NASA NTRS · 19880000564
New Mode For Single-Event Upsets
Abstract
Report presents theory and experimental data regarding newly discovered mode for single-event upsets, (SEU's) in complementary metal-oxide/semiconductor, static random-access memories, CMOS SRAM's. SEU cross sections larger than those expected from previously known modes given rise to speculation regarding additional mode, and subsequent cross-section measurements appear to confirm speculation.
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Zoutendyk, John A., Smith, Lawrence S., Soli, George A., Lo, Roger Y.. 1988-12-01. New Mode For Single-Event Upsets. https://ntrs.nasa.gov/citations/19880000564
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