A deep learning based automatic defect analysis framework for In-situ TEM ion irradiations

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Shen, Mingren, Li, Guanzhao, Wu, Dongxia, Yaguchi, Yudai, Haley, Jack C., Field, Kevin G., Morgan, Dane. 2021-09-01. A deep learning based automatic defect analysis framework for In-situ TEM ion irradiations. https://doi.org/10.1016/j.commatsci.2021.110560

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