Engineering Papers⌕ Search

SEARCH · Engineering Papers

Results for “high reliability”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 289 records · Page 16
All sourcesNASA NTRSDOE OSTI
DOE OSTI2014

State recovery and lockstep execution restart in a system with multiprocessor pairing

System, method and computer program product for a multiprocessing system to offer selective pairing of processor cores for increased processing reliability. A selective pairing facility is provided that selectively connects, i.e., pairs, multiple microprocessor or processor cores to provide one highly reliable thread (or thread group). Each paired microprocessor or processor cores that provide one highly reliable thread for high-reliability connect with a system components such as a memory "nest" (or memory hierarchy), an optional system controller, and optional interrupt controller, optional I/O or peripheral devices, etc. The memory nest is attached to a selective pairing facility via a switch or a bus. Each selectively paired processor core is includes a transactional execution facility, whereing the system is configured to enable processor rollback to a previous state and reinitialize lockstep execution in order to recover from an incorrect execution when an incorrect execution has been detected by the selective pairing facility.

97 MATHEMATICS AND COMPUTING↗
DOE OSTI2014

Multiprocessor switch with selective pairing

System, method and computer program product for a multiprocessing system to offer selective pairing of processor cores for increased processing reliability. A selective pairing facility is provided that selectively connects, i.e., pairs, multiple microprocessor or processor cores to provide one highly reliable thread (or thread group). Each paired microprocessor or processor cores that provide one highly reliable thread for high-reliability connect with a system components such as a memory "nest" (or memory hierarchy), an optional system controller, and optional interrupt controller, optional I/O or peripheral devices, etc. The memory nest is attached to a selective pairing facility via a switch or a bus

97 MATHEMATICS AND COMPUTING↗
NASA NTRS1986

A cascaded coding scheme for error control and its performance analysis

A coding scheme for error control in data communication systems is investigated. The scheme is obtained by cascading two error correcting codes, called the inner and the outer codes. The error performance of the scheme is analyzed for a binary symmetric channel with bit error rate epsilon < 1/2. It is shown that, if the inner and outer codes are chosen properly, extremely high reliability can be attained even for a high channel bit error rate. Various specific example schemes with inner codes ranging from high rates to very low rates and Reed-Solomon codes are considered, and their probabilities are evaluated. They all provide extremely high reliability even for very high bit error rates, say 0.1 to 0.01. Several example schemes are being considered by NASA for satellite and spacecraft down link error control.

Lin, S.↗
NASA NTRS1986

A cascaded coding scheme for error control and its performance analysis

A coding scheme is investigated for error control in data communication systems. The scheme is obtained by cascading two error correcting codes, called the inner and outer codes. The error performance of the scheme is analyzed for a binary symmetric channel with bit error rate epsilon <1/2. It is shown that if the inner and outer codes are chosen properly, extremely high reliability can be attained even for a high channel bit error rate. Various specific example schemes with inner codes ranging form high rates to very low rates and Reed-Solomon codes as inner codes are considered, and their error probabilities are evaluated. They all provide extremely high reliability even for very high bit error rates. Several example schemes are being considered by NASA for satellite and spacecraft down link error control.

Lin, Shu↗
DOE OSTI2015

Scheduler for multiprocessor system switch with selective pairing

System, method and computer program product for scheduling threads in a multiprocessing system with selective pairing of processor cores for increased processing reliability. A selective pairing facility is provided that selectively connects, i.e., pairs, multiple microprocessor or processor cores to provide one highly reliable thread (or thread group). The method configures the selective pairing facility to use checking provide one highly reliable thread for high-reliability and allocate threads to corresponding processor cores indicating need for hardware checking. The method configures the selective pairing facility to provide multiple independent cores and allocate threads to corresponding processor cores indicating inherent resilience.

97 MATHEMATICS AND COMPUTING↗
DOE OSTI2015

Reliable and redundant FPGA based read-out design in the ATLAS TileCal Demonstrator

The Tile Calorimeter at ATLAS [1] is a hadron calorimeter based on steel plates and scintillating tiles read out by PMTs. The current read-out system uses standard ADCs and custom ASICs to digitize and temporarily store the data on the detector. However, only a subset of the data is actually read out to the counting room. The on-detector electronics will be replaced around 2023. To achieve the required reliability the upgraded system will be highly redundant. Here the ASICs will be replaced with Kintex-7 FPGAs from Xilinx. This, in addition to the use of multiple 10 Gbps optical read-out links, will allow a full read-out of all detector data. Due to the higher radiation levels expected when the beam luminosity is increased, opportunities for repairs will be less frequent. The circuitry and firmware must therefore be designed for sufficiently high reliability using redundancy and radiation tolerant components. Within a year, a hybrid demonstrator including the new readout system will be installed in one slice of the ATLAS Tile Calorimeter. This will allow the proposed upgrade to be thoroughly evaluated well before the planned 2023 deployment in all slices, especially with regard to long term reliability. Different firmware strategies alongside with their integration in the demonstrator are presented in the context of high reliability protection against hardware malfunction and radiation induced errors.

