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Ladbury, Raymond L.

Publications and source records attributed to Ladbury, Raymond L..

At least 19 records

Radiation Single Event Effects (SEE) Impact on Complex Avionics Architecture Reliability

The NASA Engineering and Safety Center (NESC) has an urgent need to understand how system-level reliability of an avionics architecture is compromised when portions of the architecture are temporarily unavailable due to single event effects (SEE). The proposed activity parametrically evaluated these SEE impacts on system reliability based on mission duration, upset rate and recovery times for a representative redundant architecture. The key stakeholders for this study are NASA programs and projects that expect to use avionics architectures with electrical, electronic and electromechanical (EEE) parts susceptible to SEE when exposed to the mission expected radiation environment.

Hodson, Robert F.↗

Space System Verification Approach Based on MEAL and Mission Risk Posture

There is no "one size fits all" solution for verifying space avionics systems to ensure safety and mission success. This paper presents a verification approach based on MEAL and risk posture for space systems. MEAL refers to Mission, mission Environment, Application, and Lifetime of the application. In addition to the description of the verification approach, the paper also provides the awareness of the different levels of risks associated with verification tests and inspections when performed at part-, board- and box-level, and discusses the applications of the approach for flight heritage verification, commercial off the shelf (COTS) verification and radiation-effects verification.

Mission Environment Application and Lifetime (MEAL↗

Space System Verification Approach Based on MEAL and Mission Risk Posture

There is no "one size fits all" solution for verifying space avionics systems to ensure safety and mission success. This paper presents a verification approach based on MEAL and risk posture for space systems. MEAL refers to Mission, mission Environment, Application, and Lifetime of the application. In addition to the description of the verification approach, the paper also provides the awareness of the different levels of risks associated with verification tests and inspections when performed at part-, board- and box-level, and discusses the applications of the approach for flight heritage verification, commercial off the shelf (COTS) verification and radiation-effects verification.

Mission Environment Application and Lifetime (MEAL↗

Guidelines for Verification Strategies to Minimize RISK Based on Mission Environment, -Application and -Lifetime (MEAL)

There is a trend of compromising verification testing to address the cost and schedule constraints, which poses a high-risk posture for programs/projects. Current and emerging aerospace scientific and/or human exploration programs continue to pose new technological challenges. These technological challenges combined with finite budgets and truncated schedules are forcing designers, scientists, engineers, and managers to push technologies to their physical limits. In addition, budget and schedule pressures challenge how those technologies/missions are verified. A clear understanding of the different verification processes is needed to ensure the proper verification of the technology within the mission (i.e., capabilities, advantages, and limitations). The goal of verification is to prove through test, analysis, inspection, and/or demonstration that a product provides its required function while meeting the performance requirements. It is important that verification yield understanding of representative performance under worst-case conditions so that margins to failure can be evaluated for proposed applications. The capabilities, advantages, and limitations of the testing and inspection performed at each level are different, and the risk incurred by omitting a verification step depends on the level of integration as well as Mission, Environment, Application and Lifetime (MEAL). This paper focuses on verification processes. The goal of the verification process is to ensure the given avionics technology could be safely implemented on the given MEAL consistent with the program/project risk posture.

Gonzalez, Oscar↗

Recent Radiation Test Results for Trench Power MOSFETs

Single-event effect (SEE) radiation test results are presented for various trench-gate power MOSFETs. The heavy-ion response of the first (and only) radiation-hardened trench-gate power MOSFET is evaluated: the manufacturer SEE response curve is verified and importantly, no localized dosing effects are measured, distinguishing it from other, non-hardened trench-gate power MOSFETs. Evaluations are made of n-type commercial and both n- and p-type automotive grade trench-gate device using ions comparable to of those on the low linear energy transfer (LET) side of the iron knee of the galactic cosmic ray spectrum, to explore suitability of these parts for missions with higher risk tolerance and shorter duration, such as CubeSats. Part-to-part variability of SEE threshold suggests testing with larger sample sizes and applying more aggressive derating to avoid on-orbit failures. The n-type devices yielded expected localized dosing effects including when irradiated in an unbiased (0-V) configuration, adding to the challenge of inserting these parts into space flight missions.

Schottky Diodes↗

Compendium of Current Total Ionizing Dose and Displacement Damage Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program

Total ionizing dose and displacement damage testing was performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices. Displacement Damage, Optoelectronics, Proton Damage, Single Event Effects, and Total Ionizing Dose.

Proton Damage↗

Heavy Ion Irradiation Fluence Dependence for Single-Event Upsets in a NAND Flash Memory

We investigated the single-event effect (SEE) susceptibility of the Micron 16 nm NAND flash, and found that the single-event upset (SEU) cross section varied inversely with cumulative fluence. We attribute the effect to the variable upset sensitivities of the memory cells. Furthermore, the effect impacts only single cell upsets in general. The rate of multiple-bit upsets remained relatively constant with fluence. The current test standards and procedures assume that SEU follow a Poisson process and do not take into account the variability in the error rate with fluence. Therefore, traditional SEE testing techniques may underestimate the on-orbit event rate for a device with variable upset sensitivity.

NAND flash memory↗

What Can We Learn From Proton Recoils about Heavy-Ion SEE Sensitivity?

The fact that protons cause single-event effects (SEE) in most devices through production of light-ion recoils has led to attempts to bound heavy-ion SEE susceptibility through use of proton data. Although this may be a viable strategy for some devices and technologies, the data must be analyzed carefully and conservatively to avoid over-optimistic estimates of SEE performance. We examine the constraints that proton test data can impose on heavy-ion SEE susceptibility.

probabilistic risk assessment↗

Compendium of Current Single Event Effects for Candidate Spacecraft Electronics for NASA

NASA spacecraft are subjected to a harsh space environment that includes exposure to various types of ionizing radiation. The performance of electronic devices in a space radiation environment are often limited by their susceptibility to single event effects (SEE). Ground-based testing is used to evaluate candidate spacecraft electronics to determine risk to spaceflight applications. Interpreting the results of radiation testing of complex devices is and adequate understanding of the test condition is critical. Studies discussed herein were undertaken to establish the application-specific sensitivities of candidate spacecraft and emerging electronic devices to single-event upset (SEU), single-event latchup (SEL), single-event gate rupture (SEGR), single-event burnout (SEB), and single-event transient (SET). For total ionizing dose (TID) and displacement damage dose (DDD) results, see a companion paper submitted to the 2015 Institute of Electrical and Electronics Engineers (IEEE) Nuclear and Space Radiation Effects Conference (NSREC) Radiation Effects Data Workshop (REDW) entitled "compendium of Current Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA by M. Campola, et al.

spacecraft electronics↗