@misc{indiciaee3f0c8a3b73c,
  title = {Total Ionizing Dose Effects on Gallium Oxide MOSFETs},
  author = {Smith, Michael Brandon [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000186229284) and Cadena, Rick [Vanderbilt University] and Wilcox, Ian Zachary [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0009000764290181) and Schrimpf, Ron [Vanderbilt University] and Witulski, A.F. [External Affiliation] and Charnas, Adam R. [AFRL] and Gorsak, Cameron [AFRL] and Nair, Hari [AFRL] and Neal, Adam [AFRL]},
  year = {2025},
  url = {https://www.osti.gov/biblio/2999401},
  note = {Source identifier: 2999401}
}