laboratories, has been tasked with providing an overview of the research and development resources necessary to understand the upcoming challenges for the power system as it pertains to reliability and resilience. This discussion paper identifies some of the key trends and connections that are important for power sector reliability and resilience and provides a starting point for eliciting feedback from power sector stakeholders about their experiences and needs.

24 POWER TRANSMISSION AND DISTRIBUTION↗
DOE OSTI2023

Solar Uncertainty Management and Mitigation for Exceptional Reliability in Grid Operations (SUMMER-GO): Project Final Report

The Solar Uncertainty Management and Mitigation for Exceptional Reliability in Grid Operation (SUMMER-GO) project was recently completed through a collaboration among the National Renewable Energy Laboratory, Maxar, the Electric Reliability Council of Texas (ERCOT), the University of Texas at Dallas, the University of California Berkeley, and the University of Colorado Boulder. The project made significant advances in probabilistic solar power forecasting, both through the development of Bayesian model averaging methods for ensemble forecasting and in bringing these and other advancements into practice with Maxar's delivery of operational forecasts to ERCOT. In addition to creating more reliable solar power forecasts, the project developed methods for their utilization in power system operations. These include the development of risk-aware unit commitment and economic dispatch algorithms and methods to reformulate probabilistic forecasts to be used in these power system operational models. Dynamic power system reserve methods were also developed, which have been shown in silico to create economic savings and reliability improvements on an ERCOT-like system as well as financial savings in the ERCOT system through more granular consideration of the uncertainty associated with solar power forecasts. Finally, a situational awareness tool to help grid operators better understand solar power forecast uncertainty in daily operations was developed and extensively vetted.

14 SOLAR ENERGY↗
DOE OSTI2024

Simulator Data Analysis to Inform Digitalized Environment Impacts on Human Reliability

The U.S. Nuclear Regulatory Commission (NRC) has developed a human reliability analysis (HRA) method, termed the Integrated Human Event Analysis System for Event and Condition Assessment (IDHEAS-ECA), in order to estimate human error probabilities (HEPs) in risk-informed regulatory applications. To update the quantification part of IDHEAS-ECA, the NRC required human performance and error data from fully digitalized main control rooms (MCRs); therefore, it requested that Idaho National Laboratory (INL) revisit previous data collection studies and investigate how the following three factors impact human reliability: self-checking, peer-checking, and automation. The HRA data collection studies revisited were the Human Reliability Data Extraction (HuREX) project, developed by the Korea Atomic Energy Research Institute (KAERI), and the Simplified Human Error Experimental Program (SHEEP), developed by INL. HuREX is a representative HRA data collection study that collects human reliability data from full-scope simulators staffed by licensed operators. SHEEP, on the other hand, has been proposed to complement such full-scope studies by collecting data via simplified simulators staffed by non-licensed student operators. In the HuREX study, KAERI collected HRA data from fully digitalized MCRs for the Advanced Power Reactor (APR)–1400. The SHEEP data were obtained from simplified simulators that partially mimicked the features of digitalized MCRs. The present report mainly discusses how the impacts of the aforementioned three factors on human errors were derived from these two data collection studies.

99 GENERAL AND MISCELLANEOUS↗
NASA NTRS1990

Generation and analysis of large reliability models

An effort has been underway for several years at NASA's Langley Research Center to extend the capability of Markov modeling techniques for reliability analysis to the designers of highly reliable avionic systems. This effort has been focused in the areas of increased model abstraction and increased computational capability. The reliability model generator (RMG), a software tool which uses as input a graphical, object-oriented block diagram of the system, is discussed. RMG uses an automated failure modes-effects analysis algorithm to produce the reliability model from the graphical description. Also considered is the ASSURE software tool, a parallel processing program which uses the ASSIST modeling language and SURE semi-Markov solution technique. An executable failure modes-effects analysis is used by ASSURE. The successful combination of the power of graphical representation, automated model generation, and parallel computation leads to the conclusion that large system architectures can now be analyzed.

