CMOS Active Pixel Sensor Technology and Reliability Characterization Methodology

Chen, Yuan; Guertin, Steven M.; Pain, Bedabrata; Kayaii, Sammy

NASA NTRS · 20070030861

CMOS Active Pixel Sensor Technology and Reliability Characterization Methodology

Chen, Yuan·Guertin, Steven M.·Pain, Bedabrata·Kayaii, Sammy

Abstract

This paper describes the technology, design features and reliability characterization methodology of a CMOS Active Pixel Sensor. Both overall chip reliability and pixel reliability are projected for the imagers.

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CMOS Active Pixel Sensors low temperature imaging sensor reliability reliability analysis pixel reliability

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BibTeX RIS

Chen, Yuan, Guertin, Steven M., Pain, Bedabrata, Kayaii, Sammy. 2006-03-20. CMOS Active Pixel Sensor Technology and Reliability Characterization Methodology. https://ntrs.nasa.gov/citations/20070030861

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