@misc{indiciaef951b74e544c,
  title = {Electron Backscatter Diffraction based Strain Analysis in the Scanning Electron Microscope.},
  author = {Wright, Stuart and Kacher, Joshua and Ruggles, Timothy},
  year = {2021},
  url = {https://www.osti.gov/biblio/1780954},
  note = {Source identifier: 1780954}
}