Aerospace electronics↗
NASA NTRS2005

An Ultra Reliability for Project for NASA

NASA has embarked on a new program designed to improve the reliability of NASA systems. In this context, the goal for ultra reliability is to ultimately improve the systems by an order of magnitude. The approach outlined in this presentation involves five steps: 1. Divide NASA systems into seven sectors; 2. Establish sector champions and representatives from each NASA center; 3. Develop a challenge list for each sector using a team of NASA experts in each area with the sector champion facilitating the effort; 4. Develop mitigation strategies for each of the sectors' challenge lists and rank their importance by holding a workshop with area experts from government (NASA and non-NASA), universities and industry; 5. Develop a set of tasks for each sector in order of importance for improving the reliability of NASA systems. Several NASA-wide workshops have been held, identifying issues for reliability improvement and providing mitigation strategies for these issues.

ultra-reliability↗
NASA NTRS2008

Column Grid Array Rework for High Reliability

Due to requirements for reduced size and weight, use of grid array packages in space applications has become common place. To meet the requirement of high reliability and high number of I/Os, ceramic column grid array packages (CCGA) were selected for major electronic components used in next MARS Rover mission (specifically high density Field Programmable Gate Arrays). ABSTRACT The probability of removal and replacement of these devices on the actual flight printed wiring board assemblies is deemed to be very high because of last minute discoveries in final test which will dictate changes in the firmware. The questions and challenges presented to the manufacturing organizations engaged in the production of high reliability electronic assemblies are, Is the reliability of the PWBA adversely affected by rework (removal and replacement) of the CGA package? and How many times can we rework the same board without destroying a pad or degrading the lifetime of the assembly? To answer these questions, the most complex printed wiring board assembly used by the project was chosen to be used as the test vehicle, the PWB was modified to provide a daisy chain pattern, and a number of bare PWB s were acquired to this modified design. Non-functional 624 pin CGA packages with internal daisy chained matching the pattern on the PWB were procured. The combination of the modified PWB and the daisy chained packages enables continuity measurements of every soldered contact during subsequent testing and thermal cycling. Several test vehicles boards were assembled, reworked and then thermal cycled to assess the reliability of the solder joints and board material including pads and traces near the CGA. The details of rework process and results of thermal cycling are presented in this paper.

high reliability↗
NASA NTRS2011

Users Guide on Scaled CMOS Reliability: NASA Electronic Parts and Packaging (NEPP) Program Office of Safety and Mission Assurance

Reliability of advanced CMOS technology is a complex problem that is usually addressed from the standpoint of specific failure mechanisms rather than overall reliability of a finished microcircuit. A detailed treatment of CMOS reliability in scaled devices can be found in Ref. 1; it should be consulted for a more thorough discussion. The present document provides a more concise treatment of the scaled CMOS reliability problem, emphasizing differences in the recommended approach for these advanced devices compared to that of less aggressively scaled devices. It includes specific recommendations that can be used by flight projects that use advanced CMOS. The primary emphasis is on conventional memories, microprocessors, and related devices.

Scaled CMOS↗
NASA NTRS2011

Space Radiation Effects and Reliability Consideration for the Proposed Jupiter Europa Orbiter

The proposed Jupiter Europa Orbiter (JEO) mission to explore the Jovian moon Europa poses a number of challenges. The spacecraft must operate for about seven years during the transit time to the vicinity of Jupiter, and then endure unusually high radiation levels during exploration and orbiting phases. The ability to withstand usually high total dose levels is critical for the mission, along with meeting the high reliability standards for flagship NASA missions. Reliability of new microelectronic components must be sufficiently understood to meet overall mission requirements.The proposed Jupiter Europa Orbiter (JEO) mission to explore the Jovian moon Europa poses a number of challenges. The spacecraft must operate for about seven years during the transit time to the vicinity of Jupiter, and then endure unusually high radiation levels during exploration and orbiting phases. The ability to withstand usually high total dose levels is critical for the mission, along with meeting the high reliability standards for flagship NASA missions. Reliability of new microelectronic components must be sufficiently understood to meet overall mission requirements.