ATLAS↗
DOE OSTI2013

MID-INFRARED SELECTION OF ACTIVE GALACTIC NUCLEI WITH THE WIDE-FIELD INFRARED SURVEY EXPLORER. II. PROPERTIES OF WISE-SELECTED ACTIVE GALACTIC NUCLEI IN THE NDWFS BOOeTES FIELD

Stern et al. presented a study of Wide-field Infrared Survey Explorer (WISE) selection of active galactic nuclei (AGNs) in the 2 deg{sup 2} COSMOS field, finding that a simple criterion W1-W2 {>=} 0.8 provides a highly reliable and complete AGN sample for W2 < 15.05, where the W1 and W2 passbands are centered at 3.4 {mu}m and 4.6 {mu}m, respectively. Here we extend this study using the larger 9 deg{sup 2} NOAO Deep Wide-Field Survey Booetes field which also has considerably deeper WISE observations than the COSMOS field, and find that this simple color cut significantly loses reliability at fainter fluxes. We define a modified selection criterion combining the W1-W2 color and the W2 magnitude to provide highly reliable or highly complete AGN samples for fainter WISE sources. In particular, we define a color-magnitude cut that finds 130 {+-} 4 deg{sup -2} AGN candidates for W2 < 17.11 with 90% reliability. Using the extensive UV through mid-IR broadband photometry available in this field, we study the spectral energy distributions of WISE AGN candidates. We find that, as expected, the WISE AGN selection can identify highly obscured AGNs, but that it is biased toward objects where the AGN dominates the bolometric luminosity output. We study the distribution of reddening in the AGN sample and discuss a formalism to account for sample incompleteness based on the step-wise maximum-likelihood method of Efstathiou et al. The resulting dust obscuration distributions depend strongly on AGN luminosity, consistent with the trend expected for a receding torus. At L{sub AGN} {approx} 3 Multiplication-Sign 10{sup 44} erg s{sup -1}, 29% {+-} 7% of AGNs are observed as Type 1, while at {approx}4 Multiplication-Sign 10{sup 45} erg s{sup -1} the fraction is 64% {+-} 13%. The distribution of obscuration values suggests that dust in the torus is present as both a diffuse medium and in optically thick clouds.

79 ASTRONOMY AND ASTROPHYSICS↗
DOE OSTI2015

PV Systems Reliability Final Technical Report.

The continued exponential growth of photovoltaic technologies paves a path to a solar-powered world, but requires continued progress toward low-cost, high-reliability, high-performance photovoltaic (PV) systems. High reliability is an essential element in achieving low-cost solar electricity by reducing operation and maintenance (O&M) costs and extending system lifetime and availability, but these attributes are difficult to verify at the time of installation. Utilities, financiers, homeowners, and planners are demanding this information in order to evaluate their financial risk as a prerequisite to large investments. Reliability research and development (R&D) is needed to build market confidence by improving product reliability and by improving predictions of system availability, O&M cost, and lifetime. This project is focused on understanding, predicting, and improving the reliability of PV systems. The two areas being pursued include PV arc-fault and ground fault issues, and inverter reliability.

14 SOLAR ENERGY↗
NASA NTRS2010

Scaled CMOS Technology Reliability Users Guide

The desire to assess the reliability of emerging scaled microelectronics technologies through faster reliability trials and more accurate acceleration models is the precursor for further research and experimentation in this relevant field. The effect of semiconductor scaling on microelectronics product reliability is an important aspect to the high reliability application user. From the perspective of a customer or user, who in many cases must deal with very limited, if any, manufacturer's reliability data to assess the product for a highly-reliable application, product-level testing is critical in the characterization and reliability assessment of advanced nanometer semiconductor scaling effects on microelectronics reliability. A methodology on how to accomplish this and techniques for deriving the expected product-level reliability on commercial memory products are provided.Competing mechanism theory and the multiple failure mechanism model are applied to the experimental results of scaled SDRAM products. Accelerated stress testing at multiple conditions is applied at the product level of several scaled memory products to assess the performance degradation and product reliability. Acceleration models are derived for each case. For several scaled SDRAM products, retention time degradation is studied and two distinct soft error populations are observed with each technology generation: early breakdown, characterized by randomly distributed weak bits with Weibull slope (beta)=1, and a main population breakdown with an increasing failure rate. Retention time soft error rates are calculated and a multiple failure mechanism acceleration model with parameters is derived for each technology. Defect densities are calculated and reflect a decreasing trend in the percentage of random defective bits for each successive product generation. A normalized soft error failure rate of the memory data retention time in FIT/Gb and FIT/cm2 for several scaled SDRAM generations is presented revealing a power relationship. General models describing the soft error rates across scaled product generations are presented. The analysis methodology may be applied to other scaled microelectronic products and their key parameters.

