Low-Loss Thin-Film Al-On-Si Microwave Resonators for Astronomy Applications Designing and Characterizing the Next Generation of Microwave Detectors
We present measurements of prototype thin film Al microwave kinetic inductance detectors (MKIDs) intended for application in the sub-mm astronomy balloon experiment EXCLAIM. The device we show is dark, or non-optically coupled, and contains 16 coplanar waveguide (CPW) resonators etched into a 261 nm sputter deposited Al layer on a Si wafer. The resonators span the f0 = 3.5 - 4 GHz range, and include both lambda=2 and lambda=4 resonators. Each resonator is coupled to the feedline using one of three alternating coupling designs. We performed transmission line measurements of the device for a series of excitation powers ranging from -90 dBm to -30 dBm, and at a series of base temperatures ranging from 73 mK to 400 mK. We observed quality factors of up to Qi 107 at a base temperature of 73 mK. The lambda=2 and lambda=4 resonators performed similarly, achieving comparable Qi values. The results of these measurements are actively informing the fi nal design of the EXCLAIM instrument. EXCLAIM will incorporate six spectrometers, each containing an array of over 300 resonators in the 420-540 GHz range.