NASA NTRS · 20100025764
Nonvolatile Memory Technology for Space Applications
Abstract
This slide presentation reviews several forms of nonvolatile memory for use in space applications. The intent is to: (1) Determine inherent radiation tolerance and sensitivities, (2) Identify challenges for future radiation hardening efforts, (3) Investigate new failure modes and effects, and technology modeling programs. Testing includes total dose, single event (proton, laser, heavy ion), and proton damage (where appropriate). Test vehicles are expected to be a variety of non-volatile memory devices as available including Flash (NAND and NOR), Charge Trap, Nanocrystal Flash, Magnetic Memory (MRAM), Phase Change--Chalcogenide, (CRAM), Ferroelectric (FRAM), CNT, and Resistive RAM.
Keep this discovery
Explore connections, maps & timelines
Oldham, Timothy R., Irom, Farokh, Friendlich, Mark, Nguyen, Duc, Kim, Hak, Berg, Melanie, LaBel, Kenneth A.. 2010-06-23. Nonvolatile Memory Technology for Space Applications. https://ntrs.nasa.gov/citations/20100025764
Cite the original work for its findings. Save a collection to share your selection of sources.