Recent achievements in module reliability research

Abstract

After 10 years of extensive research on crystalline-silicon flat-plate photovoltaic modules, the emphasis of recent reliability research has shifted to the emerging first-generation thin-film amorphous-silicon modules. These modules share much in common with their crystalline precursors, but also include many materials and processes that demand the development of reliability technologies. Key research thrusts include light-induced effects, cell corrosion, thermal diffusion, hot-spot heating, and electrical isolation of the cells from the module exterior. Research goals and recent achievements are described in each of these areas.