DOE OSTI · 2520596
Microbead Encapsulation for Protection of Electronic Components
Abstract
Here, this study investigates the application of microbeads as an innovative encapsulation technique to protect electronic components from harsh mechanical strain. Traditional encapsulation methods using hard epoxy provide substantial mechanical support but create thermal expansion mismatch issues, potentially leading to electronic component failure. We explore the use of finely powdered microbeads to achieve protective structures combining stiffness and energy absorption. The research focuses on key variables, including microbead size, microbead roughness, compaction of microbeads, and circuit board mounting in the encapsulation, all of which influence the encapsulation’s effectiveness. Experimental setups and testing protocols were developed to assess the performance of various microbead materials under different impact conditions. Results demonstrate that microbead encapsulation significantly reduces strain on circuit boards, minimizing the risk of damage during mechanical shocks. However, challenges remain, such as optimizing microbead characteristics and modeling their behavior within large-scale circuit board assemblies. Despite these challenges, the findings suggest that microbead encapsulation offers a promising alternative to conventional methods, enhancing the durability and reliability of electronic components in high-stress environments.
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Hill, Jeffrey R. [Brigham Young Univ., Provo, UT (United States)] (ORCID:0000000184270494), Chen, Alex [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)], Wilson, Natasha Jensen [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)], Boll, Cayden [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)], O’Bannon, MeiLi [Brigham Young Univ., Provo, UT (United States)], Trentman, Dallan [Brigham Young Univ., Provo, UT (United States)]. 2025-02-04. Microbead Encapsulation for Protection of Electronic Components. https://doi.org/10.1115/1.4067650
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