Microelectronics Reliability↗
NASA NTRS2001

Highly Survivable Avionics Systems for Long-Term Deep Space Exploration

The design of highly survivable avionics systems for long-term (> 10 years) exploration of space is an essential technology for all current and future missions in the Outer Planets roadmap. Long-term exposure to extreme environmental conditions such as high radiation and low-temperatures make survivability in space a major challenge. Moreover, current and future missions are increasingly using commercial technology such as deep sub-micron (0.25 microns) fabrication processes with specialized circuit designs, commercial interfaces, processors, memory, and other commercial off the shelf components that were not designed for long-term survivability in space. Therefore, the design of highly reliable, and available systems for the exploration of Europa, Pluto and other destinations in deep-space require a comprehensive and fresh approach to this problem. This paper summarizes work in progress in three different areas: a framework for the design of highly reliable and highly available space avionics systems, distributed reliable computing architecture, and Guarded Software Upgrading (GSU) techniques for software upgrading during long-term missions. Additional information is contained in the original extended abstract.

Alkalai, L.↗
NASA NTRS2024

Preliminary Measurements of Partial Discharge Inception Voltage Degradation with Constant Temperature Aging of Magnet Wire Twisted Pairs for Electric Aircraft Motors

Electric aircraft require high reliability electric motors to meet the stringent safety standards of the aviation industry. Motor winding insulation lifetime and reliability models for electric aircraft applications are needed to enable design of high reliability and high-performance electric motors for aviation applications. Three primary stresses effect the lifetime of motor winding insulation: thermochemical, mechanical, and electrical. This paper presents preliminary experiments on twisted pairs of magnet wire targeting understanding the thermo-chemical degradation of motor winding insulation through constant temperature thermal aging. Three types of magnet wire twisted pairs where tested: polyimide insulated magnet wire, epoxy coated polyimide insulated magnet wire, and epoxy potted polyimide magnet wire. The degradation of the samples over time at temperature was tracked using partial discharge inception voltage measurements. These initial experiments were used for development of procedures and expertise in partial discharge testing and thermo-chemical aging to inform future testing. The preliminary nature of these experiments should be noted when viewing the results. Lessons learned from the experiments are documented.

Thomas Tallerico↗
DOE OSTI2025

Automatic Generation of Algorithms for High-Speed Reliable Lossy Data Compression (Final Report)

Fast reliable data compression is urgently needed for many leading-edge scientific instruments and for exascale high-performance computing applications because they produce vast amounts of data at extremely high rates. The goal of this project has been to develop a framework named LC that is able to automatically generate high-speed lossless and reliable lossy compression and decompression algorithms that can be customized for different kinds of data. The resulting LC framework is freely available on GitHub. To achieve high-speed operation, LC outputs optimized and parallelized CPU and GPU implementations of the generated algorithms. To ensure the quality of lossily compressed data, LC guarantees the user-provided error bound. To be able to customize the compression algorithm to various use cases, LC can synthesize millions of different algorithms and automatically search for the one that works best for the given data. We have already employed LC to create state-of-the-art lossless and lossy compressors for scientific data as well as leading lossless compressors for images. We hope that LC and the customized, fast, reliable, and CPU/GPU-compatible compression algorithms that it can generate will greatly benefit the many scientific applications that need not only high trustworthiness but also high performance.

97 MATHEMATICS AND COMPUTING↗
NASA NTRS2009

Starship Life Support

The design and mass cost of a starship and its life support system are investigated. The mission plan for a multi generational interstellar voyage to colonize a new planet is used to describe the starship design, including the crew habitat, accommodations, and life support. Only current technology is assumed. Highly reliable life support systems can be provided with reasonably small additional mass, suggesting that they can support long duration missions. Bioregenerative life support, growing crop plants that provide food, water, and oxygen, has been thought to need less mass than providing stored food for long duration missions. The large initial mass of hydroponics systems is paid for over time by saving the mass of stored food. However, the yearly logistics mass required to support a bioregenerative system exceeds the mass of food solids it produces, so that supplying stored dehydrated food always requires less mass than bioregenerative food production. A mixed system that grows about half the food and supplies the other half dehydrated has advantages that allow it to breakeven with stored dehydrated food in about 66 years. However, moderate increases in the hydroponics system mass to achieve high reliability, such as adding spares that double the system mass and replacing the initial system every 100 years, increase the mass cost of bioregenerative life support. In this case, the high reliability half food growing, half food supplying system does not breakeven for 389 years. An even higher reliability half and half system, with three times original system mass and replacing the system every 50 years, never breaks even. Growing food for starship life support requires more mass than providing dehydrated food, even for multigeneration voyages of hundreds of years. The benefits of growing some food may justify the added mass cost. Much more efficient recycling food production is wanted but may not be possible. A single multigenerational interstellar voyage to colonize a new planet would have cost similar to that of the Apollo program. Cost is reduced if a small crew travels slowly and lands with minimal equipment. We can go to the stars!

