DOE OSTI · 1872402
Machine learning defect properties in Cd-based chalcogenides
Abstract
Impurity energy levels in the band gap can have serious consequences for a semiconductor's performance as a photovoltaic absorber. Data-driven approaches can help accelerate the prediction of point defect properties in common semiconductors, and thus lead to the identification of potential deep lying impurity states. In this work, we use density functional theory (DFT) to compute defect formation energies and charge transition levels of hundreds of impurities in CdX chalcogenide compounds, where X = Te, Se or S. We apply machine learning techniques on the DFT data and develop on-demand predictive models for the formation energy and relevant transition levels of any impurity atom in any site. The trained ML models are general and accurate enough to predict the properties of any possible point defects in any Cd-based chalcogenide, as we prove by testing on a few selected defects in mixed chalcogen compounds CdTe 0.5 Se 0.5 and CdSe 0.5 S 0.5 . The ML framework used in this work can be extended to any class of semiconductors.
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Mannodi-Kanakkithodi, Arun, Toriyama, Michael, Sen, Fatih G., Davis, Michael J., Klie, Robert F., Chan, Maria K. Y.. 2020-02-06. Machine learning defect properties in Cd-based chalcogenides. https://doi.org/10.1109/pvsc40753.2019.8981266
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