@misc{indiciaeed0e2320fa6d,
  title = {A deep learning based automatic defect analysis framework for In-situ TEM ion irradiations},
  author = {Shen, Mingren and Li, Guanzhao and Wu, Dongxia and Yaguchi, Yudai and Haley, Jack C. and Field, Kevin G. and Morgan, Dane},
  year = {2021},
  doi = {10.1016/j.commatsci.2021.110560},
  url = {https://www.osti.gov/biblio/1785288},
  note = {Source identifier: 1785288}
}