Jones, Harry W.↗
NASA NTRS2017

Developing Reliable Life Support for Mars

A human mission to Mars will require highly reliable life support systems. Mars life support systems may recycle water and oxygen using systems similar to those on the International Space Station (ISS). However, achieving sufficient reliability is less difficult for ISS than it will be for Mars. If an ISS system has a serious failure, it is possible to provide spare parts, or directly supply water or oxygen, or if necessary bring the crew back to Earth. Life support for Mars must be designed, tested, and improved as needed to achieve high demonstrated reliability. A quantitative reliability goal should be established and used to guide development t. The designers should select reliable components and minimize interface and integration problems. In theory a system can achieve the component-limited reliability, but testing often reveal unexpected failures due to design mistakes or flawed components. Testing should extend long enough to detect any unexpected failure modes and to verify the expected reliability. Iterated redesign and retest may be required to achieve the reliability goal. If the reliability is less than required, it may be improved by providing spare components or redundant systems. The number of spares required to achieve a given reliability goal depends on the component failure rate. If the failure rate is under estimated, the number of spares will be insufficient and the system may fail. If the design is likely to have undiscovered design or component problems, it is advisable to use dissimilar redundancy, even though this multiplies the design and development cost. In the ideal case, a human tended closed system operational test should be conducted to gain confidence in operations, maintenance, and repair. The difficulty in achieving high reliability in unproven complex systems may require the use of simpler, more mature, intrinsically higher reliability systems. The limitations of budget, schedule, and technology may suggest accepting lower and less certain expected reliability. A plan to develop reliable life support is needed to achieve the best possible reliability.

life support↗
NASA NTRS1993

Expert System for UNIX System Reliability and Availability Enhancement

Highly reliable and available systems are critical to the airline industry. However, most off-the-shelf computer operating systems and hardware do not have built-in fault tolerant mechanisms, the UNIX workstation is one example. In this research effort, we have developed a rule-based Expert System (ES) to monitor, command, and control a UNIX workstation system with hot-standby redundancy. The ES on each workstation acts as an on-line system administrator to diagnose, report, correct, and prevent certain types of hardware and software failures. If a primary station is approaching failure, the ES coordinates the switch-over to a hot-standby secondary workstation. The goal is to discover and solve certain fatal problems early enough to prevent complete system failure from occurring and therefore to enhance system reliability and availability. Test results show that the ES can diagnose all targeted faulty scenarios and take desired actions in a consistent manner regardless of the sequence of the faults. The ES can perform designated system administration tasks about ten times faster than an experienced human operator. Compared with a single workstation system, our hot-standby redundancy system downtime is predicted to be reduced by more than 50 percent by using the ES to command and control the system.

Xu, Catherine Q.↗
NASA NTRS1994

A PC program to optimize system configuration for desired reliability at minimum cost

High reliability is desired in all engineered systems. One way to improve system reliability is to use redundant components. When redundant components are used, the problem becomes one of allocating them to achieve the best reliability without exceeding other design constraints such as cost, weight, or volume. Systems with few components can be optimized by simply examining every possible combination but the number of combinations for most systems is prohibitive. A computerized iteration of the process is possible but anything short of a super computer requires too much time to be practical. Many researchers have derived mathematical formulations for calculating the optimum configuration directly. However, most of the derivations are based on continuous functions whereas the real system is composed of discrete entities. Therefore, these techniques are approximations of the true optimum solution. This paper describes a computer program that will determine the optimum configuration of a system of multiple redundancy of both standard and optional components. The algorithm is a pair-wise comparative progression technique which can derive the true optimum by calculating only a small fraction of the total number of combinations. A designer can quickly analyze a system with this program on a personal computer.

Hills, Steven W.↗
DOE OSTI2013

Gearbox Reliability Collaborative High Speed Shaft Tapered Roller Bearing Calibration

The National Renewable Energy Laboratory (NREL) Gearbox Reliability Collaborative (GRC) is a project investigating gearbox reliability primarily through testing and modeling. Previous dynamometer testing focused upon acquiring measurements in the planetary section of the test gearbox. Prior to these tests, the strain gages installed on the planetary bearings were calibrated in a load frame.

17 WIND ENERGY↗