Improving qubit coherence time through detailed materials analysis

Rosado Bonilla, Cristy M.; Tripathi, Malvika; Murthy, Akshay

doi:10.2172/2426487

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Improving qubit coherence time through detailed materials analysis

Rosado Bonilla, Cristy M.·Tripathi, Malvika·Murthy, Akshay

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Abstract

This study investigates the defects, imperfections, and variations in superconducting Nb thin films deposited on sapphire substrates. Two samples, W114 and W118, were fabricated using DC Magnetron Sputtering and Electron Cyclotron Resonance (ECR), respectively. Each sample was analyzed at five distinct spots to compare elemental homogeneity and thickness variations. Scanning Electron Microscopy (SEM) was employed to examine surface morphology, while Energy Dispersive X-ray Spectroscopy (EDS) and X-ray Photoelectron Spectroscopy (XPS) provided elemental and chemical state analyses. SEM revealed distinct structures in W114 and a uniform surface in W118. EDS showed higher aluminum and oxygen signals in W118, indicating a thicker film. XPS detected a higher Nb₂O₅ signal in W118, attributed to a thicker oxygen layer. These findings highlight the critical role of precise material characterization in advancing quantum computing technologies.

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Rosado Bonilla, Cristy M., Tripathi, Malvika, Murthy, Akshay. 2024-08-02. Improving qubit coherence time through detailed materials analysis. https://doi.org/10.2172/2426487

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