DOE OSTI · 3399427
Inspection of Back-Contacted Modules Using a Conductive Backsheet Approach: Cooperative Research and Development (Final Report)
Abstract
This work will focus on analysis of defects in modules fabricated using a conductive backsheet. While most defect types are known, reasonable methods for easily detecting manufactured defects are still relatively unknown.
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Kern, Dana [National Laboratory of the Rockies (NLR), Golden, CO (United States)] (ORCID:0000000308148723), Wai, Rebecca [National Laboratory of the Rockies (NLR), Golden, CO (United States)], Johnston, Steven [National Laboratory of the Rockies (NLR), Golden, CO (United States)] (ORCID:0000000333088267). 2026-07-28. Inspection of Back-Contacted Modules Using a Conductive Backsheet Approach: Cooperative Research and Development (Final Report). https://doi.org/10.66816/tp2818134
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