DOE OSTI · 2999401
Total Ionizing Dose Effects on Gallium Oxide MOSFETs
Abstract
This summary will be submitted for review for the 2025 HEART conference.
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Smith, Michael Brandon [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000186229284), Cadena, Rick [Vanderbilt University], Wilcox, Ian Zachary [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0009000764290181), Schrimpf, Ron [Vanderbilt University], Witulski, A.F. [External Affiliation], Charnas, Adam R. [AFRL], Gorsak, Cameron [AFRL], Nair, Hari [AFRL], Neal, Adam [AFRL]. 2025-04-01. Total Ionizing Dose Effects on Gallium Oxide MOSFETs. https://www.osti.gov/biblio/2999401
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