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NASA NTRS · 19880011013

Material parameter measurements at high temperatures

Abstract

Alternate fixtures of techniques for the measurement of the constitutive material parameters at elevated temperatures are presented. The technique utilizes scattered field data from material coated cylinders between parallel plates or material coated hemispheres over a finite size groundplane. The data acquisition is centered around the HP 8510B Network Analyzer. The parameters are then found from a numerical search algorithm using the Newton-Ralphson technique with the measured and calculated fields from these canonical scatters. Numerical and experimental results are shown.

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BibTeXRIS

Dominek, A., Park, A., Peters, L., Jr.. 1988-03-01. Material parameter measurements at high temperatures. https://ntrs.nasa.gov/citations/19880011013

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