semiconductor devices↗
NASA NTRS2011

Optimized Biasing of Pump Laser Diodes in a Highly Reliable Metrology Source for Long-Duration Space Missions

Optical metrology system reliability during a prolonged space mission is often limited by the reliability of pump laser diodes. We developed a metrology laser pump module architecture that meets NASA SIM Lite instrument optical power and reliability requirements by combining the outputs of multiple single-mode pump diodes in a low-loss, high port count fiber coupler. We describe Monte-Carlo simulations used to calculate the reliability of the laser pump module and introduce a combined laser farm aging parameter that serves as a load-sharing optimization metric. Employing these tools, we select pump module architecture, operating conditions, biasing approach and perform parameter sensitivity studies to investigate the robustness of the obtained solution.

808 mm diode pumps↗
NASA NTRS2014

A General Reliability Model for Ni-BaTiO3-Based Multilayer Ceramic Capacitors

The evaluation of multilayer ceramic capacitors (MLCCs) with Ni electrode and BaTiO3 dielectric material for potential space project applications requires an in-depth understanding of their reliability. A general reliability model for Ni-BaTiO3 MLCC is developed and discussed. The model consists of three parts: a statistical distribution; an acceleration function that describes how a capacitor's reliability life responds to the external stresses, and an empirical function that defines contribution of the structural and constructional characteristics of a multilayer capacitor device, such as the number of dielectric layers N, dielectric thickness d, average grain size, and capacitor chip size A. Application examples are also discussed based on the proposed reliability model for Ni-BaTiO3 MLCCs.

statistical modeling↗
NASA NTRS2014

A General Reliability Model for Ni-BaTiO3-Based Multilayer Ceramic Capacitors

The evaluation for potential space project applications of multilayer ceramic capacitors (MLCCs) with Ni electrode and BaTiO3 dielectric material requires an in-depth understanding of the MLCCs reliability. A general reliability model for Ni-BaTiO3 MLCCs is developed and discussed in this paper. The model consists of three parts: a statistical distribution; an acceleration function that describes how a capacitors reliability life responds to external stresses; and an empirical function that defines the contribution of the structural and constructional characteristics of a multilayer capacitor device, such as the number of dielectric layers N, dielectric thickness d, average grain size r, and capacitor chip size A. Application examples are also discussed based on the proposed reliability model for Ni-BaTiO3 MLCCs.

statistical modeling↗
NASA NTRS2016

Verification of Triple Modular Redundancy (TMR) Insertion for Reliable and Trusted Systems

We propose a method for TMR insertion verification that satisfies the process for reliable and trusted systems. If a system is expected to be protected using TMR, improper insertion can jeopardize the reliability and security of the system. Due to the complexity of the verification process, there are currently no available techniques that can provide complete and reliable confirmation of TMR insertion. This manuscript addresses the challenge of confirming that TMR has been inserted without corruption of functionality and with correct application of the expected TMR topology. The proposed verification method combines the usage of existing formal analysis tools with a novel search-detect-and-verify tool. Field programmable gate array (FPGA),Triple Modular Redundancy (TMR),Verification, Trust, Reliability,

Trust↗
NASA NTRS2016

Reliable Design Versus Trust

This presentation focuses on reliability and trust for the users portion of the FPGA design flow. It is assumed that the manufacturer prior to hand-off to the user tests FPGA internal components. The objective is to present the challenges of creating reliable and trusted designs. The following will be addressed: What makes a design vulnerable to functional flaws (reliability) or attackers (trust)? What are the challenges for verifying a reliable design versus a trusted design?

