Recent radiation research at JPL for University of Michigan Nuclear Engineering and Radiological Sciences Department colloquium
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radiation research↗
Engineering topics
Barnes, Charles E.
Publications and source records attributed to Barnes, Charles E..
NASA Electronic Parts & Packaging (NEPP) program: contributions to MER success
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packaging↗
Determination Of LETs Of SRAMs By Use Of A Laser
Report describes experimental study of use of microelectronic advanced laser scanner (MEALS) to cause single-event upsets (SEUs) in integrated logic circuits. Basic concepts of SEU testing by use of MEALS described in "Laser Scanner Tests for Single-Event Upsets" (NPO-18216), "Single-Event-Upset Laser Scanner With Optical Bias" (NPO-18217), and "More About Laser Scanner Tests for Single-Event Upsets" (NPO-18494). Study part of continuing effort to study SEU effects of ionizing radiation on such circuits and to use MEALS as relatively inexpensive SEU-prescreening laboratory apparatus serving as alternative to heavy-ion acclerator.
Kim, Quiesup↗
Radiation Effects on Fused Biconical Taper Wavelength Division Multiplexers
The effects of radiation on fused biconical taper wavelength division multiplexers are presented. A theoretical model indicates that index changes in the fiber are primarily responsible for the degradation of these devices.
Wavelengths↗
X-Ray-Diffraction Tests Of Irradiated Electronic Devices: I
X-ray-diffraction tests performed on aluminum conductors in commercial HI1-507A complementary metal oxide/semiconductor (CMOS) integrated-circuit analog multiplexers, both before and after circuits exposed to ionizing radiation from Co(60) source, and after postirradiation annealing at ambient and elevated temperatures. Tests in addition to electrical tests performed to determine effects of irradiation and of postirradiation annealing on electrical operating characteristics of circuits. Investigators sought to determine whether relationship between effects of irradiation on devices and physical stresses within devices. X-ray diffraction potentially useful for nondestructive measurement of stresses.
Shaw, David C.↗
X-Ray-Diffraction Tests Of Irradiated Electronic Devices: II
Report describes research on use of x-ray diffraction to measure stresses in metal conductors of complementary metal oxide/semiconductor (CMOS) integrated circuits exposed to ionizing radiation. Expanding upon report summarized in "X-Ray-Diffraction Tests Of Irradiated Electronic Devices: I" (NPO-18803), presenting data further suggesting relationship between electrical performances of circuits and stresses and strains in metal conductors.
Shaw, David C.↗
Postirradiation Effects In Integrated Circuits
Two reports discuss postirradiation effects in integrated circuits. Presents examples of postirradiation measurements of performances of integrated circuits of five different types: dual complementary metal oxide/semiconductor (CMOS) flip-flop; CMOS analog multiplier; two CMOS multiplying digital-to-analog converters; electrically erasable programmable read-only memory; and semiconductor/oxide/semiconductor octal buffer driver.
Shaw, David C.↗
Optical fibers in the adverse space environment - The Space Station
On the NASA Space Station, the requirement for high speed data transfer between the exterior experimental bays and the interior research facilities has generated the need for fiberoptics. The adverse vacuum effects in space, temperature extremes, and natural space radiation place extreme conditions on optical fiber interconnects. This report addresses the adverse space environmental effects of temperature and radiation on optical fibers.
Greenwell, Roger A.↗