TY  - RPRT
TI  - Investigating SOFC Electrode Microstructures and Performance Degradation: A High Throughput Integrated Model
AU  - Epting, William K.
AU  - Mason, Jerry H.
AU  - Lei, Yinkai
AU  - Ohodnicki, Paul
AU  - Abernathy, Harry
AU  - Hackett, Gregory
PY  - 2019
UR  - https://www.osti.gov/biblio/1785709
ID  - 1785709
ER  -