Field Programmable Gate Aray (FPGA)↗
NASA NTRS2018

Large Satellite Bus Reliability

NASA is proposing to build a small space station in Cis-lunar orbit called Deep Space Gateway (DSG). At the heart of the DSG is the Power and Propulsion Element (PPE) which is conceptually similar to previously designed and operated satellite buses. A satellite bus is composed of the satellite spacecraft infrastructure minus the payload, and generally includes power, propulsion, avionics, and guidance, navigation and control. In November of 2017, five companies were awarded contracts by NASA to research PPE designs. In order to better understand the reliability of large satellite buses which may be the starting point of the PPE, NASA used Weibull analysis to evaluate spacecraft with similar masses and design life to the PPE. In addition, a subset of the large satellites which had satellite buses manufactured by any one of the five companies was also evaluated. This paper provides the results of the reliability analysis and compares the reliability of the general population of large satellites to the reliability associated with large satellite buses manufactured by the five companies currently studying PPE options.

Bus↗
NASA NTRS2019

Achieving Improved Reliability with Failure Analysis

Reliability is the ability of a product to properly function, within specified performance limits, for a specified period of time, under the life cycle application conditions. Failure analysis is a vital tool in the effort to ensure reliability of electronic products and systems throughout their product lifecycle. Today, organizations involved in activities within the electronics supply chain are facing new challenges, not just from complex assembly styles, harsher lifecycle environments, and sophisticated supply chains, but also from customers who are demanding a quicker turn-around. Unfortunately, root cause failure analysis is often performed incompletely, leading to a poor understanding of failure mechanisms and causes and, customer dissatisfaction due to recurring failures. The PDC (Professional Development Course) starts with an introduction to reliability concepts, physics of failure and an overview of failure mechanisms that affect PCBs (Printed Circuit Boards), PCBAs (Printed Circuit Board Assembly) and components. The PDC then dives into root cause hypothesizing techniques (Pareto, FMEA (Failure Modes and Effects Analysis), fishbone (Cause-And-Effect Diagram), FTA (Fault Tree Analysis)), non-destructive and destructive analysis and, materials characterization will be discussed. Numerous failure analysis case studies will be used to illustrate the techniques and analysis principles to arrive at the root cause(s) of field failures on printed circuit boards, active components, and assemblies. What Attendees will Learn: Topics include: Overview of Reliability Concepts Failure mechanisms of electronic products Root cause analysis Failure analysis techniques -Non-destructive techniques (optical, CSAM (Confocal Scanning Electron Microscopy) etc.) -Destructive analysis (DPA (Destructive Physical Analysis), Decap (Decapsulation), FIB (Focused Ion Beam) etc.) -Materials characterization (XRF (X-Ray Fluorescence) , EDS (Error Detection Sequential), TMA/DSC (Thermal Mechanical Analysis/Differential Scanning Calorimetry) etc.)

PCB quality↗
NASA NTRS2022

NASA Physics of Failure (PoF) for Reliability

An item’s reliability or longevity is dependent not only on its design but also on how it is used, manufactured, tested, and the stresses it has or will experience. Stresses include operational and environmental exposures to thermal, voltage, current, age/exposure, mechanical, and radiation mechanisms. Therefore, in reliability analysis, it is important to consider the contributions of all of these factors when predicting the failure rates of components. Historically, there has been a reliance on handbook data (e.g., MIL-HDBK-217), but experience has shown that these values and distributions are not representative of actual performance (1,2). Therefore, to make more credible reliability and risk assessments for its missions, NASA must transition to estimating likelihoods of failure based on an item’s reliability/longevity factors (or the physical susceptibilities and strengths impacting the design’s performance) has or will experience, whenever possible. To facilitate this transition a “Handbook on Methodology for Physics of Failure Based Reliability Assessments” has been developed by NASA to assist in applying physics experiences or experiment physics for empirical analysis and conceptualized physics exposures or theoretical physics for deterministic analysis, to develop and aggregate realistic likelihoods of failure leading to more credible forecasts of item performance and longevity. In addition, since it is NASA’s intention that this document continues to evolve based on community lessons learned and the introduction of new assessment methodologies, NASA is encouraging and appreciates the contributions of current and future authors to maintain and enhance this handbook and its supporting case studies.

Physics of Failure↗