Memory implications of the spin-value effect in soft multilayers

Abstract

New multilayer permalloy materials with thin separation layers that have significantly increased M-R coefficients at room temperature have the potential for substantially increasing both the speed and density of M-R memories. An analysis in the following discussion shows that the bit density at a given performance level is related to the product of M-R response and sheet resistivity when operating at the current-density limit. With a doubling of both sheet resistivity and M-R response over existing materials, the bit area can be reduced by about a factor of 4. Alternatively, if the bit area is kept the same, signal output is increased by a factor of 4 and circuit time constants can be reduced by a factor of 16.