NASA NTRS · 20000032847
InGaAs PV Device Development for TPV Power Systems
Abstract
lndium Gallium Arsenide (InGaAs) photovoltaic devices have been fabricated with bandgaps ranging from 0.75 eV to 0.60 eV on Indium Phosphide (InP) substrates. Reported efficiencies have been as high as 11.2% (AMO) for the lattice matched 0.75 eV devices. The 0.75 eV cell demonstrated 14.8% efficiency under a 1500 K blackbody with a projected efficiency of 29.3%. The lattice mismatched devices (0.66 and 0.60 eV) demonstrated measured efficiencies of 8% and 6% respectively under similar conditions. Low long wavelength response and high dark currents are responsible for the poor performance of the mismatched devices. Temperature coefficients have been measured and are presented for all of the bandgaps tested.
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Wilt, David M., Fatemi, Navid S., Hoffman, Richard W., Jr., Jenkins, Phillip P., Brinker, David J., Scheiman, David, Lowe, Roland, Chubb, Donald. 1994-09-01. InGaAs PV Device Development for TPV Power Systems. https://ntrs.nasa.gov/citations/20000032847
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