TY  - RPRT
TI  - Machine learning defect properties in Cd-based chalcogenides
AU  - Mannodi-Kanakkithodi, Arun
AU  - Toriyama, Michael
AU  - Sen, Fatih G.
AU  - Davis, Michael J.
AU  - Klie, Robert F.
AU  - Chan, Maria K. Y.
PY  - 2020
DO  - 10.1109/pvsc40753.2019.8981266
UR  - https://www.osti.gov/biblio/1872402
ID  - 1872402
ER  -