DOE OSTI · 1785709
Investigating SOFC Electrode Microstructures and Performance Degradation: A High Throughput Integrated Model
Abstract
Presented by NETL at MS&T 2019, 09/19
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Epting, William K., Mason, Jerry H., Lei, Yinkai, Ohodnicki, Paul, Abernathy, Harry, Hackett, Gregory. 2019-09-18. Investigating SOFC Electrode Microstructures and Performance Degradation: A High Throughput Integrated Model. https://www.osti.gov/biblio/1785709
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